JPS5815218A - Liquid phase epitaxial growth apparatus - Google Patents

Liquid phase epitaxial growth apparatus

Info

Publication number
JPS5815218A
JPS5815218A JP11216581A JP11216581A JPS5815218A JP S5815218 A JPS5815218 A JP S5815218A JP 11216581 A JP11216581 A JP 11216581A JP 11216581 A JP11216581 A JP 11216581A JP S5815218 A JPS5815218 A JP S5815218A
Authority
JP
Japan
Prior art keywords
temperature
crucible
melt
growth
epitaxial growth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11216581A
Other languages
Japanese (ja)
Inventor
Toshio Shiga
俊夫 志賀
Hidekazu Hirata
平田 英一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11216581A priority Critical patent/JPS5815218A/en
Publication of JPS5815218A publication Critical patent/JPS5815218A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B19/00Liquid-phase epitaxial-layer growth
    • C30B19/06Reaction chambers; Boats for supporting the melt; Substrate holders
    • C30B19/062Vertical dipping system

Abstract

PURPOSE:To provide highly efficient liquid phase epitaxial growth of a single crystal thin film on a single crystal substrate by preventing a local decrease in temperature at the boundary surface of a solution by means of a crucible which is made movable between a heating and a pre-heating room. CONSTITUTION:A solution 1 at room temperature in a crucible 2 is initially heated to approx. 1,200 deg.C in a pre-heating room 10C. Before reaching a saturation temperature at which the temperature lowering operation is to be started towards a growing temperature, an agitator 19 is lowered to agitate the solution while lowering its temperature so as to keep the solution temperature even. After a specified growing temperature is reached, the agitator 19 is lifted up, a heat shielding plate 17 is extracted and the crucible 2 is moved to a heating room 10a for epitaxial growth through a crucible moving mechanism 22. When the crucible reaches the heating room 10a a crystal substrate 9 supported by a supporter 8 is submerged in the solution for the growth, then, after the growth, it is lifted up. The crucible 2 is returned to the pre-heating room 10C at the completion of the growth by means of the moving mechanism 22. This temperature cycle of up- keep-down is repeated.

Description

【発明の詳細な説明】 本発明は液相エピタキシャル成長装置、%に単結晶基板
上に孝結晶簿膜を高品質、高能率で液相エピタキシャル
成長させることを可能にした液相エピタキシャル成長装
置に@するものである。
[Detailed Description of the Invention] The present invention is directed to a liquid phase epitaxial growth apparatus, which is capable of liquid phase epitaxial growth of high-quality crystalline films on single crystal substrates with high quality and high efficiency. It is.

従来の液相エピタキシャル成長装置、例えば非磁性墜結
晶基板上に磁性単結晶薄膜として磁気ノくプル・ドメイ
ン・デバイス用〇−軸異方性磁性ガーネツト薄膜を成長
させる装置としては、I!1図に示した構造を有する装
置が採用されている。すなわち、同図において、1は結
晶成分と7ラツクスとからなる融液、2はこの融液1を
収容する白金るつぼ、3はらせん状に置設されたヒータ
、4はらせん状のヒータ3内に上記白金るつぼ2を収納
して配置された円筒状O均熱管%Sはるつぼ2内の融液
10所*iit分布を得る丸めの円環状熱繍蔽板、6は
外部冷気を鐘蔽する円板状の外気導蔽板、1社外気鐘蔽
板60中央部に設けられた開口孔、・は結晶基板9を矢
印方向に昇降1回転自在に融液省中和浸漬する丸めの支
持具である。
Conventional liquid phase epitaxial growth equipment, such as I! A device having the structure shown in Figure 1 is employed. That is, in the figure, 1 is a melt consisting of a crystal component and 7 lux, 2 is a platinum crucible containing this melt 1, 3 is a heater arranged in a spiral shape, and 4 is the interior of the spiral heater 3. The cylindrical heat soaking tube %S, which accommodates the platinum crucible 2 and is arranged, is a rounded annular heat shielding plate that obtains the distribution of the melt at 10 points in the crucible 2, and 6 is a heat shielding plate that shields external cold air. An opening hole provided in the center of the outside air shielding plate 60 in the form of a disk, is a round support for immersing the crystal substrate 9 in the direction of the arrow to neutralize the melt and move it up and down once in the direction of the arrow. It is.

