JPS5796254A - Eddy current tester - Google Patents

Eddy current tester

Info

Publication number
JPS5796254A
JPS5796254A JP56164874A JP16487481A JPS5796254A JP S5796254 A JPS5796254 A JP S5796254A JP 56164874 A JP56164874 A JP 56164874A JP 16487481 A JP16487481 A JP 16487481A JP S5796254 A JPS5796254 A JP S5796254A
Authority
JP
Japan
Prior art keywords
eddy current
current tester
tester
eddy
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56164874A
Other languages
English (en)
Inventor
Jiei Denton Kuraido
Tei Ramu Roido
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZETETSUKU Inc
Original Assignee
ZETETSUKU Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ZETETSUKU Inc filed Critical ZETETSUKU Inc
Publication of JPS5796254A publication Critical patent/JPS5796254A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • G01N27/9053—Compensating for probe to workpiece spacing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP56164874A 1980-10-14 1981-10-14 Eddy current tester Pending JPS5796254A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/196,197 US4424486A (en) 1980-10-14 1980-10-14 Phase rotation circuit for an eddy current tester

Publications (1)

Publication Number Publication Date
JPS5796254A true JPS5796254A (en) 1982-06-15

Family

ID=22724422

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56164874A Pending JPS5796254A (en) 1980-10-14 1981-10-14 Eddy current tester

Country Status (6)

Country Link
US (1) US4424486A (ja)
JP (1) JPS5796254A (ja)
CA (1) CA1181487A (ja)
DE (1) DE3140848A1 (ja)
FR (1) FR2492104B1 (ja)
GB (1) GB2086057B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993006477A1 (en) * 1990-03-16 1993-04-01 Kabushiki Kaisha Nihon Hihakai Keisoku Kenkyusho Eddy current flaw detection method and apparatus therefor

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4499421A (en) * 1981-06-08 1985-02-12 Schlumberger Technology Corporation Digital induction logging system including means for generating a plurality of transmitter frequencies
SE430545B (sv) * 1982-04-01 1983-11-21 Asea Ab Anordning for detektering av metallforemal i ett materialflode
US4518917A (en) * 1982-08-31 1985-05-21 Westinghouse Electric Corp. Plural sensor apparatus for monitoring turbine blading with undesired component elimination
JPS5975146A (ja) * 1982-10-21 1984-04-27 Chugoku X Sen Kk 金属管の渦流探傷装置
US4528506A (en) * 1982-11-23 1985-07-09 The United States Of America As Represented By The Secretary Of The Air Force Ferromagnetic resonance probe liftoff suppression apparatus
FR2540630B1 (fr) * 1983-02-08 1985-08-09 Commissariat Energie Atomique Sonde multibobines a courants de foucault munie d'un dispositif d'equilibrage des bobines
DE3313820A1 (de) * 1983-04-16 1984-10-18 Institut Dr. Friedrich Förster Prüfgerätebau GmbH & Co KG, 7410 Reutlingen Einrichtung zum pruefen der oberflaeche eines metallischen pruefteiles
DE3410547A1 (de) * 1984-03-22 1985-09-26 Institut Dr. Friedrich Förster Prüfgerätebau GmbH & Co KG, 7410 Reutlingen Pruefgeraet zum untersuchen elektrisch leitender pruefteile
US4629985A (en) * 1984-04-11 1986-12-16 Pa Incorporated Method and apparatus for measuring defects in tubular members
US4652822A (en) * 1984-07-16 1987-03-24 John Wallace Multi-frequency eddy-current system and method
US4651094A (en) * 1984-07-16 1987-03-17 John Wallace Accuracy control subsystem
GB2163263B (en) * 1984-07-16 1988-05-11 Casting Analysis Corp Accuracy control subsystem
FR2570500B1 (fr) * 1984-09-20 1987-03-20 Siderurgie Fse Inst Rech Procede et dispositif de detection de defauts typiques sur un produit en defilement, notamment pour la detection de criques sur une brame
SE456865B (sv) * 1987-03-17 1988-11-07 Bengt Hjalmar Toernblom Anordning foer provning och/eller maetning, innefattande minst en faskaenslig detektor
DE3817574A1 (de) * 1988-05-24 1989-11-30 Fraunhofer Ges Forschung Wirbelstromsensor
US4879527A (en) * 1989-01-23 1989-11-07 Cincinnati Electronics Corporation Phase lock loop and improved phase detector therefor
FR2671187A1 (fr) * 1990-12-28 1992-07-03 Cga Hbs Dispositif de controle non destructif a courants de foucault.
FR2689637B1 (fr) * 1992-04-06 1996-08-09 Aerospatiale Procede et installation de controle non destructif d'une piece utilisant un capteur a courants de foucault.
US5508610A (en) * 1992-12-03 1996-04-16 Georgia Tech Research Corporation Electrical conductivity tester and methods thereof for accurately measuring time-varying and steady state conductivity using phase shift detection
US6658568B1 (en) * 1995-02-13 2003-12-02 Intertrust Technologies Corporation Trusted infrastructure support system, methods and techniques for secure electronic commerce transaction and rights management
US6037768A (en) * 1997-04-02 2000-03-14 Iowa State University Research Foundation, Inc. Pulsed eddy current inspections and the calibration and display of inspection results
WO2001046939A1 (en) 1999-12-20 2001-06-28 Connor Henry Moncrieff O Method for generating and displaying complex data utilizing color-coded signals
US7379520B2 (en) * 2002-04-01 2008-05-27 Broadcom Corporation Low jitter phase rotator
US6922109B2 (en) * 2002-04-01 2005-07-26 Broadcom Corporation Multiple synthesized clocks with fractional PPM control from a single clock source
US7162002B2 (en) * 2002-03-01 2007-01-09 Broadcom Corporation Phase-interpolator based PLL frequency synthesizer
TWI273250B (en) * 2004-06-28 2007-02-11 Richtek Technology Corp A sensor apparatus without being influenced by bias electric current and the method thereof
US7161443B2 (en) * 2004-09-30 2007-01-09 Broadcom Corporation Temperature compensated crystal oscillator
US7505859B2 (en) * 2007-04-05 2009-03-17 Olympus Ndt Method and algorithms for inspection of longitudinal defects in an eddy current inspection system
US20080290866A1 (en) * 2007-05-23 2008-11-27 Cuffe John M Method and apparatus for digital measurement of an eddy current signal
JP4975142B2 (ja) * 2010-06-17 2012-07-11 トヨタ自動車株式会社 渦流計測用センサ及び渦流計測方法
RU2548384C1 (ru) * 2013-11-01 2015-04-20 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Национальный исследовательский университет "МЭИ" Способ настройки вихретокового дефектоскопа
GB2524610B (en) * 2014-03-28 2016-09-21 Technical Software Consultants Ltd A.C. Field measurement system
CN118067831A (zh) * 2024-04-18 2024-05-24 天津市特种设备监督检验技术研究院(天津市特种设备事故应急调查处理中心) 一种用于铁磁性材料检测的acfm提离效应抑制方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD67502A (ja) *
FR2324003A1 (fr) * 1975-09-09 1977-04-08 Commissariat Energie Atomique Procede de controle non destructif par courants de foucault et dispositif correspondant, utilisant une excitation multifrequence et permettant l'elimination de certains parametres
JPS535678A (en) * 1976-07-03 1978-01-19 Shoei Denki Kk Device for measuring active and reactive components of aac current or power

