JPS58129305A - 光位置検出装置 - Google Patents

光位置検出装置

Info

Publication number
JPS58129305A
JPS58129305A JP1347782A JP1347782A JPS58129305A JP S58129305 A JPS58129305 A JP S58129305A JP 1347782 A JP1347782 A JP 1347782A JP 1347782 A JP1347782 A JP 1347782A JP S58129305 A JPS58129305 A JP S58129305A
Authority
JP
Japan
Prior art keywords
output
amplifier
peak value
circuit
sample hold
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1347782A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6217165B2 (cg-RX-API-DMAC10.html
Inventor
Kazuhisa Kanda
神田　和久
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP1347782A priority Critical patent/JPS58129305A/ja
Publication of JPS58129305A publication Critical patent/JPS58129305A/ja
Publication of JPS6217165B2 publication Critical patent/JPS6217165B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Automatic Focus Adjustment (AREA)
  • Optical Recording Or Reproduction (AREA)
JP1347782A 1982-01-29 1982-01-29 光位置検出装置 Granted JPS58129305A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1347782A JPS58129305A (ja) 1982-01-29 1982-01-29 光位置検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1347782A JPS58129305A (ja) 1982-01-29 1982-01-29 光位置検出装置

Publications (2)

Publication Number Publication Date
JPS58129305A true JPS58129305A (ja) 1983-08-02
JPS6217165B2 JPS6217165B2 (cg-RX-API-DMAC10.html) 1987-04-16

Family

ID=11834199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1347782A Granted JPS58129305A (ja) 1982-01-29 1982-01-29 光位置検出装置

Country Status (1)

Country Link
JP (1) JPS58129305A (cg-RX-API-DMAC10.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63257801A (ja) * 1987-04-15 1988-10-25 Matsushita Electric Ind Co Ltd ル−プ・ゲイン制御装置
JPH03226624A (ja) * 1990-01-31 1991-10-07 Nec Corp スタースキャナ
EP0944046A3 (en) * 1998-03-20 2001-11-14 Pioneer Electronic Corporation Pre-pit detecting apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11439022B2 (en) * 2019-09-02 2022-09-06 Samsung Electro-Mechanics Co., Ltd. Printed circuit board

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63257801A (ja) * 1987-04-15 1988-10-25 Matsushita Electric Ind Co Ltd ル−プ・ゲイン制御装置
JPH03226624A (ja) * 1990-01-31 1991-10-07 Nec Corp スタースキャナ
EP0944046A3 (en) * 1998-03-20 2001-11-14 Pioneer Electronic Corporation Pre-pit detecting apparatus

Also Published As

Publication number Publication date
JPS6217165B2 (cg-RX-API-DMAC10.html) 1987-04-16

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