このように構成された液相エピタキシャル成長装置を用
いて、結晶成長を行なう場合、融液1の昇−1高温保持
、降温、育成のナイクルを行カい、育成期間では融液1
の飽和温度以下に保持し、結晶基板9の融液1内への投
入、成長、結晶&板9の引き上げを1回または数回繰シ
返した彼、融液1の昇降温サイクルを行なうのが通常で
るゐ。
When crystal growth is performed using a liquid phase epitaxial growth apparatus configured in this way, a cycle of raising the melt 1, holding it at a high temperature, lowering the temperature, and growing the melt 1 is performed, and during the growth period, the melt 1
He held the temperature below the saturation temperature of the melt 1 and repeated the process of introducing the crystal substrate 9 into the melt 1, growing it, and pulling the crystal and plate 9 one or several times. usually appears.

しかしながら、上述した温度サイクルの間に融液1の境
界面、例えば融液1の表面やるつぼ2との接触面におい
て、局部的な1llWIL低下が発生すると、融液1内
に微小な析出物が発生し、正常な成長を妨げ、結晶欠陥
の発生の原因となることが知られている。
However, if a local 1llWIL decrease occurs at the interface of the melt 1, for example at the surface of the melt 1 or at the contact surface with the crucible 2, during the temperature cycle described above, minute precipitates may form in the melt 1. It is known that crystal defects occur, hinder normal growth, and cause crystal defects.

したがって上記構成による液相エピタキシャル成長装置
においては、結晶基板9の投入用支持具8を貫通させる
ための開口孔7からの熱放散によシ、融液1の表面の1
1度低下を防止することが構造上困難であるという第1
の欠点があシ、これに伴なって、昇降温サイクルは育成
期間に比べて約10倍相度の時間を要し、全体としての
作業能率が低下するという泥2の欠点があった。
Therefore, in the liquid phase epitaxial growth apparatus having the above configuration, heat dissipation from the opening hole 7 for penetrating the charging support 8 of the crystal substrate 9 is performed.
The first problem is that it is structurally difficult to prevent the temperature from dropping by 1 degree.
Along with this, Mud 2 had the disadvantage that the temperature raising/lowering cycle required about 10 times as much time as the growing period, reducing the overall working efficiency.

したがって本発明は、融液に必要な温度分布を現出させ
るための加熱室と、この加熱室の片側または両側に設け
られた予備加熱室と、この予備加熱室の上方に設けられ
た攪拌機と、この加熱室と予備加熱室との境界に抜き差
し自在に設けられた熱遮蔽板と、加熱室と予備加熱室と
の両者にるつぼを移動させるためのるつぼ移動機構とで
液相エピタキシャル成長装置を構成することによって、
上記従来の欠点を除去し、高品質の結晶成長験を高能率
で得ることができる液相エピタキシャル成長装置を提供
することを目的としている。すなわち、本発明は、融液
表面の温度低下を防止するためには、融液の上方に融液
表面91度以上のm1雰囲気を形成する必要があり、融
液的温度分布を向上させるkは、特に降温サイクル時に
融液を攪拌させることが有効であシ、サイクル時間を鉛
線させる罠は複数個の融液を交互Kll!用することが
能率的である。
Therefore, the present invention provides a heating chamber for creating the necessary temperature distribution in the melt, a preheating chamber provided on one or both sides of this heating chamber, and a stirrer provided above this preheating chamber. A liquid phase epitaxial growth apparatus is configured by a heat shielding plate that is detachably installed at the boundary between the heating chamber and the preheating chamber, and a crucible moving mechanism for moving the crucible to both the heating chamber and the preheating chamber. By,
It is an object of the present invention to provide a liquid phase epitaxial growth apparatus that eliminates the above-mentioned conventional drawbacks and allows high-quality crystal growth experiments to be obtained with high efficiency. That is, in the present invention, in order to prevent the temperature drop on the melt surface, it is necessary to form an m1 atmosphere above the melt surface with a temperature of 91 degrees or more, and k to improve the melt temperature distribution is It is especially effective to stir the melt during the temperature-lowering cycle, and the trap that sets the cycle time is to alternately mix multiple melts! It is efficient to use

以下図面を用いて本発明の実施例を詳細に説明する。Embodiments of the present invention will be described in detail below with reference to the drawings.

