JPS5764945A - Inspecting device for electronic parts - Google Patents

Inspecting device for electronic parts

Info

Publication number
JPS5764945A
JPS5764945A JP55140452A JP14045280A JPS5764945A JP S5764945 A JPS5764945 A JP S5764945A JP 55140452 A JP55140452 A JP 55140452A JP 14045280 A JP14045280 A JP 14045280A JP S5764945 A JPS5764945 A JP S5764945A
Authority
JP
Japan
Prior art keywords
inspecting
drum
temperature
fed
bath
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55140452A
Other languages
Japanese (ja)
Inventor
Tomoyoshi Maniwa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Hitachi High Tech Corp
Original Assignee
Hitachi Ltd
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Ltd
Priority to JP55140452A priority Critical patent/JPS5764945A/en
Publication of JPS5764945A publication Critical patent/JPS5764945A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To enhance the reliability of an inspection for an electronic part and to prevent the variation in the directivity of the part and the damaging the mark of the part by containing the part on a plurality of rails laid on the peripheral surface of a truncated drum in a constant-temperature bath, heating the path therein and inspecting the characteristics of the part in the bath and sorting the parts. CONSTITUTION:A drum 2 radially arranged with part containing rails 3 is supported at the center by a rotationary shaft 22 in an operating temperature inspecting device, and is arranged together with an inspecting mechanism 20 and a sorting mechanism 34 in a constant-temperature bath 1. The part 5 in a magazine 7 is fed from an opening 5 slidably into a supply chute 4 in the oven 1, and the parts 5 are separated and contained by an isolating mechanism 12 in the amount on each rail. When the drum 1 rotates approximately one revolution, the part 5 is heated to the prescribed temperature, and when it is fed to the position before one pitch from the supply unit, a stopper 29 is opened, and the part is fed to the inspecting mechanism 20. The part 5 is sorted to the mechanism 34 in accordance with the propriety of the inspected result of the characteristics of the part, and is sorted to any of the chutes 35, 36 out of the oven to be conveyed. Since it is inspected at the treating temperature, the inspecting reliability can be enhanced, and since the part is not inverted by the rotation of the drum, it can prebent the damage of the mark and the variation in the directivity of the part.
JP55140452A 1980-10-09 1980-10-09 Inspecting device for electronic parts Pending JPS5764945A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55140452A JPS5764945A (en) 1980-10-09 1980-10-09 Inspecting device for electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55140452A JPS5764945A (en) 1980-10-09 1980-10-09 Inspecting device for electronic parts

Publications (1)

Publication Number Publication Date
JPS5764945A true JPS5764945A (en) 1982-04-20

Family

ID=15268943

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55140452A Pending JPS5764945A (en) 1980-10-09 1980-10-09 Inspecting device for electronic parts

Country Status (1)

Country Link
JP (1) JPS5764945A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60122378A (en) * 1983-12-05 1985-06-29 Toshiba Corp Testing device for temperature cycle of semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60122378A (en) * 1983-12-05 1985-06-29 Toshiba Corp Testing device for temperature cycle of semiconductor device

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