JPS58110677A - Etching solution for copper - Google Patents
Etching solution for copperInfo
- Publication number
- JPS58110677A JPS58110677A JP20847981A JP20847981A JPS58110677A JP S58110677 A JPS58110677 A JP S58110677A JP 20847981 A JP20847981 A JP 20847981A JP 20847981 A JP20847981 A JP 20847981A JP S58110677 A JPS58110677 A JP S58110677A
- Authority
- JP
- Japan
- Prior art keywords
- etching
- copper
- soln
- nh4cl
- rate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/10—Etching compositions
- C23F1/14—Aqueous compositions
- C23F1/16—Acidic compositions
- C23F1/18—Acidic compositions for etching copper or alloys thereof
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- ing And Chemical Polishing (AREA)
Abstract
Description
【発明の詳細な説明】
どにより微細加工する際に用いる銅エッチング液に関す
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a copper etching solution used for fine processing.
第1図四〜停)はこのような銅膜の加工を必要とするフ
リップチップ素子の製造工程の一部を示し、シリコン基
板1上にはアルミニウム導体2が設けられ、その上に窒
化M3が被覆される(第1図^)この上にホトレジスト
4を所望のパターンに形成し、プラズマエツチングによ
り窒化膜3の一部を除去yる(agllM(B))。次
−こ、露出アルミニウム膜2および窒化膜3の上にチタ
ン膜5、銅膜6の二層そM着する(第1図(Cl )。Figure 1 (4-4) shows a part of the manufacturing process of a flip-chip device that requires processing of such a copper film, in which an aluminum conductor 2 is provided on a silicon substrate 1, and nitride M3 is formed on it. A photoresist 4 is formed on the coated film (FIG. 1) in a desired pattern, and a part of the nitride film 3 is removed by plasma etching (agllM(B)). Next, two layers of titanium film 5 and copper film 6 are deposited on exposed aluminum film 2 and nitride film 3 (FIG. 1 (Cl)).
さらにホトレジストアにより所望の領域を被覆し、銅p
a6をエツチングする(第1図(D))。この残された
銅[6!こニッケルめっき層8を介してはんだバンプ9
を形成する(第1図E)。この場合第1図(DJに示す
銅膜のエツチング液さして一般に例えば1mol/lO
) 濃度の塩化第二鉄水溶液あるいは過硫酸アンモニウ
ム水#液が用いられていた。しかしこれらのエツチング
液を用いるとエツチングの際の水素気泡の発生によりエ
ツチングの均一性が悪く、またサイドエツチング量が大
きいため、銅膜の微細加工エツチングには不充分であっ
た。特に、大量のシリコン板の同時処理の場合には、エ
ツチング液の温度上昇によりサイドエツチング量が大き
くなるので問題があった。サイドエツチング量は、過硫
酸アンモニウムの低濃度水溶液の場合比較的少なくなる
が、エツチング速度が遅くなり、作業性が悪くなる欠点
がある。!!2図は1μmの銅膜をエツチングした場合
の過酸化アンモニウム酸度と銅のエッチング速度(線2
1)gよび顕微鏡により測定したサイドエツチング量(
[22)の関係を示す。微細加工の際許容できるサイド
エツチング蓋は一般に3μm程度以下であり、従って(
NH4) 2820g の濃度は50g/l 以下が望
ましい。し力)しその場合エツチング速度は非常に遅く
なり、1μmをエツチングするのに3分を要する。Furthermore, the desired areas are coated with photoresist, and copper p
Etch a6 (Fig. 1(D)). This remaining copper [6! Solder bumps 9 are formed through the nickel plating layer 8.
(Fig. 1E). In this case, the etching solution for the copper film shown in Figure 1 (DJ) is generally 1 mol/lO.
) concentrated ferric chloride aqueous solution or ammonium persulfate aqueous solution was used. However, when these etching solutions are used, the uniformity of etching is poor due to the generation of hydrogen bubbles during etching, and the amount of side etching is large, so that they are insufficient for microfabrication etching of copper films. Particularly, when processing a large number of silicon plates at the same time, there is a problem because the amount of side etching increases due to the temperature rise of the etching solution. The amount of side etching is relatively small in the case of a low concentration aqueous solution of ammonium persulfate, but this has the disadvantage that the etching speed is slow and workability is poor. ! ! Figure 2 shows the ammonium peroxide acidity and copper etching rate (line 2) when etching a 1 μm copper film.
1) Side etching amount measured by g and microscope (
The relationship [22] is shown. The allowable side etching lid during microfabrication is generally about 3 μm or less, and therefore (
The concentration of NH4) 2820g is preferably 50g/l or less. In that case, the etching speed becomes very slow, and it takes 3 minutes to etch 1 μm.
本発明は、これに対してエツチングの均一性がよく、か
つエツチング速度が大きくてしかもサイドエツチングの
少ない銅膜のエツチング液を提供することを目的とする
。In view of this, it is an object of the present invention to provide a copper film etching solution that has good etching uniformity, a high etching rate, and less side etching.
この目的は、塩化アンモニウムを添加した過装置アンモ
ニウム水溶液によって達成できる。This objective can be achieved by filtering an aqueous ammonium solution to which ammonium chloride has been added.