第2図は本発明による液相エピタキシャル成艇装置の一
例を示す要部断1i?11成図であ夛、給1図と同記号
は同一要素とガるOでその説明は省略する。絽2図にお
いて、10は融液1に必をなii度分布を現出するため
の断熱性箱体11と上記らせん状ヒータ3および均熱管
4を収納した断熱性筒体12とから構成された加熱室で
あシ、この加熱1110は箱体11が縦方向に3分割さ
れ、それぞれエピタキシャル成長用加熱室IQaおよび
その両側に予備加熱*10b、10oが形成されている
。13゜14、Isはこの箱体11の各加熱室10m、
10b、10゜内面部分に巻設されたヒータ、18,1
7轢成長用加熱室10aと予備加熱室10b、10aと
の間を仕切シかつ抜き差し自在に配設された飼えばum
osなどの断熱性熱遮蔽板、18.11t′i予備加熱
室Iob。
FIG. 2 is a cross-section 1i showing an example of a liquid phase epitaxial boat building apparatus according to the present invention. In Figure 11, the same symbols as in Figure 1 represent the same elements, and their explanation will be omitted. In Figure 2, 10 is composed of a heat insulating box body 11 for producing the necessary degree distribution in the melt 1, and a heat insulating cylinder body 12 housing the spiral heater 3 and soaking tube 4. In this heating chamber 1110, the box body 11 is divided into three in the vertical direction, and an epitaxial growth heating chamber IQa and preheating chambers *10b and 10o are formed on both sides of the heating chamber IQa. 13°14, Is is each heating chamber 10m of this box body 11,
10b, 10° heater wound around the inner surface, 18,1
7. A heating chamber 10a for track growth and a preheating chamber 10b, 10a are partitioned from each other.
Insulating heat shield plate such as os, 18.11t'i preheating chamber Iob.

10cの上方部に矢印方向に上昇、下降および回転自在
に配設された攪拌機、2′は上記予備加熱室lQb内に
配置されかつ上記融液1と同等の融液1′が収容された
るつぼ、20.21はるつぼ2.2′を搭載させて成長
用加熱室10aと予備加熱室10b。
A stirrer is disposed above 10c so as to be able to rise, fall and rotate freely in the direction of the arrow, and 2' is a crucible placed in the preheating chamber lQb and containing a melt 1' equivalent to the melt 1. , 20.21 is equipped with a crucible 2.2', and serves as a growth heating chamber 10a and a preheating chamber 10b.

10a間を自在に移動させる合板、22.23Fi台板
20.21を矢印方向に移動させる合板移動機構である
工なお、上記成長用加熱im!10内のヒータ14のう
ち、上方部のヒータ14aはるつぼ2内の融液1の表面
を加熱するヒータ、下方sOヒー/14bti成長用加
熱@10bO下部0112を保持させると一タ、また、
予備加熱1! 10b* 10a内のヒータ13,15
Fiこの予備加熱1!10b、10a内に配置、される
るりは2′の融液1′に必要なIIrIIL分布を与え
ると一一である。
It is a plywood moving mechanism that moves the plywood and the 22.23Fi base plate 20.21 in the direction of the arrows in the direction of the arrow. Among the heaters 14 in 10, the upper heater 14a is a heater that heats the surface of the melt 1 in the crucible 2, and when the lower sO heater/14bti growth heating @10bO lower part 0112 is held,
Preheating 1! 10b* Heaters 13, 15 in 10a
Fi, this preheating 1! The lubricity placed and placed in 10b, 10a is 11 when giving the necessary IIrIIL distribution to the melt 1' of 2'.

次に、上記構成による液相エピタキシャル成長装置0I
I11作を説明する。?−O場合、るつぼ2および2’
Fi、li似のサイクルを交互に繰シ返すので、ここで
はるつぼ2の動作により説明する。るつぼ2内の融液1
はまず予備加熱室10aで室温から約1200℃に昇−
後、5〜40時間の均質化を行なった彼、育成m1it
’に向って降温を行なう飽和@度に到達する以前、例え
ば飽和温度プラス約50℃近傍において、攪拌機19を
下降せしめ、融液の降温と並行して攪拌を行ない、融液
的温度を均一に保つ。
Next, a liquid phase epitaxial growth apparatus 0I with the above configuration is used.
I will explain the 11th work. ? -O, crucibles 2 and 2'
Since cycles similar to Fi and li are repeated alternately, the operation of crucible 2 will be explained here. Melt 1 in crucible 2
First, the temperature is raised from room temperature to approximately 1200°C in the preheating chamber 10a.
After that, he homogenized for 5 to 40 hours and cultivated m1it.
Before reaching the saturation temperature where the temperature is lowered toward ', for example, around 50 degrees Celsius above the saturation temperature, the stirrer 19 is lowered and stirred in parallel with the temperature drop of the melt to make the melt temperature uniform. keep.

