JPS58101113U - Measuring point detection device in fluorescent X-ray film thickness meter - Google Patents

Measuring point detection device in fluorescent X-ray film thickness meter

Info

Publication number
JPS58101113U
JPS58101113U JP19877281U JP19877281U JPS58101113U JP S58101113 U JPS58101113 U JP S58101113U JP 19877281 U JP19877281 U JP 19877281U JP 19877281 U JP19877281 U JP 19877281U JP S58101113 U JPS58101113 U JP S58101113U
Authority
JP
Japan
Prior art keywords
fluorescent
plate
detection
film thickness
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19877281U
Other languages
Japanese (ja)
Inventor
伴田 稔
Original Assignee
セイコーインスツルメンツ株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by セイコーインスツルメンツ株式会社 filed Critical セイコーインスツルメンツ株式会社
Priority to JP19877281U priority Critical patent/JPS58101113U/en
Publication of JPS58101113U publication Critical patent/JPS58101113U/en
Pending legal-status Critical Current

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  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図面はこの考案による測定点検出装置を示すもので、第
1図は全体を示す構成図、第2図は第1図の要部を示す
拡大側面図、第3図は全体を示す構成図である。 1・・・X線M、2−・・シャッタ、3・・・コリメ′
−タ、4・・・XY試料台、6・・・ミラー、7・・・
顕微鏡、8・・・検出孔、9・・・治具体、10・・・
螢光板、11・・・光電  ゛変換素子板、12、・・
・検出表示体である。
The drawings show the measuring point detection device according to this invention. Fig. 1 is an overall configuration diagram, Fig. 2 is an enlarged side view showing the main parts of Fig. 1, and Fig. 3 is an overall configuration diagram. be. 1...X-ray M, 2-...Shutter, 3...Collimation'
- data, 4...XY sample stage, 6...mirror, 7...
Microscope, 8...detection hole, 9...jigging body, 10...
Fluorescent plate, 11... Photoelectric conversion element plate, 12,...
・It is a detection display body.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] XY方向に移動可能なXY試料テiプル上に設けられ箱
形をなす治具体と、このXY試料テーブル上において治
具体内に設けられ螢光板と光電変換素子板との二層状か
らなる検出板と、前記治具体の上板部に形成された検出
孔と、前記光電変換素子板に接続された検出表示体とを
備え、前記検出孔を径で入射されたX線が螢光先板に照
射されると光電変換素子板9電気変化量を検出表示体に
表示するようにした構成よりなることを特徴とする螢光
X線膜厚計に於ける測定点検出装置。
A box-shaped fixture provided on an XY sample table movable in the XY directions; and a detection plate provided in the fixture on the XY sample table and consisting of a two-layered structure consisting of a fluorescent plate and a photoelectric conversion element plate. and a detection hole formed in the upper plate part of the jig, and a detection display body connected to the photoelectric conversion element plate, and X-rays incident on the detection hole with a diameter enter the fluorescent tip plate. 1. A measurement point detection device for a fluorescent X-ray film thickness meter, characterized in that the amount of electrical change in a photoelectric conversion element plate 9 is displayed on a detection display when irradiated.
JP19877281U 1981-12-28 1981-12-28 Measuring point detection device in fluorescent X-ray film thickness meter Pending JPS58101113U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19877281U JPS58101113U (en) 1981-12-28 1981-12-28 Measuring point detection device in fluorescent X-ray film thickness meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19877281U JPS58101113U (en) 1981-12-28 1981-12-28 Measuring point detection device in fluorescent X-ray film thickness meter

Publications (1)

Publication Number Publication Date
JPS58101113U true JPS58101113U (en) 1983-07-09

Family

ID=30111939

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19877281U Pending JPS58101113U (en) 1981-12-28 1981-12-28 Measuring point detection device in fluorescent X-ray film thickness meter

Country Status (1)

Country Link
JP (1) JPS58101113U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014076974A1 (en) * 2012-11-16 2014-05-22 パルステック工業株式会社 Diffraction ring forming device and diffraction ring forming system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4941577A (en) * 1972-08-29 1974-04-18

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4941577A (en) * 1972-08-29 1974-04-18

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014076974A1 (en) * 2012-11-16 2014-05-22 パルステック工業株式会社 Diffraction ring forming device and diffraction ring forming system

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