JPS58169149A - Photomask - Google Patents

Photomask

Info

Publication number
JPS58169149A
JPS58169149A JP57052065A JP5206582A JPS58169149A JP S58169149 A JPS58169149 A JP S58169149A JP 57052065 A JP57052065 A JP 57052065A JP 5206582 A JP5206582 A JP 5206582A JP S58169149 A JPS58169149 A JP S58169149A
Authority
JP
Japan
Prior art keywords
information
magnetic film
film
photomask
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57052065A
Other languages
Japanese (ja)
Inventor
Katsuyuki Arii
有井 勝之
Setsuo Nagashima
長島 節夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57052065A priority Critical patent/JPS58169149A/en
Publication of JPS58169149A publication Critical patent/JPS58169149A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/38Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)

Abstract

PURPOSE:To automatically discriminate the kind of a photomask and to enable the rewriting of information, by forming a magnetic film for storing prescribed information on a peripheral part of the surface of a substrate and by forming a patterned film and the magnetic film with the same substance. CONSTITUTION:A metallic film of Cr or the like having a prescribed pattern 2 is formed on the surface of a transparent glass substrate 1, and a magnetic film 3 of a magnetic body such as iron oxide or Co-Cr is formed on a peripheral part of the surface of the substrate 1. Information about kind, lot number, etching conditions, etc. are written in the magnetic film 3 in manufacture, and it is automatically read out with a magnetic head or the like on an automatic processing line. When the mask is used in a stage for lithographing a semiconductor wafer, necessary information on the kind of the mask itself, the lot number of the wafer, etc. is written in the magnetic film 3, and control and application on an automatic processing line are conducted in accordance with the information.

Description

【発明の詳細な説明】 (1)発明の技術分野 本発明は半導体装置の製造工程中4で使用されるホトマ
スクに所定の情報を記憶することができる新規な構造に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION (1) Technical Field of the Invention The present invention relates to a novel structure capable of storing predetermined information in a photomask used in step 4 of the manufacturing process of a semiconductor device.

(2)技術の背景 半導体装置の製造工1iiKFi多数のホ) IJソゲ
ラフイエ程があり、各ホトリソグラフィ工程毎に異種の
ホトマスクが使用される。さらに半導体装置の種類が異
なる毎に一連のホトマスクも異なる。
(2) Background of the Technology There are many IJ and IJ photomasks in the manufacturing process of semiconductor devices, and different types of photomasks are used for each photolithography process. Further, the series of photomasks differ depending on the type of semiconductor device.

すなわち半導体装置の185造には非常に多くのホトマ
スクが存在し、それらの多数のホトマスクを製造し管理
しそして使用しなければならない。
That is, a very large number of photomasks exist in 185 semiconductor devices, and these large numbers of photomasks must be manufactured, managed, and used.

(3)従来技術と問題点 近年において半導体装置の製造ラインの全自動化が進め
られつつあり、上記の如きホトマスクの製造、管理、使
用においても例外ではない。従来性これらのホト1スク
の区別は、基板表面の周辺部に全島パターンにより所定
のマスク番号を表すパターンを形成しておき、その番号
を作業者が認識して行なっていた。このため能率が低下
し、また正確なiスフの識別ができなかった。またマス
ク番号は正規のパターン膜の露光、エツチングと同時に
作られる金属パターンよシなるため、一度書込んだ情報
を変更することができなかった。
(3) Prior Art and Problems In recent years, full automation of semiconductor device manufacturing lines has been progressing, and the manufacturing, management, and use of photomasks as described above are no exception. Conventionally, these photo masks were distinguished by forming a pattern representing a predetermined mask number in the form of an all-island pattern on the periphery of the substrate surface, and having the operator recognize the number. As a result, efficiency decreased and accurate identification of i-suffix was not possible. Furthermore, since the mask number is the same as the metal pattern that is created at the same time as the regular pattern film is exposed and etched, the information once written cannot be changed.

(4)発明の目的 本発明の目的は、ホトマスクに係る製造工程の自動化に
伴い人手を介さずに自動的にホトマスクの種類を識別す
ることができ、かつ識別に利用する情報を書き影・・え
ることができるホトマスクを提供することにある。
(4) Purpose of the Invention The purpose of the present invention is to automatically identify the type of photomask without human intervention by automating the manufacturing process related to photomasks, and to write and print information used for identification. Our goal is to provide a photomask that can be used in a variety of ways.