そして所定の育成@度に到達した後、攪拌機19、を上
昇させ、熱遮蔽板1Tを抜I!、るつぼ移動機構22に
よ〕台板20を介してるつぼ簿を成長用加熱室10aへ
移動させる。この場合、この成長用加熱室10aU融液
1の温度が襞化しない条件で設定することは言うまでも
ない。そして、るつぼ2が成長用加熱室10aK到達後
、結晶基板90支持具8を下降せしめ、融液1中へ浸漬
、育成を行なった後上昇させる。そして、育成の完了し
たるつぼ2は移動機構22によシ予備加熱室10aKM
L、熱遮蔽板17t−差し入れたり、昇温、高醜保持お
よび降温のサイクルを繰シ返す。この場合、るつぼ2の
昇降サイクル中始と同時に他方のるつぼ2′の移動を行
なうめは上述の説明から明らかである。
After reaching a predetermined growth temperature, the stirrer 19 is raised and the heat shield plate 1T is removed. , the crucible is moved to the growth heating chamber 10a via the base plate 20 by the crucible moving mechanism 22. In this case, it goes without saying that the temperature of the growth heating chamber 10aU melt 1 is set under conditions that do not cause folds. After the crucible 2 reaches the growth heating chamber 10aK, the crystal substrate 90 support 8 is lowered, immersed in the melt 1 and grown, and then raised. Then, the crucible 2 that has been grown is moved to the preheating chamber 10aKM by the moving mechanism 22.
L, Heat shield plate 17t - Insert and repeat the cycle of increasing temperature, maintaining high ugliness, and decreasing temperature. In this case, it is clear from the above description that the movement of the other crucible 2' is carried out at the same time as the beginning of the lifting cycle of the crucible 2.

このように構成された液相エピタキシャル成長装置によ
れば、予備加熱室10bまたは10oにおいては、るつ
ぼ2,2′の全周部分が融液温度以上に保持可能となる
ため、融液境界面での局部的な温度低下が防止可能とな
シ2かつ攪拌機構22.23による融液の攪拌により、
融液内の温度分布は極めて均一に保持させることができ
る。また、成長用加熱室IQaへ移動時の上部開口孔か
らの熱放射に、ヒータ141Lによる加熱と相殺され、
融液温度は変化しない。tた、融液自体の対流による温
度分離は対流による安定化の時定数が大きいため、結晶
基板−の投入まての蜘かい時間1例えば数分間は無視す
ることができる。さらに2個のるつぼを交互に使用する
ため、昇降温サイクル時間が有効に活用できるため、能
率が大幅に向上てきる。
According to the liquid phase epitaxial growth apparatus configured in this way, in the preheating chamber 10b or 10o, the entire circumference of the crucibles 2, 2' can be maintained at a temperature higher than the melt temperature, so that By stirring the melt by the stirring mechanisms 22 and 23, which can prevent local temperature drops,
The temperature distribution within the melt can be kept extremely uniform. In addition, the heat radiation from the upper opening when moving to the growth heating chamber IQa is offset by the heating by the heater 141L,
The melt temperature does not change. In addition, since the temperature separation due to convection of the melt itself has a large time constant for stabilization due to convection, the waiting time 1, for example, several minutes before introducing the crystal substrate can be ignored. Furthermore, since two crucibles are used alternately, the temperature raising/lowering cycle time can be used effectively, resulting in a significant improvement in efficiency.

また、上述した実施例によれば、従来の融液内温度分布
を±l″C以内に抑えることは極めて容易であシ、サイ
クル時間は従来の約1/2に半減することが可能とまっ
た。
Furthermore, according to the above-mentioned embodiment, it is extremely easy to suppress the temperature distribution within the melt to within ±l''C, and the cycle time can be halved to about 1/2 of the conventional temperature distribution. .

