JPS58127133A - 光学装置による波面変形の測定法と測定装置 - Google Patents
光学装置による波面変形の測定法と測定装置Info
- Publication number
- JPS58127133A JPS58127133A JP19518982A JP19518982A JPS58127133A JP S58127133 A JPS58127133 A JP S58127133A JP 19518982 A JP19518982 A JP 19518982A JP 19518982 A JP19518982 A JP 19518982A JP S58127133 A JPS58127133 A JP S58127133A
- Authority
- JP
- Japan
- Prior art keywords
- optical device
- phase
- measurement
- measuring
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims description 119
- 238000000034 method Methods 0.000 title claims description 10
- 238000005259 measurement Methods 0.000 claims description 67
- 230000002123 temporal effect Effects 0.000 claims description 16
- 230000001427 coherent effect Effects 0.000 claims description 13
- 238000001514 detection method Methods 0.000 claims description 13
- 238000000691 measurement method Methods 0.000 claims description 10
- 230000005540 biological transmission Effects 0.000 claims description 6
- 238000012795 verification Methods 0.000 claims description 3
- 230000001419 dependent effect Effects 0.000 claims description 2
- 230000000452 restraining effect Effects 0.000 claims 1
- 230000005284 excitation Effects 0.000 description 11
- 238000010586 diagram Methods 0.000 description 5
- 238000009826 distribution Methods 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000002452 interceptive effect Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 238000003556 assay Methods 0.000 description 1
- 210000000887 face Anatomy 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 210000001747 pupil Anatomy 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/04—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR8120840 | 1981-11-06 | ||
| FR8120840A FR2516236A1 (fr) | 1981-11-06 | 1981-11-06 | Dispositif et procede pour mesurer les deformations de surface d'onde introduites par un systeme optique |
| FR8207499 | 1982-04-30 | ||
| FR8207645 | 1982-05-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58127133A true JPS58127133A (ja) | 1983-07-28 |
Family
ID=9263767
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19518982A Pending JPS58127133A (ja) | 1981-11-06 | 1982-11-06 | 光学装置による波面変形の測定法と測定装置 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPS58127133A (OSRAM) |
| FR (1) | FR2516236A1 (OSRAM) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN119901462A (zh) * | 2024-12-31 | 2025-04-29 | 天府兴隆湖实验室 | 一种基于透射式光学元件波前畸变的评估方法、系统、设备及介质 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5194970A (OSRAM) * | 1975-01-14 | 1976-08-20 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3523735A (en) * | 1966-10-07 | 1970-08-11 | Gen Dynamics Corp | Interferometer system for distance measurement |
| US3767307A (en) * | 1971-08-30 | 1973-10-23 | Itek Corp | Real time interferometer |
| US3796495A (en) * | 1972-05-30 | 1974-03-12 | Zenith Radio Corp | Apparatus and methods for scanning phase profilometry |
-
1981
- 1981-11-06 FR FR8120840A patent/FR2516236A1/fr active Granted
-
1982
- 1982-11-06 JP JP19518982A patent/JPS58127133A/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5194970A (OSRAM) * | 1975-01-14 | 1976-08-20 |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2516236A1 (fr) | 1983-05-13 |
| FR2516236B1 (OSRAM) | 1983-12-23 |
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