(5)発明の構成 本発明のホトマスクは、透明基板表面に所定のパターン
膜が形成されてなるホトマスクにおいて、核晶板表面の
周辺部に磁性膜が形成され、ト磁性膜に所定の情報が記
憶されてなることを%徴とする。さらには前因ピだ定の
パターン族と磁性膜が同一物質より形成されてなる仁と
を4!徴とする。
(5) Structure of the Invention The photomask of the present invention is a photomask in which a predetermined pattern film is formed on the surface of a transparent substrate, in which a magnetic film is formed on the periphery of the surface of the nuclei crystal plate, and predetermined information is printed on the magnetic film. The % mark is that it is memorized. Furthermore, the pattern family of the pre-causal pattern and the layer in which the magnetic film is made of the same material are 4! be a sign.

(6)発明の実施例 第1図、12図に本発明の一実施例のホ)vスフの平面
図、断面図を示す。本実施例のホトマスクは矩形の透明
ガラス基板lの表面に符号2の如く所定のパターンのC
r等金属膜が形成されている0そしてその基板表面の周
辺、この例では右端に磁性膜3を形成している。磁性膜
としては酸化鉄やコバルトクロム等の磁性体が利用され
る。4は実際に利用されるパターンの領域である0本夾
旅例のホトマスクは、そのM造時においては、製造され
るホト7スクが例なるS類のマスクであるか、あるいF
ir!;・ト番号、工、チング条件等の情報が磁性膜3
に書込まれ、自動処理ライン上で磁気ヘッド等によシ自
動的に読出され、その情報に基いてパターンの焼付けや
エツチング等が行なわオ]る。
(6) Embodiment of the Invention FIGS. 1 and 12 show a plan view and a cross-sectional view of a v-suffusion according to an embodiment of the present invention. The photomask of this example has a predetermined pattern of C on the surface of a rectangular transparent glass substrate l as shown in the symbol 2.
A magnetic film 3 is formed around the surface of the substrate 0 where the metal film is formed, such as at the right end in this example. A magnetic material such as iron oxide or cobalt chromium is used as the magnetic film. 4 is the area of the pattern that will actually be used. When the photomask of this example is manufactured by M, the photomask to be manufactured 7 is an example of an S-type mask, or is an F-type photomask.
ir! ;・Information such as toe number, workpiece, and ching conditions is displayed on the magnetic film 3.
The information is written on the memory card and automatically read out by a magnetic head or the like on an automatic processing line, and pattern printing, etching, etc. are performed based on the information.

さらに完成稜、半導体ウェハーのリングラフィ工程にお
いて使用される時においては、マスク自身の種類を示す
情報や使用に供されるウェハーのロット番号等ウェハー
の自動処理ラインの中での管理に必要な情報等が磁性膜
3に書き込まれる。
Furthermore, when used in the phosphorography process for finished edges and semiconductor wafers, information necessary for management in the automatic wafer processing line, such as information indicating the type of mask itself and the lot number of the wafer to be used, is provided. etc. are written on the magnetic film 3.

そしてその情報を基に自動処理ラインでのt理と使用が
行なわれる0この情報#′i種々の状況に応じて書き換
えられる。
The information #'i is processed and used in the automatic processing line based on this information. This information #'i is rewritten according to various situations.

第3図は本発明の他の実施例の真円形のホトマスクの一
合の平面図である。通常真円形のホトアス7はその周辺
部にはマスクパターン2が設けられてないので、そこに
磁性膜3を形成し上記と同様の第1」用を行なう0円周
に沿って情報を書き込め彎 ば、その情報の読取抄や書込みは、PJ?要の磁気ヘッ
ドを固定したまま、真円形マスクを回転することで容易
に可能である。
FIG. 3 is a plan view of a complete circular photomask according to another embodiment of the present invention. Since the mask pattern 2 is not provided around the periphery of the normally perfectly circular photo area 7, it is possible to form a magnetic film 3 there and write information along the 0th circumference for the first operation as described above. For example, is it possible to read or write that information on a PJ? This can be easily achieved by rotating a perfectly circular mask while keeping the essential magnetic head fixed.