なお、上記実施例において、るつぼを2個使用した場合
について説明したが成長用加熱室の片側のみに予備加熱
室を備えたillにおいても上述と全く同様の効果が得
られること社明らかである。
In the above embodiments, the case where two crucibles are used has been described, but it is clear that the same effect as described above can be obtained even in an illumination in which a preheating chamber is provided on only one side of the growth heating chamber.

以上説明したように本発明によれば、融液の温度を結晶
成長に必要な111m!に正しく一致させ、かつ融液内
m度分布を±1℃以内に保持し2しかも昇降温サイクル
中に融液内に微小析出を発生させることなく、さらに育
成準備時間の無法をなくすことができるので、高品質の
結晶成長膜を、高能率で液相エピタキシャル成長させる
ことができる極めて優れた効果が得られる。
As explained above, according to the present invention, the temperature of the melt can be reduced to 111 m, which is necessary for crystal growth! It is possible to correctly match the m degree distribution in the melt and to maintain it within ±1°C, 2, and to prevent micro-precipitation from occurring in the melt during temperature raising/lowering cycles, further eliminating unreasonable growth preparation time. Therefore, an extremely excellent effect can be obtained in which a high quality crystal growth film can be grown by liquid phase epitaxial growth with high efficiency.

【図面の簡単な説明】 #1図は従来の液相エピタキシャル成長装置の一例を示
す要部断面構成図、館2図は本発明による液相エピタキ
シャル成長装置の一例を示す要部断面構成図である。 1.1′・・・・融液、2.2’・・・・るつは、3・
・・・ヒータ、4・・・・均熱管、8・・・・攪拌機、
9・・・・結晶基板、10・・・・加熱室、10m・・
・・成長用加熱室、IQbjOc・・・・予備加熱室、
11・・・・箱体、12・・・・筒体、13.14.1
4a、14b、15− ・−−ヒータ、16.17・・
・・熱遮蔽板、18.19・・・・攪拌機、20.−2
1・・・・台板、22.23・・・・移動機構。 第1図 第2図
BRIEF DESCRIPTION OF THE DRAWINGS Figure #1 is a cross-sectional configuration diagram of essential parts showing an example of a conventional liquid phase epitaxial growth apparatus, and Figure #2 is a cross-sectional configuration diagram of essential parts showing an example of a liquid phase epitaxial growth apparatus according to the present invention. 1.1'...melt, 2.2'...melt, 3.
... Heater, 4 ... Soaking tube, 8 ... Stirrer,
9...Crystal substrate, 10...Heating chamber, 10m...
・・Growth heating chamber, IQbjOc・・・Preheating chamber,
11...Box body, 12...Cylinder body, 13.14.1
4a, 14b, 15----Heater, 16.17...
... Heat shield plate, 18.19 ... Stirrer, 20. -2
1... Base plate, 22.23... Moving mechanism. Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 結晶成長K11iする融液を収容するるつぼと、前記融
液に必要な温度分布を現出させる加熱室と、前記るつぼ
の上方部に上昇、下降1回転自在に配置された結晶基板
支持具とを少なくとも具備してなる液相エピタキシャル
成長装置において、前記加熱室の少なくと4片側に設け
られた予備加熱室と、前記予備加熱室の上方部に設けら
れた前記融液の攪拌機と、前記加熱室と前記予備加熱室
の境界に抜き差し自在に設けられた熱遮蔽板と、前記加
熱室と前記予備加熱室との両者間に前記るつぼを自在に
移動させる移動機構とを設は九ことを特徴とする液相エ
ピタキシャル成長装置。
A crucible containing a melt for crystal growth K11i, a heating chamber for creating a temperature distribution necessary for the melt, and a crystal substrate support disposed above the crucible so as to be able to move up and down once. A liquid phase epitaxial growth apparatus comprising: a preheating chamber provided on at least four sides of the heating chamber; a stirrer for the melt provided above the preheating chamber; The method is characterized in that a heat shield plate is provided at the boundary of the preheating chamber so as to be freely inserted and removed, and a moving mechanism is provided for freely moving the crucible between the heating chamber and the preheating chamber. Liquid phase epitaxial growth equipment.
JP11216581A 1981-07-20 1981-07-20 Liquid phase epitaxial growth apparatus Pending JPS5815218A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11216581A JPS5815218A (en) 1981-07-20 1981-07-20 Liquid phase epitaxial growth apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11216581A JPS5815218A (en) 1981-07-20 1981-07-20 Liquid phase epitaxial growth apparatus

