JPS57502029A - - Google Patents

Info

Publication number
JPS57502029A
JPS57502029A JP57500225A JP50022582A JPS57502029A JP S57502029 A JPS57502029 A JP S57502029A JP 57500225 A JP57500225 A JP 57500225A JP 50022582 A JP50022582 A JP 50022582A JP S57502029 A JPS57502029 A JP S57502029A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57500225A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS57502029A publication Critical patent/JPS57502029A/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/15Charge-coupled device [CCD] image sensors
    • H10F39/157CCD or CID infrared image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/15Charge-coupled device [CCD] image sensors
    • H10F39/157CCD or CID infrared image sensors
    • H10F39/1575CCD or CID infrared image sensors of the hybrid type

Landscapes

  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP57500225A 1980-12-01 1981-12-01 Pending JPS57502029A (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US21149380A 1980-12-01 1980-12-01

Publications (1)

Publication Number Publication Date
JPS57502029A true JPS57502029A (enExample) 1982-11-11

Family

ID=22787141

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57500225A Pending JPS57502029A (enExample) 1980-12-01 1981-12-01

Country Status (4)

Country Link
EP (1) EP0065571A4 (enExample)
JP (1) JPS57502029A (enExample)
IT (1) IT8149780A0 (enExample)
WO (1) WO1982001962A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4689487A (en) * 1984-09-03 1987-08-25 Kabushiki Kaisha Toshiba Radiographic image detection apparatus
NL8501542A (nl) * 1985-05-30 1986-12-16 Philips Nv Ladingsgekoppelde inrichting.
US4896340A (en) * 1985-11-01 1990-01-23 Hughes Aircraft Company Partial direct injection for signal processing system

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3660697A (en) * 1970-02-16 1972-05-02 Bell Telephone Labor Inc Monolithic semiconductor apparatus adapted for sequential charge transfer
DE2501934C2 (de) * 1974-01-25 1982-11-11 Hughes Aircraft Co., Culver City, Calif. Verfahren zum Betrieb eines ladungsgekoppelten Halbleiter-Bauelementes und ladungsgekoppeltes Halbleiter-Bauelement zur Durchführung dieses Verfahrens
JPS5513426B2 (enExample) * 1974-06-18 1980-04-09
US4110776A (en) * 1976-09-27 1978-08-29 Texas Instruments Incorporated Semiconductor integrated circuit with implanted resistor element in polycrystalline silicon layer
US4275407A (en) * 1977-09-01 1981-06-23 Honeywell Inc. Durable insulating protective layer for hybrid CCD/mosaic IR detector array
US4297721A (en) * 1978-11-03 1981-10-27 Mostek Corporation Extremely low current load device for integrated circuit
US4210465A (en) * 1978-11-20 1980-07-01 Ncr Corporation CISFET Processing including simultaneous implantation of spaced polycrystalline silicon regions and non-memory FET channel
US4232221A (en) * 1979-01-22 1980-11-04 The United States Of America As Represented By The Secretary Of The Air Force Method and apparatus for trimming IR/CCD mosaic sensors
US4291328A (en) * 1979-06-15 1981-09-22 Texas Instruments Incorporated Interlevel insulator for integrated circuit with implanted resistor element in second-level polycrystalline silicon

Also Published As

Publication number Publication date
IT8149780A0 (it) 1981-11-27
EP0065571A1 (en) 1982-12-01
EP0065571A4 (en) 1985-03-06
WO1982001962A1 (en) 1982-06-10

Similar Documents

Publication Publication Date Title
FR2473404B1 (enExample)
FR2473464B1 (enExample)
CH655628B (enExample)
FR2473227B1 (enExample)
DE3050577T1 (enExample)
FR2473415B1 (enExample)
FR2473037B1 (enExample)
FR2472929B1 (enExample)
FR2473700B1 (enExample)
FR2473382B1 (enExample)
FR2473291B1 (enExample)
CH655498B (enExample)
FR2473384B1 (enExample)
DE3115054C2 (enExample)
CH647640GA3 (enExample)
FR2473266B1 (enExample)
FR2473157B3 (enExample)
FR2473265B3 (enExample)
FR2473091B1 (enExample)
FR2473449B1 (enExample)
FR2473561B1 (enExample)
FR2473357B1 (enExample)
CH655658B (enExample)
CH655542B (enExample)
CH636745GA3 (enExample)