JPS5770475A - Automatic ri monitor system - Google Patents
Automatic ri monitor systemInfo
- Publication number
- JPS5770475A JPS5770475A JP14635380A JP14635380A JPS5770475A JP S5770475 A JPS5770475 A JP S5770475A JP 14635380 A JP14635380 A JP 14635380A JP 14635380 A JP14635380 A JP 14635380A JP S5770475 A JPS5770475 A JP S5770475A
- Authority
- JP
- Japan
- Prior art keywords
- sensitivity
- zero point
- register
- zero
- comparators
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/185—Measuring radiation intensity with ionisation chamber arrangements
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
Abstract
PURPOSE:To form a device maintaining always a normal operation state by correcting zero adjustment and sensitivity by using switching automatically at predetermined times, a reference ray source control device and comparators. CONSTITUTION:The electric charge gathered at the current collecting electrode 12 of an ionization chamber 10 according to radiation dose is converted to voltage by an electrometer 14, and the voltage is digitized by an A/D converter 16. The digital signal is recorded and displayed with a display device 20, a printer 22 and an integrator 24 via a zero point adjusting circuit 100 and a sensitivity correctinng circuit 200. Zero point adjustment and sensitivity correction are carried out by driving flip- flops 44, 68 by the signal of a timer 42 and changing over switches. Select switches 30, 40 are turned on to input the zero adjustment output to a register 32, by which zero point is adjusted. A sensitivity correction value is outputted by the value of a register 58 obtained by irradiation with a reference ray source 46 and the reference value of a register 60 by opening a shutter 50. Zero point as well as the upper and lower limit values of sensitivity are applied to comparators 78, 80, and an alarm is emitted when out of these values. Thereby, the normal operation is continued.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14635380A JPS5770475A (en) | 1980-10-21 | 1980-10-21 | Automatic ri monitor system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14635380A JPS5770475A (en) | 1980-10-21 | 1980-10-21 | Automatic ri monitor system |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5770475A true JPS5770475A (en) | 1982-04-30 |
JPS611712B2 JPS611712B2 (en) | 1986-01-20 |
Family
ID=15405787
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14635380A Granted JPS5770475A (en) | 1980-10-21 | 1980-10-21 | Automatic ri monitor system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5770475A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104122575A (en) * | 2014-07-14 | 2014-10-29 | 中国原子能科学研究院 | Automatic measurement system and method of extrapolation ionization chamber |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62200048U (en) * | 1986-06-12 | 1987-12-19 |
-
1980
- 1980-10-21 JP JP14635380A patent/JPS5770475A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104122575A (en) * | 2014-07-14 | 2014-10-29 | 中国原子能科学研究院 | Automatic measurement system and method of extrapolation ionization chamber |
Also Published As
Publication number | Publication date |
---|---|
JPS611712B2 (en) | 1986-01-20 |
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