JPS5797152A - Diagnostic system of priority selecting circuit - Google Patents

Diagnostic system of priority selecting circuit

Info

Publication number
JPS5797152A
JPS5797152A JP55173089A JP17308980A JPS5797152A JP S5797152 A JPS5797152 A JP S5797152A JP 55173089 A JP55173089 A JP 55173089A JP 17308980 A JP17308980 A JP 17308980A JP S5797152 A JPS5797152 A JP S5797152A
Authority
JP
Japan
Prior art keywords
circuit
priority selecting
priority
fault
groups
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55173089A
Other languages
English (en)
Inventor
Katsuo Uyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55173089A priority Critical patent/JPS5797152A/ja
Publication of JPS5797152A publication Critical patent/JPS5797152A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP55173089A 1980-12-10 1980-12-10 Diagnostic system of priority selecting circuit Pending JPS5797152A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55173089A JPS5797152A (en) 1980-12-10 1980-12-10 Diagnostic system of priority selecting circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55173089A JPS5797152A (en) 1980-12-10 1980-12-10 Diagnostic system of priority selecting circuit

Publications (1)

Publication Number Publication Date
JPS5797152A true JPS5797152A (en) 1982-06-16

Family

ID=15953993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55173089A Pending JPS5797152A (en) 1980-12-10 1980-12-10 Diagnostic system of priority selecting circuit

Country Status (1)

Country Link
JP (1) JPS5797152A (ja)

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