JPS5754844A - Flaw signal processing apparatus - Google Patents

Flaw signal processing apparatus

Info

Publication number
JPS5754844A
JPS5754844A JP13030480A JP13030480A JPS5754844A JP S5754844 A JPS5754844 A JP S5754844A JP 13030480 A JP13030480 A JP 13030480A JP 13030480 A JP13030480 A JP 13030480A JP S5754844 A JPS5754844 A JP S5754844A
Authority
JP
Japan
Prior art keywords
shift register
scanning
inputted
correlation
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13030480A
Other languages
Japanese (ja)
Inventor
Akinobu Ogasawara
Toshiro Matsubara
Shuji Naito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP13030480A priority Critical patent/JPS5754844A/en
Publication of JPS5754844A publication Critical patent/JPS5754844A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Abstract

PURPOSE:To enable the identification of the shape of flaws free from noises by computing two-dimensional correlation value with the standard pattern of the shape after the two-dimensional development of original flaw signals for scanning in a specified frequency. CONSTITUTION:When one scanning is made with a flaw detector 1, a digital signal 4 for one scanning is inputted into a shift register 5-1 and the output of each shift register is inputted into the subsequent shift register. At a moment, the number nXm of memory elements in the register house signals having nXm pixels at a rectangular part corresponding to a scanning line with vertical m bits and horizontal m bits. The signals 4' developed two-dimensionally with a two-dimensional development shift register 6 is inputted into a correlation arithmetic section 12 through a DA converter 10 to calculate two-dimensional correlation with the standard pattern of flaw shape separately set. When the input signal is a noise, the results of the correlation computation provides a small value thereby preventing misdetection.
JP13030480A 1980-09-19 1980-09-19 Flaw signal processing apparatus Pending JPS5754844A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13030480A JPS5754844A (en) 1980-09-19 1980-09-19 Flaw signal processing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13030480A JPS5754844A (en) 1980-09-19 1980-09-19 Flaw signal processing apparatus

Publications (1)

Publication Number Publication Date
JPS5754844A true JPS5754844A (en) 1982-04-01

Family

ID=15031109

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13030480A Pending JPS5754844A (en) 1980-09-19 1980-09-19 Flaw signal processing apparatus

Country Status (1)

Country Link
JP (1) JPS5754844A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51136478A (en) * 1975-05-21 1976-11-25 Toshiba Corp Defect inspection device
JPS5474792A (en) * 1977-11-28 1979-06-15 Nippon Steel Corp Surface defect inspection method of steel plates

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51136478A (en) * 1975-05-21 1976-11-25 Toshiba Corp Defect inspection device
JPS5474792A (en) * 1977-11-28 1979-06-15 Nippon Steel Corp Surface defect inspection method of steel plates

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