JPS5756738A - Defect detector for flat material - Google Patents
Defect detector for flat materialInfo
- Publication number
- JPS5756738A JPS5756738A JP13385480A JP13385480A JPS5756738A JP S5756738 A JPS5756738 A JP S5756738A JP 13385480 A JP13385480 A JP 13385480A JP 13385480 A JP13385480 A JP 13385480A JP S5756738 A JPS5756738 A JP S5756738A
- Authority
- JP
- Japan
- Prior art keywords
- wavelength
- spot
- projecting
- rectangular strip
- laser beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To improve the accuracy of defect detection by synthesizing the beam of the 1st wavelength and the beam of the 2nd wavelength in such a way that the rectangular strip-like spot projecting the beam of the 1st wavelength and the 2nd rectangular strip-like spot projecting the beam of the 2nd wavelength intersect orthognally with each other. CONSTITUTION:The defect detector for flat materials is designed to project the laser beam 1'' of the 1st wavelength (a) and the laser beam 1''' of the 2nd wavelength in such a way that the 1st rectangular strip-like spot 1'a projecting the laser beam 1'' of the 1st wavelength (a) and the 2nd rectangular strip-like spot 1'b projecting the laser beam 1''' of the 2nd wavelength (b) intersect orghogonally with each other. The laser beams 1'', 1''' of the 1st wavelength (a) and the 2nd wavelength (b) are detected respectively by separate photodetectors 6'a, 6'b. In this case, the detected results of the two photodetectors 6'a, 6'b are both employed, whereby the defect detection is executed with good accuracy for a flat material in which arraying directions of defects appear randomly.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13385480A JPS5756738A (en) | 1980-09-22 | 1980-09-22 | Defect detector for flat material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13385480A JPS5756738A (en) | 1980-09-22 | 1980-09-22 | Defect detector for flat material |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5756738A true JPS5756738A (en) | 1982-04-05 |
Family
ID=15114580
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13385480A Pending JPS5756738A (en) | 1980-09-22 | 1980-09-22 | Defect detector for flat material |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5756738A (en) |
-
1980
- 1980-09-22 JP JP13385480A patent/JPS5756738A/en active Pending
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