本発明の他の実施例と17て、マスクパターン膜と磁性
膜とを同一物質で形成する鋤合がある。通常*syパタ
ーンを有するホトマスクの形成には、基板表面全面に金
JIIi膜を成長させ、それを工、テングすることで行
なわれている。その工、テング工程は一回であり、かつ
パターンには磁性膜になシ倚る金属膜を使用することが
できることから、本実施例が有効である。磁性膜とし、
ては上記と同様酸化鉄やコバルトクロム等が使用され、
同一の物質でパターンが形成される。
Another embodiment of the present invention is a combination in which the mask pattern film and the magnetic film are made of the same material. Normally, a photomask having a *sy pattern is formed by growing a gold JIIi film on the entire surface of a substrate, and then etching it. This embodiment is effective because the process and the tenging process are performed only once, and a metal film that can be attached to a magnetic film can be used for the pattern. As a magnetic film,
As mentioned above, iron oxide, cobalt chromium, etc. are used.
Patterns are formed from the same material.

(7)発明の効果 以上詳述した様に本発明によれげ、ホトマスクの製造、
管理及び使用の際KN々の情報を書込み、書換え及び読
出しを行なう仁とができるので、それを利用して自動処
理を客鳥に行なうことができる0 また四−物質で形成すれば促来の1稈を増やすこと表〈
本発明のホトマスクを形成することができる。
(7) Effects of the invention As detailed above, according to the present invention, the production of a photomask,
During management and use, it is possible to write, rewrite, and read information on KN, so it can be used to perform automatic processing on guest birds.Also, if it is made of four materials, it can be used to Table for increasing 1 culm
A photomask of the present invention can be formed.

【図面の簡単な説明】[Brief explanation of the drawing]

第1.2図は本発明の一実施例の平面図及び断面図、第
3図は本発明の他の実施例の平面図である0 図中、1は基板、2は所定のノくターン喚、3け磁性膜
である。 、ぴ・11 代理人 弁理士  松 岡  宏四部 T1:・”’b
;lj、−
Fig. 1.2 is a plan view and a sectional view of one embodiment of the present invention, and Fig. 3 is a plan view of another embodiment of the present invention. It is a 3-layer magnetic film. , P.11 Agent Patent Attorney Hiroshi Matsuoka T1:・”'b
;lj,-

Claims (1)

【特許請求の範囲】[Claims] 1、透明基板桟面に所定のパターン膜が形成されてなる
ホトマスクにおいて、除晶板表面の周辺部に磁性膜が形
成され、#磁性膜に所定の情報が記憶されてなることを
%黴とするホトマスク2、前記所定のパターン膜と磁性
膜が同一物質よ〕形成されてなることを特徴とする特許
請求の範2Ii第1項記載のホトマスク。
1. In a photomask in which a predetermined pattern film is formed on the surface of a transparent substrate, a magnetic film is formed around the surface of the crystal removal plate, and predetermined information is stored in the magnetic film. 2Ii. The photomask according to claim 1, wherein the predetermined pattern film and the magnetic film are formed of the same material.
JP57052065A 1982-03-30 1982-03-30 Photomask Pending JPS58169149A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57052065A JPS58169149A (en) 1982-03-30 1982-03-30 Photomask

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57052065A JPS58169149A (en) 1982-03-30 1982-03-30 Photomask

Publications (1)

Publication Number Publication Date
JPS58169149A true JPS58169149A (en) 1983-10-05

Family

ID=12904405

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57052065A Pending JPS58169149A (en) 1982-03-30 1982-03-30 Photomask

Country Status (1)

Country Link
JP (1) JPS58169149A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63193151A (en) * 1987-02-06 1988-08-10 Toshiba Corp Automatic developing device
JPH02146545A (en) * 1988-11-29 1990-06-05 Toshiba Corp Automatic developing device
JPH04363826A (en) * 1991-06-10 1992-12-16 Togami Electric Mfg Co Ltd Gas-blast load-break switch, and pressure detecting device, decompression display device and operating handle lock device used for said switch

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63193151A (en) * 1987-02-06 1988-08-10 Toshiba Corp Automatic developing device
JPH02146545A (en) * 1988-11-29 1990-06-05 Toshiba Corp Automatic developing device
JPH04363826A (en) * 1991-06-10 1992-12-16 Togami Electric Mfg Co Ltd Gas-blast load-break switch, and pressure detecting device, decompression display device and operating handle lock device used for said switch

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