JPS5799766A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS5799766A
JPS5799766A JP55176713A JP17671380A JPS5799766A JP S5799766 A JPS5799766 A JP S5799766A JP 55176713 A JP55176713 A JP 55176713A JP 17671380 A JP17671380 A JP 17671380A JP S5799766 A JPS5799766 A JP S5799766A
Authority
JP
Japan
Prior art keywords
vth
voltage
substrate
clamping
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55176713A
Other languages
Japanese (ja)
Inventor
Masahiko Yoshimoto
Kenji Anami
Hiroshi Shinohara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP55176713A priority Critical patent/JPS5799766A/en
Publication of JPS5799766A publication Critical patent/JPS5799766A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02Regulating voltage or current
    • G05F3/08Regulating voltage or current wherein the variable is dc
    • G05F3/10Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/205Substrate bias-voltage generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Nonlinear Science (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To prevent the variation of substrate bias generating voltage even when line voltage varies by mounting a clamping circuit at the output side of a substrate potential generating circuit and clamping the upper and lower limits or one side of the oscillating output of a drive circuit. CONSTITUTION:Rectangular waves are oscillated 201 at predetermined frequency, and supplied to the drive circuit 202. When the threshold voltage of the FET201 of the voltage clamping circuit 210 is Vth, the upper limit of the output of the drive circuit 202 is clamped to VR+Vth, and fed to a coupling capacity 203. The potential of a node 207 is changed into the rectangular waves, which have the +Vth maximum value and the minimum value of Vth-(VR+Vth)=-VR, by the clamping action of an FET205, electrons are scooped out to a substrate 208 through an FET204 by the negative voltage, and the substrate voltage VR under a stationary state shifts only by the threshold value Vth of the FET and reaches approximately Vth-VR. Accordingly, when VR is set to value suffuiciently lower than a variation section of the line voltage Vcc, the substrate bias generating voltage is fixed to (Vth-VR) without regard to the variation of Vcc.
JP55176713A 1980-12-11 1980-12-11 Semiconductor integrated circuit Pending JPS5799766A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55176713A JPS5799766A (en) 1980-12-11 1980-12-11 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55176713A JPS5799766A (en) 1980-12-11 1980-12-11 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS5799766A true JPS5799766A (en) 1982-06-21

Family

ID=16018452

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55176713A Pending JPS5799766A (en) 1980-12-11 1980-12-11 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS5799766A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5914665A (en) * 1982-07-16 1984-01-25 Nec Corp Semiconductor device
JPS63304656A (en) * 1987-05-15 1988-12-12 アドバンスト・マイクロ・ディバイシズ・インコーポレーテッド Protective system of complementary metal oxide semiconductor integrated circuit
US6125075A (en) * 1985-07-22 2000-09-26 Hitachi, Ltd. Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5914665A (en) * 1982-07-16 1984-01-25 Nec Corp Semiconductor device
US6125075A (en) * 1985-07-22 2000-09-26 Hitachi, Ltd. Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions
US6363029B1 (en) 1985-07-22 2002-03-26 Hitachi, Ltd. Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions
US6970391B2 (en) 1985-07-22 2005-11-29 Renesas Technology Corporation Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions
US7002856B2 (en) 1986-07-18 2006-02-21 Renesas Technology Corporation Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions
JPS63304656A (en) * 1987-05-15 1988-12-12 アドバンスト・マイクロ・ディバイシズ・インコーポレーテッド Protective system of complementary metal oxide semiconductor integrated circuit

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