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993006477A1 (en) * 1990-03-16 1993-04-01 Kabushiki Kaisha Nihon Hihakai Keisoku Kenkyusho Eddy current flaw detection method and apparatus therefor
US5391988A (en) * 1990-03-16 1995-02-21 Kabushiki Kaisha Nihon Hihakai Keisoku Kenkyusho Method and apparatus for detecting flaws within a conductive object while cancelling the effects of variation in distance between the detection apparatus and the conductive object

Also Published As

Publication number Publication date
GB2086057A (en) 1982-05-06
FR2492104A1 (fr) 1982-04-16
CA1181487A (en) 1985-01-22
GB2086057B (en) 1985-08-21
US4424486A (en) 1984-01-03
FR2492104B1 (fr) 1985-06-21
DE3140848A1 (de) 1982-05-27

Similar Documents

Publication Publication Date Title
GB2086057B (en) Eddy current tester
JPS5796273A (en) Tester
DE3176171D1 (en) Current detector
JPS57120807A (en) Object inspector
GB2083226B (en) Eddy current testing probe
GB2074328B (en) Testing lamps
JPS57127859A (en) Wattmeter
JPS56140261A (en) Current measuring circuit
GB8327262D0 (en) Eddy current probe
JPS5739357A (en) Wattmeter
GB8405374D0 (en) Continuously measuring distance utilizing eddy current
GB8329244D0 (en) Measuring means
DE3173000D1 (en) Electric micrometer
JPS56128427A (en) Electrical measuring apparatus
DE3165142D1 (en) Magnetic arrangement
JPS56159687A (en) Magnetic indicator
GB2079952B (en) Magnetographic testing
JPS5772055A (en) Eddy current type probe
JPS5786020A (en) Balance tester
GB8602554D0 (en) Eddy current testing
GB8315680D0 (en) Eddy current microscopes
GB2068621B (en) Testing coins
JPS5748657A (en) Inspection kit
ZA837891B (en) Magnetic testing apparatus
JPS5778311A (en) Current indicator