JPS5764155A - Fluorescent x-ray analyzer - Google Patents

Fluorescent x-ray analyzer

Info

Publication number
JPS5764155A
JPS5764155A JP55139406A JP13940680A JPS5764155A JP S5764155 A JPS5764155 A JP S5764155A JP 55139406 A JP55139406 A JP 55139406A JP 13940680 A JP13940680 A JP 13940680A JP S5764155 A JPS5764155 A JP S5764155A
Authority
JP
Japan
Prior art keywords
ray
sample
spectrophotometer
fluorescent
solar
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55139406A
Other languages
Japanese (ja)
Other versions
JPH0250420B2 (en
Inventor
Tadashi Uko
Eiji Yamada
Tadahiro Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Rigaku Corp
Original Assignee
Rigaku Industrial Corp
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Industrial Corp, Kawasaki Steel Corp filed Critical Rigaku Industrial Corp
Priority to JP55139406A priority Critical patent/JPS5764155A/en
Publication of JPS5764155A publication Critical patent/JPS5764155A/en
Publication of JPH0250420B2 publication Critical patent/JPH0250420B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Abstract

PURPOSE:To enable to measure efficiently according to the purpose, by inserting selectively one of the optional plural solar slits with different property into the X- ray pass way between a sample and a spectrophotometer. CONSTITUTION:In a fluorescent X-ray analyzer consisting of a X-ray tube 1 which projects continuously X-ray to a sample 2, a spectrophotometer 3 which analyzes spectrally the fluorenscent X-ray generated from the sample 2, a X-ray detector 4 which detects the X-ray from the spectrophotometer 3, on the like, one of the optional solar slits 5, 6, 7 with different properties such as an opening angle is arranged in the X-ray pass way from the sample 2 to the spectrophotometer 3 so as to be inserted selectively with the driving device 10. Thus, in case of analysis, the measurement is carried out efficiently according to the purpose, by inserting the solar slit having the characteristics to meet the requirements and selected according to the amount of a material to be measured in a sample.
JP55139406A 1980-10-07 1980-10-07 Fluorescent x-ray analyzer Granted JPS5764155A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55139406A JPS5764155A (en) 1980-10-07 1980-10-07 Fluorescent x-ray analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55139406A JPS5764155A (en) 1980-10-07 1980-10-07 Fluorescent x-ray analyzer

Publications (2)

Publication Number Publication Date
JPS5764155A true JPS5764155A (en) 1982-04-19
JPH0250420B2 JPH0250420B2 (en) 1990-11-02

Family

ID=15244507

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55139406A Granted JPS5764155A (en) 1980-10-07 1980-10-07 Fluorescent x-ray analyzer

Country Status (1)

Country Link
JP (1) JPS5764155A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0623817A1 (en) * 1993-04-23 1994-11-09 Shimadzu Corporation Local analysis of a specimen in an x-ray fluorescence spectrometer

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4881891U (en) * 1971-12-29 1973-10-05
JPS537394A (en) * 1976-07-09 1978-01-23 Nippon X Ray Kk Xxray fluorescence analyzer
JPS5595263A (en) * 1979-01-12 1980-07-19 Hitachi Ltd X-ray analyzer
JPS55112554A (en) * 1979-01-05 1980-08-30 Philips Corp Diffraction beam monochrometer assembly

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4881891U (en) * 1971-12-29 1973-10-05
JPS537394A (en) * 1976-07-09 1978-01-23 Nippon X Ray Kk Xxray fluorescence analyzer
JPS55112554A (en) * 1979-01-05 1980-08-30 Philips Corp Diffraction beam monochrometer assembly
JPS5595263A (en) * 1979-01-12 1980-07-19 Hitachi Ltd X-ray analyzer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0623817A1 (en) * 1993-04-23 1994-11-09 Shimadzu Corporation Local analysis of a specimen in an x-ray fluorescence spectrometer

Also Published As

Publication number Publication date
JPH0250420B2 (en) 1990-11-02

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