本発明は過硫酸アンモニウム液の銅のエツチング速度を
塩化アンモニウムの添加により高めることができ、しか
もサイドエツチング量を著しく増加させないとのg*に
基づく。ただし、塩化アンモニウムの添加量は11当た
り10g以下に抑える必要があり、それを超えるとサイ
ドエツチング量が大きくなる。The present invention is based on g* that the etching rate of copper in ammonium persulfate solution can be increased by adding ammonium chloride without significantly increasing the amount of side etching. However, the amount of ammonium chloride added needs to be suppressed to 10 g or less per 11, and if it exceeds this, the amount of side etching will increase.
第3図は、25g/1O)一度の過硫酸アンモニウム液
に塩化アンモニウムを添加したときの1μmの厚さの銅
膜のエツチング速度およびす・「ドエッチング菫の変化
を示し、エツチング速度はNH4Clの添加とともに上
昇するのに対し、サイドエツチング蓋はNH4Cl0)
添加蓋°が10 g/l 市ではあまり上昇せず、3
μm以下の瞳であることが判る。エツチング速度はNH
4C/ 10g/lの添加にふいて90A/secとな
り、第2図に示した(NH4)2S2(7825g/l
濃度の場合のエツチング速It 45 A/ s e
cの2倍になる。すなわち1μmをエツチングするの
ic1分50fυすみ、し力)もサイドエツチング量は
平均2.5μmである。第3図に示したようなNH4C
7の添加によるエツチング速度の向上ならびにサイドエ
ツチング量が10g/l 以下の添加では余り増加せず
それを超えると急に増加することは、(N)14) 2
8204 液の濃度が変っても同様にあられれる。Figure 3 shows the etching rate of a 1 μm thick copper film when ammonium chloride was added to the ammonium persulfate solution at 25g/1O) and the change in etching violet. (NH4Cl0) on the side etching lid.
Addition lid degree was 10 g/l.It did not increase much in the city, and 3
It can be seen that the pupils are smaller than μm. Etching speed is NH
After adding 4C/10g/l, it became 90A/sec, and the (NH4)2S2 (7825g/l) shown in Figure 2
Etching speed It 45 A/s e
It will be twice as much as c. In other words, it takes 50 fυ minutes for IC to etch 1 .mu.m, and the average side etching amount is 2.5 .mu.m. NH4C as shown in Figure 3
The improvement in etching speed due to the addition of No. 7 and the fact that the amount of side etching does not increase much when added below 10 g/l, but suddenly increases when it exceeds (N) 14) 2
8204 Even if the concentration of the liquid changes, it will appear in the same way.
さらに、本発明による塩化アンモニウムの添加は、エツ
チングの際の水素気泡の発生を抑制する効果があり、こ
れによってエツチングの均一性も向上する。Furthermore, the addition of ammonium chloride according to the present invention has the effect of suppressing the generation of hydrogen bubbles during etching, thereby improving the uniformity of etching.
以上述べたように、本発明は過硫酸アンモニウム水解液
に塩化アンモニウムを添加するのみで銅膜をサイドエツ
チング量の増加なしに速くエツチングできる銅エツチン
グ液を得るもので、半導体素子に2いて銅膜を所望のパ
ターンに微細加工する場合に大量エツチング処理を可能
にするため極めて有効に適用され公。As described above, the present invention provides a copper etching solution that can quickly etch a copper film without increasing the amount of side etching by simply adding ammonium chloride to an ammonium persulfate aqueous solution. It is extremely effectively applied and publicly used because it enables mass etching processing when finely processing a desired pattern.
第1図(5)〜侵)は本発明によるエツチング液が使用
すれる一例の7.リップチップ素子の製造工程を示す断
面図、第2図は従来の過硫酸アンモニウムエツーt−ン
グ液の濃度とエツチング速度およびサイドエツチング蓋
を示す関係線図、第3図は過硫酸アンモニウム液への本
発明による塩化アンモニウムの添加のエツチング速度8
よびサイドエツチング蓋への影響を示す関係線図である
。FIG. 1 (5) to 7) show an example in which the etching solution according to the present invention is used. A cross-sectional view showing the manufacturing process of a lip chip element, FIG. 2 is a relationship diagram showing the concentration, etching rate, and side etching lid of a conventional ammonium persulfate etching solution, and FIG. 3 is a diagram showing the present invention for the ammonium persulfate etching solution. Etching rate of ammonium chloride addition by 8
FIG. 3 is a relationship diagram showing the influence on the side etching lid and side etching lid.
Claims (1)
水溶液であることを特徴とする銅エツチング液。 2、特許請求の範囲第1項記載の液において、塩化アン
モニウムの添加量が10 g/l 以下であることを特
徴とする銅エツチング液。[Scope of Claims] 1] A copper etching solution characterized by being an ammonium persulfate aqueous solution to which ammonium chloride is added. 2. A copper etching solution according to claim 1, characterized in that the amount of ammonium chloride added is 10 g/l or less.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20847981A JPS58110677A (en) | 1981-12-23 | 1981-12-23 | Etching solution for copper |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20847981A JPS58110677A (en) | 1981-12-23 | 1981-12-23 | Etching solution for copper |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58110677A true JPS58110677A (en) | 1983-07-01 |
Family
ID=16556840
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20847981A Pending JPS58110677A (en) | 1981-12-23 | 1981-12-23 | Etching solution for copper |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58110677A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01156483A (en) * | 1987-12-11 | 1989-06-20 | Yamatoya Shokai:Kk | Method for controlling capacity of acidic etchant for copper or copper alloy |
-
1981
- 1981-12-23 JP JP20847981A patent/JPS58110677A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01156483A (en) * | 1987-12-11 | 1989-06-20 | Yamatoya Shokai:Kk | Method for controlling capacity of acidic etchant for copper or copper alloy |
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