JPS58168247A - 選別シュ−ト装置 - Google Patents

選別シュ−ト装置

Info

Publication number
JPS58168247A
JPS58168247A JP57051994A JP5199482A JPS58168247A JP S58168247 A JPS58168247 A JP S58168247A JP 57051994 A JP57051994 A JP 57051994A JP 5199482 A JP5199482 A JP 5199482A JP S58168247 A JPS58168247 A JP S58168247A
Authority
JP
Japan
Prior art keywords
chute
row
section
semiconductor devices
sorting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57051994A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6230694B2 (enExample
Inventor
Masatoshi Mishima
三嶋 正敏
Naohiko Urasaki
浦崎 直彦
Shigeki Takeo
竹尾 重樹
Iwao Yamazaki
巌 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP57051994A priority Critical patent/JPS58168247A/ja
Publication of JPS58168247A publication Critical patent/JPS58168247A/ja
Publication of JPS6230694B2 publication Critical patent/JPS6230694B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Chutes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP57051994A 1982-03-30 1982-03-30 選別シュ−ト装置 Granted JPS58168247A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57051994A JPS58168247A (ja) 1982-03-30 1982-03-30 選別シュ−ト装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57051994A JPS58168247A (ja) 1982-03-30 1982-03-30 選別シュ−ト装置

Publications (2)

Publication Number Publication Date
JPS58168247A true JPS58168247A (ja) 1983-10-04
JPS6230694B2 JPS6230694B2 (enExample) 1987-07-03

Family

ID=12902403

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57051994A Granted JPS58168247A (ja) 1982-03-30 1982-03-30 選別シュ−ト装置

Country Status (1)

Country Link
JP (1) JPS58168247A (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58142548A (ja) * 1982-02-18 1983-08-24 Nec Corp Icハンドリング装置
JPS6076096U (ja) * 1983-10-28 1985-05-28 株式会社 東京精密 半導体素子の分類収容装置
JPS60148196A (ja) * 1984-01-13 1985-08-05 日本電気株式会社 半導体装置の製造装置
WO1986001970A1 (fr) * 1984-09-10 1986-03-27 Citizen Watch Co., Ltd. Appareil de transfert de composants electroniques
JPS6196378U (enExample) * 1984-11-29 1986-06-20
CN105855191A (zh) * 2015-09-22 2016-08-17 苏州亿馨源光电科技有限公司 一种固定电感器自动分选生产线

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58142548A (ja) * 1982-02-18 1983-08-24 Nec Corp Icハンドリング装置
JPS6076096U (ja) * 1983-10-28 1985-05-28 株式会社 東京精密 半導体素子の分類収容装置
JPS60148196A (ja) * 1984-01-13 1985-08-05 日本電気株式会社 半導体装置の製造装置
WO1986001970A1 (fr) * 1984-09-10 1986-03-27 Citizen Watch Co., Ltd. Appareil de transfert de composants electroniques
JPS6167300A (ja) * 1984-09-10 1986-04-07 シチズン時計株式会社 電子部品の搬送装置
JPS6196378U (enExample) * 1984-11-29 1986-06-20
CN105855191A (zh) * 2015-09-22 2016-08-17 苏州亿馨源光电科技有限公司 一种固定电感器自动分选生产线
CN105855191B (zh) * 2015-09-22 2018-10-23 苏州亿馨源光电科技有限公司 一种固定电感器自动分选生产线

Also Published As

Publication number Publication date
JPS6230694B2 (enExample) 1987-07-03

Similar Documents

Publication Publication Date Title
US6882141B2 (en) Sorting handler for burn-in tester
US6518745B2 (en) Device test handler and method for operating the same
US7541828B2 (en) Burn-in sorter and sorting method using the same
JP2012522224A (ja) 電子デバイスの検査のための改善されたシステム及び方法
EP1066535B1 (en) Device and assembly for testing electronic components
TWI270015B (en) Image sensor test equipment
JPS58168247A (ja) 選別シュ−ト装置
CN105321860A (zh) 全自动进出料设备及其控制方法
TW200848719A (en) Semiconductor device vision inspecting system
CN205926350U (zh) 一种光发射次模块自动化测试设备
US20040181961A1 (en) Handler for testing semiconductor device
US5998751A (en) Sorting system for computer chips
CN221039326U (zh) 一种芯片串测平台
US6156078A (en) Testing and finishing apparatus for integrated circuit package units
CN217393021U (zh) 一种转塔测试箱复合式的测试分选装置
CN217880360U (zh) 一种芯片测试烧录后进行编带或摆盘的设备
DE19820848A1 (de) Vorrichtung zum Testen und Verpacken von Bauelementen in SDM-LED Bauformen
CN208714331U (zh) 汽车多媒体框架模具注塑设备
US20020166801A1 (en) System for integrated circuit (IC) transporting of IC test device and the method thereof
JPH0421342B2 (enExample)
KR100500917B1 (ko) 반도체패키지 튜브적재장치
JPS6411526B2 (enExample)
JPS628938B2 (enExample)
JPS6227541B2 (enExample)
CN222859790U (zh) 一种保险丝筛选测试打标编带机