JPS5818146A - 測光型偏光解析装置 - Google Patents
測光型偏光解析装置Info
- Publication number
- JPS5818146A JPS5818146A JP11651281A JP11651281A JPS5818146A JP S5818146 A JPS5818146 A JP S5818146A JP 11651281 A JP11651281 A JP 11651281A JP 11651281 A JP11651281 A JP 11651281A JP S5818146 A JPS5818146 A JP S5818146A
- Authority
- JP
- Japan
- Prior art keywords
- polarizer
- polarization
- sample
- light
- photometric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000010287 polarization Effects 0.000 title claims abstract description 27
- 238000005375 photometry Methods 0.000 title 1
- 238000005259 measurement Methods 0.000 abstract description 12
- 238000004458 analytical method Methods 0.000 abstract description 4
- 230000009466 transformation Effects 0.000 abstract description 3
- 239000010408 film Substances 0.000 description 20
- 239000010409 thin film Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 2
- 241000272201 Columbiformes Species 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000000572 ellipsometry Methods 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11651281A JPS5818146A (ja) | 1981-07-27 | 1981-07-27 | 測光型偏光解析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11651281A JPS5818146A (ja) | 1981-07-27 | 1981-07-27 | 測光型偏光解析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5818146A true JPS5818146A (ja) | 1983-02-02 |
| JPH0211849B2 JPH0211849B2 (enrdf_load_stackoverflow) | 1990-03-16 |
Family
ID=14688976
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11651281A Granted JPS5818146A (ja) | 1981-07-27 | 1981-07-27 | 測光型偏光解析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5818146A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7127280B2 (en) | 2000-06-23 | 2006-10-24 | L'oreal | Apparatus and process for examining a surface |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5414952A (en) * | 1977-07-04 | 1979-02-03 | Kao Corp | 1-halogenocarbonyltricyclo(4,3,1,12,5)undecane |
| JPS5619576A (en) * | 1979-07-25 | 1981-02-24 | Fujitsu Ltd | Address matching detection system in multiple-space processing data processing system |
-
1981
- 1981-07-27 JP JP11651281A patent/JPS5818146A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5414952A (en) * | 1977-07-04 | 1979-02-03 | Kao Corp | 1-halogenocarbonyltricyclo(4,3,1,12,5)undecane |
| JPS5619576A (en) * | 1979-07-25 | 1981-02-24 | Fujitsu Ltd | Address matching detection system in multiple-space processing data processing system |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7127280B2 (en) | 2000-06-23 | 2006-10-24 | L'oreal | Apparatus and process for examining a surface |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0211849B2 (enrdf_load_stackoverflow) | 1990-03-16 |
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