JPS5772055A - Eddy current type probe - Google Patents

Eddy current type probe

Info

Publication number
JPS5772055A
JPS5772055A JP56128655A JP12865581A JPS5772055A JP S5772055 A JPS5772055 A JP S5772055A JP 56128655 A JP56128655 A JP 56128655A JP 12865581 A JP12865581 A JP 12865581A JP S5772055 A JPS5772055 A JP S5772055A
Authority
JP
Japan
Prior art keywords
eddy current
current type
type probe
probe
eddy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56128655A
Other languages
Japanese (ja)
Inventor
Daburiyu Gento Hiyuu
Esu Setsuko Barenteino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Atomic Energy of Canada Ltd AECL
Original Assignee
Atomic Energy of Canada Ltd AECL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atomic Energy of Canada Ltd AECL filed Critical Atomic Energy of Canada Ltd AECL
Publication of JPS5772055A publication Critical patent/JPS5772055A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • G01N27/9053—Compensating for probe to workpiece spacing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP56128655A 1980-08-18 1981-08-17 Eddy current type probe Pending JPS5772055A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA000359392A CA1158314A (en) 1980-08-18 1980-08-18 Eddy current surface probe

Publications (1)

Publication Number Publication Date
JPS5772055A true JPS5772055A (en) 1982-05-06

Family

ID=4117782

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56128655A Pending JPS5772055A (en) 1980-08-18 1981-08-17 Eddy current type probe

Country Status (6)

Country Link
JP (1) JPS5772055A (en)
CA (1) CA1158314A (en)
DE (1) DE3130685A1 (en)
FR (1) FR2488693A1 (en)
GB (1) GB2082330B (en)
IT (1) IT1144610B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107907587A (en) * 2017-11-10 2018-04-13 南昌航空大学 A kind of underdamping state Pulsed Eddy Current Testing System

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1201481A (en) * 1982-10-22 1986-03-04 Majesty (Her) In Right Of Canada As Represented By Atomic Energy Of Canada Limited/L'energie Atomique Du Canada Limitee Eddy current probe with defect-noise discrimination
SE457117B (en) * 1984-02-17 1988-11-28 Bengt Hjalmar Toernblom SET AND DEVICE FOR TESTING ELECTRICALLY CONDUCTIVE SAMPLES
FR2574938B1 (en) * 1984-12-19 1986-12-26 Snecma METHOD OF CONTROLLING BY CONTACTLESS EDGE CURRENT AND DEVICE FOR IMPLEMENTING IT
GB8521266D0 (en) * 1985-08-24 1985-10-02 Thorburn Technics Int Electromagnetic inspection probe
DE69233065D1 (en) * 1991-06-11 2003-06-26 Newt Holdings Ltd probe
CA2310467A1 (en) * 1997-11-21 1999-06-03 Volvo Aero Corporation A testing method for machined workpieces
US7289913B2 (en) * 2004-10-08 2007-10-30 Jentek Sensors, Inc. Local feature characterization using quasistatic electromagnetic sensors

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3197693A (en) * 1960-10-04 1965-07-27 Hugo L Libby Nondestructive eddy current subsurface testing device providing compensation for variation in probe-to-specimen spacing and surface irregularities
US3449664A (en) * 1966-05-16 1969-06-10 Bell Inc F W Magnetic reaction testing apparatus and method of testing utilizing semiconductor means for magnetic field sensing of an eddy-current-reaction magnetic field
US3753096A (en) * 1971-02-04 1973-08-14 Automation Ind Inc Eddy current flaw detection system with left off compensation
SU595671A2 (en) * 1976-01-28 1978-02-28 Иркутский Филиал Всесоюзного Научно-Исследовательского И Проектного Института Алюминиевой Магниевой И Электродной Промышленности Structure scope
DE2746568A1 (en) * 1977-10-17 1979-04-26 Kraftwerk Union Ag EDDY CURRENT PROBE FOR TESTING FERROMAGNETIC MATERIALS

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107907587A (en) * 2017-11-10 2018-04-13 南昌航空大学 A kind of underdamping state Pulsed Eddy Current Testing System
CN107907587B (en) * 2017-11-10 2021-05-11 南昌航空大学 Under-damping state pulse eddy current detection system

Also Published As

Publication number Publication date
GB2082330A (en) 1982-03-03
IT1144610B (en) 1986-10-29
GB2082330B (en) 1984-05-31
FR2488693B1 (en) 1984-01-06
CA1158314A (en) 1983-12-06
DE3130685A1 (en) 1982-04-15
FR2488693A1 (en) 1982-02-19
IT8168073A0 (en) 1981-07-31

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