IT1144610B - SURFACE PARASITE CURRENT PROBE - Google Patents

SURFACE PARASITE CURRENT PROBE

Info

Publication number
IT1144610B
IT1144610B IT68073/81A IT6807381A IT1144610B IT 1144610 B IT1144610 B IT 1144610B IT 68073/81 A IT68073/81 A IT 68073/81A IT 6807381 A IT6807381 A IT 6807381A IT 1144610 B IT1144610 B IT 1144610B
Authority
IT
Italy
Prior art keywords
current probe
parasite current
surface parasite
probe
parasite
Prior art date
Application number
IT68073/81A
Other languages
Italian (it)
Other versions
IT8168073A0 (en
Inventor
Hugh W Ghent
Valentino S Cecco
Original Assignee
Ca Atomic Energy Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ca Atomic Energy Ltd filed Critical Ca Atomic Energy Ltd
Publication of IT8168073A0 publication Critical patent/IT8168073A0/en
Application granted granted Critical
Publication of IT1144610B publication Critical patent/IT1144610B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • G01N27/9053—Compensating for probe to workpiece spacing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
IT68073/81A 1980-08-18 1981-07-31 SURFACE PARASITE CURRENT PROBE IT1144610B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA000359392A CA1158314A (en) 1980-08-18 1980-08-18 Eddy current surface probe

Publications (2)

Publication Number Publication Date
IT8168073A0 IT8168073A0 (en) 1981-07-31
IT1144610B true IT1144610B (en) 1986-10-29

Family

ID=4117782

Family Applications (1)

Application Number Title Priority Date Filing Date
IT68073/81A IT1144610B (en) 1980-08-18 1981-07-31 SURFACE PARASITE CURRENT PROBE

Country Status (6)

Country Link
JP (1) JPS5772055A (en)
CA (1) CA1158314A (en)
DE (1) DE3130685A1 (en)
FR (1) FR2488693A1 (en)
GB (1) GB2082330B (en)
IT (1) IT1144610B (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1201481A (en) * 1982-10-22 1986-03-04 Majesty (Her) In Right Of Canada As Represented By Atomic Energy Of Canada Limited/L'energie Atomique Du Canada Limitee Eddy current probe with defect-noise discrimination
SE457117B (en) * 1984-02-17 1988-11-28 Bengt Hjalmar Toernblom SET AND DEVICE FOR TESTING ELECTRICALLY CONDUCTIVE SAMPLES
FR2574938B1 (en) * 1984-12-19 1986-12-26 Snecma METHOD OF CONTROLLING BY CONTACTLESS EDGE CURRENT AND DEVICE FOR IMPLEMENTING IT
GB8521266D0 (en) * 1985-08-24 1985-10-02 Thorburn Technics Int Electromagnetic inspection probe
DE69233065D1 (en) * 1991-06-11 2003-06-26 Newt Holdings Ltd probe
JP2001524669A (en) * 1997-11-21 2001-12-04 ボルボ エアロ コーポレイション Inspection method for machined products
US7289913B2 (en) * 2004-10-08 2007-10-30 Jentek Sensors, Inc. Local feature characterization using quasistatic electromagnetic sensors
CN107907587B (en) * 2017-11-10 2021-05-11 南昌航空大学 Under-damping state pulse eddy current detection system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3197693A (en) * 1960-10-04 1965-07-27 Hugo L Libby Nondestructive eddy current subsurface testing device providing compensation for variation in probe-to-specimen spacing and surface irregularities
US3449664A (en) * 1966-05-16 1969-06-10 Bell Inc F W Magnetic reaction testing apparatus and method of testing utilizing semiconductor means for magnetic field sensing of an eddy-current-reaction magnetic field
US3753096A (en) * 1971-02-04 1973-08-14 Automation Ind Inc Eddy current flaw detection system with left off compensation
SU595671A2 (en) * 1976-01-28 1978-02-28 Иркутский Филиал Всесоюзного Научно-Исследовательского И Проектного Института Алюминиевой Магниевой И Электродной Промышленности Structure scope
DE2746568A1 (en) * 1977-10-17 1979-04-26 Kraftwerk Union Ag EDDY CURRENT PROBE FOR TESTING FERROMAGNETIC MATERIALS

Also Published As

Publication number Publication date
FR2488693A1 (en) 1982-02-19
CA1158314A (en) 1983-12-06
IT8168073A0 (en) 1981-07-31
JPS5772055A (en) 1982-05-06
GB2082330A (en) 1982-03-03
GB2082330B (en) 1984-05-31
DE3130685A1 (en) 1982-04-15
FR2488693B1 (en) 1984-01-06

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