JPS5772455A - Testing method for subscriber's circuit - Google Patents

Testing method for subscriber's circuit

Info

Publication number
JPS5772455A
JPS5772455A JP14858980A JP14858980A JPS5772455A JP S5772455 A JPS5772455 A JP S5772455A JP 14858980 A JP14858980 A JP 14858980A JP 14858980 A JP14858980 A JP 14858980A JP S5772455 A JPS5772455 A JP S5772455A
Authority
JP
Japan
Prior art keywords
circuit
subscriber
code
sine wave
comparing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14858980A
Other languages
Japanese (ja)
Inventor
Seiji Onoguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP14858980A priority Critical patent/JPS5772455A/en
Publication of JPS5772455A publication Critical patent/JPS5772455A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/302—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs
    • H04M3/303—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs and using PCM multiplexers, e.g. pair gain systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Abstract

PURPOSE:To measure the transmission-side characteristic of the subscriber's circuit in a time division exchange independently, by supplying an analogue signal of the sine wave of natural binary indication from the input terminal of the subscriber's circuit and by comparing a signal from the output terminal and the input-side sine wave with each other. CONSTITUTION:In case of the test for the transmission-side characteristic of a subscriber's circuit 10 of a time division exchange, an output AS of a transmitting part 20 is connected to an input terminal 1 of the subscriber's circuit. In the transmitting part 20, a function generating circuit 22 converts an inputted sine wave DS of an amplitude (h) and a frequency (f) to a natural binary code and transfers it to a D-A converting part 23 and a comparing part 40 by a clock pulse CP from an oscillating circuit 21. The analogue signal from the converting part 23 is converted to a multiple PCM code by the subscriber's circuit 10 and is inputted from a terminal 5 to a selecting circuit 31 of a receiving part 30, and a code corresponding to the input-side channel is selected and supplied to a code converting circuit 32. The circuit 32 converts the code compressed in the subscriber's circuit to a natural binary code DC and outputs it to a comparing part 40, and the code DC and the received sine wave DS are compared with each other to measure the characteristic.
JP14858980A 1980-10-23 1980-10-23 Testing method for subscriber's circuit Pending JPS5772455A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14858980A JPS5772455A (en) 1980-10-23 1980-10-23 Testing method for subscriber's circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14858980A JPS5772455A (en) 1980-10-23 1980-10-23 Testing method for subscriber's circuit

Publications (1)

Publication Number Publication Date
JPS5772455A true JPS5772455A (en) 1982-05-06

Family

ID=15456123

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14858980A Pending JPS5772455A (en) 1980-10-23 1980-10-23 Testing method for subscriber's circuit

Country Status (1)

Country Link
JP (1) JPS5772455A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0145605A2 (en) * 1983-12-12 1985-06-19 Digital Equipment Corporation Analog signal verification circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0145605A2 (en) * 1983-12-12 1985-06-19 Digital Equipment Corporation Analog signal verification circuit

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