JPS58160339U - 赤外線輻射式ガス分析計 - Google Patents

赤外線輻射式ガス分析計

Info

Publication number
JPS58160339U
JPS58160339U JP1982057774U JP5777482U JPS58160339U JP S58160339 U JPS58160339 U JP S58160339U JP 1982057774 U JP1982057774 U JP 1982057774U JP 5777482 U JP5777482 U JP 5777482U JP S58160339 U JPS58160339 U JP S58160339U
Authority
JP
Japan
Prior art keywords
infrared
gas analyzer
infrared radiation
component
radiation gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1982057774U
Other languages
English (en)
Japanese (ja)
Other versions
JPS643067Y2 (ko
Inventor
宮武 公夫
Original Assignee
株式会社堀場製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社堀場製作所 filed Critical 株式会社堀場製作所
Priority to JP1982057774U priority Critical patent/JPS58160339U/ja
Priority to DE19833307132 priority patent/DE3307132C2/de
Priority to GB8306205A priority patent/GB2116317B/en
Priority to KR1019830001605A priority patent/KR870000596B1/ko
Publication of JPS58160339U publication Critical patent/JPS58160339U/ja
Application granted granted Critical
Publication of JPS643067Y2 publication Critical patent/JPS643067Y2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP1982057774U 1982-03-09 1982-04-21 赤外線輻射式ガス分析計 Granted JPS58160339U (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP1982057774U JPS58160339U (ja) 1982-04-21 1982-04-21 赤外線輻射式ガス分析計
DE19833307132 DE3307132C2 (de) 1982-03-09 1983-03-01 Infrarot-Gasanalysator zur Bestimmung mindestens einer Komponente eines Gasgemischs
GB8306205A GB2116317B (en) 1982-03-09 1983-03-07 Infrared radiation gas analyzer
KR1019830001605A KR870000596B1 (ko) 1982-04-21 1983-04-16 적외선복사식 가스분석계

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1982057774U JPS58160339U (ja) 1982-04-21 1982-04-21 赤外線輻射式ガス分析計

Publications (2)

Publication Number Publication Date
JPS58160339U true JPS58160339U (ja) 1983-10-25
JPS643067Y2 JPS643067Y2 (ko) 1989-01-26

Family

ID=13065210

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1982057774U Granted JPS58160339U (ja) 1982-03-09 1982-04-21 赤外線輻射式ガス分析計

Country Status (2)

Country Link
JP (1) JPS58160339U (ko)
KR (1) KR870000596B1 (ko)

Also Published As

Publication number Publication date
JPS643067Y2 (ko) 1989-01-26
KR870000596B1 (ko) 1987-03-23
KR840004574A (ko) 1984-10-22

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