Publications (1)

Publication Number Publication Date
JPS5815218A true JPS5815218A (en) 1983-01-28

Family

ID=14579864

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11216581A Pending JPS5815218A (en) 1981-07-20 1981-07-20 Liquid phase epitaxial growth apparatus

Country Status (1)

Country Link
JP (1) JPS5815218A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63144189A (en) * 1986-12-04 1988-06-16 Fujitsu Ltd Apparatus for liquid epitaxy
JPH0162364U (en) * 1987-10-12 1989-04-20
JPH0380185A (en) * 1989-08-24 1991-04-04 Showa Denko Kk Method and device for liquid epitaxial growth
EP1088913A3 (en) * 1999-09-22 2001-11-21 Canon Kabushiki Kaisha Liquid-phase growth method, liquid-phase growth apparatus, and solar cell
WO2015012941A1 (en) * 2013-07-22 2015-01-29 Rubicon Technology, Inc. Method and system of producing large oxide crystals from a melt

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63144189A (en) * 1986-12-04 1988-06-16 Fujitsu Ltd Apparatus for liquid epitaxy
JPH0162364U (en) * 1987-10-12 1989-04-20
JPH0380185A (en) * 1989-08-24 1991-04-04 Showa Denko Kk Method and device for liquid epitaxial growth
EP1088913A3 (en) * 1999-09-22 2001-11-21 Canon Kabushiki Kaisha Liquid-phase growth method, liquid-phase growth apparatus, and solar cell
US6566277B1 (en) 1999-09-22 2003-05-20 Canon Kabushiki Kaisha Liquid-phase growth method, liquid-phase growth apparatus, and solar cell
KR100394426B1 (en) * 1999-09-22 2003-08-09 캐논 가부시끼가이샤 Liquid-Phase Growth Method, Liquid-Phase Growth Apparatus, And Solar Cell
AU776096B2 (en) * 1999-09-22 2004-08-26 Canon Kabushiki Kaisha Liquid-phase growth method, liquid-phase growth apparatus, and solar cell
WO2015012941A1 (en) * 2013-07-22 2015-01-29 Rubicon Technology, Inc. Method and system of producing large oxide crystals from a melt

Similar Documents

Publication Publication Date Title
CN109196144A (en) The manufacturing method and device of monocrystalline silicon
US4666681A (en) Apparatus for producing a monocrystal
JP2004203738A (en) Production method of silicon wafer and silicon single crystal ingot
JPS5815218A (en) Liquid phase epitaxial growth apparatus
US3870472A (en) Method and apparatus for growing crystals by annealing the crystal after formation
JPS6096596A (en) Shaft for pulling single crystal
JPH03153595A (en) Device for pulling single crystal
JP2018111633A (en) Apparatus and method for growing oxide single crystal
JP2006044962A (en) Silicon single crystal pulling apparatus
KR20130012695A (en) Apparatus for growing sapphire single crystal
JPS6027684A (en) Apparatus for producing single crystal
JP2019218255A (en) Method for manufacturing lithium niobate single crystal
JP2010248003A (en) METHOD FOR PRODUCING SiC SINGLE CRYSTAL
JP2004262723A (en) Single crystal pulling unit and single crystal pulling method
CN116607215B (en) Growth method and device of lithium niobate crystal
JP2003327490A (en) Method for producing oxide single crystal and production apparatus used in the same
GB1381430A (en) Method of growing crystals
JPH07115984B2 (en) Single crystal pulling device
CN107557861A (en) A kind of growing method and its process units suitable for BPOC monocrystalline
SU823474A1 (en) Device for thermal treatment and liquid epitaxy of semiconductor materials
JP2006160552A (en) Method for manufacturing silicon single crystal
JPS58208193A (en) Crucible
JPH0411513B2 (en)
KR20210020539A (en) Apparatus for removing suspended solids to grow single crystal ingots, single crystal ingot grower applying the apparatus and method thereof
JP2830315B2 (en) High dissociation pressure single crystal manufacturing equipment