JPS57500796A - - Google Patents

Info

Publication number
JPS57500796A
JPS57500796A JP56501886A JP50188681A JPS57500796A JP S57500796 A JPS57500796 A JP S57500796A JP 56501886 A JP56501886 A JP 56501886A JP 50188681 A JP50188681 A JP 50188681A JP S57500796 A JPS57500796 A JP S57500796A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56501886A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS57500796A publication Critical patent/JPS57500796A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/071—Investigating materials by wave or particle radiation secondary emission combination of measurements, at least 1 secondary emission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/102—Different kinds of radiation or particles beta or electrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/402—Imaging mapping distribution of elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/418—Imaging electron microscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/605—Specific applications or type of materials phases
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/606—Specific applications or type of materials texture
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2445—Photon detectors for X-rays, light, e.g. photomultipliers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/24495—Signal processing, e.g. mixing of two or more signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP56501886A 1980-06-11 1981-06-10 Pending JPS57500796A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AUPE399880 1980-06-11

Publications (1)

Publication Number Publication Date
JPS57500796A true JPS57500796A (ja) 1982-05-06

Family

ID=3768559

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56501886A Pending JPS57500796A (ja) 1980-06-11 1981-06-10

Country Status (5)

Country Link
US (1) US4476386A (ja)
EP (1) EP0053620B1 (ja)
JP (1) JPS57500796A (ja)
CA (1) CA1170375A (ja)
WO (1) WO1981003707A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010530533A (ja) * 2007-06-21 2010-09-09 オックスフォード インストルメンツ アナリティカル リミテッド 材料の定量分析の方法
JP2015536457A (ja) * 2012-10-26 2015-12-21 エフ・イ−・アイ・カンパニー 自動化された鉱物分類

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US4591984A (en) * 1981-08-10 1986-05-27 Tokyo Shibaura Denki Kabushiki Kaisha Radiation measuring device
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
US4874946A (en) * 1985-04-30 1989-10-17 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for analyzing the internal chemistry and compositional variations of materials and devices
US4962516A (en) * 1985-06-11 1990-10-09 Shimadzu Corporation Method and apparatus for state analysis
GB2223842B (en) * 1988-09-06 1993-02-03 Shell Int Research Automated mineral identification and rock characterization process
US5254857A (en) * 1991-05-31 1993-10-19 Kachina Technologies, Inc. Fast scanning electron microscope (FSEM)
US5798525A (en) * 1996-06-26 1998-08-25 International Business Machines Corporation X-ray enhanced SEM critical dimension measurement
US7714995B2 (en) * 1997-09-22 2010-05-11 Kla-Tencor Corporation Material independent profiler
US6778931B1 (en) * 1999-09-24 2004-08-17 Tektronix, Inc. Test and measurement instrument having multi-channel telecommunications mask testing capability
US6787773B1 (en) 2000-06-07 2004-09-07 Kla-Tencor Corporation Film thickness measurement using electron-beam induced x-ray microanalysis
JP4178741B2 (ja) * 2000-11-02 2008-11-12 株式会社日立製作所 荷電粒子線装置および試料作製装置
FI20011362A (fi) * 2001-06-26 2002-12-27 Bs Instr Technology Oy Röntgenfluoresenssianalysaattori ja menetelmä röntgenfluoresenssianalysaattorin käyttämiseksi
JP2003107022A (ja) * 2001-09-28 2003-04-09 Hitachi Ltd 欠陥検査装置及び検査方法
US6801596B2 (en) 2001-10-01 2004-10-05 Kla-Tencor Technologies Corporation Methods and apparatus for void characterization
US6664541B2 (en) 2001-10-01 2003-12-16 Kla Tencor Technologies Corporation Methods and apparatus for defect localization
US6810105B2 (en) * 2002-01-25 2004-10-26 Kla-Tencor Technologies Corporation Methods and apparatus for dishing and erosion characterization
JP2004151045A (ja) * 2002-11-01 2004-05-27 Hitachi High-Technologies Corp 電子顕微鏡またはｘ線分析装置及び試料の分析方法
AU2011203037B2 (en) * 2004-08-03 2012-05-10 Fei Company Data analysis
US7490009B2 (en) * 2004-08-03 2009-02-10 Fei Company Method and system for spectroscopic data analysis
US7411198B1 (en) 2006-05-31 2008-08-12 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Integrator circuitry for single channel radiation detector
US7521682B1 (en) 2006-05-31 2009-04-21 The United States Of America As Represented By The National Aeronautics And Space Administration Processing circuitry for single channel radiation detector
CA2713984C (en) * 2008-02-06 2016-06-07 Fei Company A method and system for spectrum data analysis
JP5351966B2 (ja) * 2008-08-20 2013-11-27 ミンテック 白金族ミネラルの同定方法
DE102009008063A1 (de) 2009-02-09 2010-08-19 Carl Zeiss Nts Gmbh Teilchenstrahlsystem
DE102009024928B4 (de) * 2009-04-06 2012-07-12 Bruker Nano Gmbh Detektor, Vorrichtung und Verfahren zur gleichzeitigen, energiedispersiven Aufnahme von Rückstreuelektronen und Röntgenquanten
DE102009036701A1 (de) 2009-08-07 2011-03-03 Carl Zeiss Nts Gmbh Teilchenstrahlsystem und Untersuchungsverfahren hierzu
DE102009055271A1 (de) * 2009-12-23 2011-06-30 Carl Zeiss NTS GmbH, 73447 Verfahren zur Erzeugung einer Darstellung eines Objekts mittels eines Teilchenstrahls sowie Teilchenstrahlgerät zur Durchführung des Verfahrens
CZ2011154A3 (cs) * 2011-03-23 2012-06-06 Tescan A.S. Zpusob analýzy materiálu fokusovaným elektronovým svazkem s využitím charakteristického rentgenového zárení a zpetne odražených elektronu a zarízení k jeho provádení
US8664595B2 (en) 2012-06-28 2014-03-04 Fei Company Cluster analysis of unknowns in SEM-EDS dataset
US9188555B2 (en) 2012-07-30 2015-11-17 Fei Company Automated EDS standards calibration
US9091635B2 (en) 2012-10-26 2015-07-28 Fei Company Mineral identification using mineral definitions having compositional ranges
US9048067B2 (en) 2012-10-26 2015-06-02 Fei Company Mineral identification using sequential decomposition into elements from mineral definitions
US8937282B2 (en) 2012-10-26 2015-01-20 Fei Company Mineral identification using mineral definitions including variability
US9194829B2 (en) 2012-12-28 2015-11-24 Fei Company Process for performing automated mineralogy
US9714908B2 (en) 2013-11-06 2017-07-25 Fei Company Sub-pixel analysis and display of fine grained mineral samples
EP3839577A1 (de) * 2019-12-18 2021-06-23 Siemens Healthcare GmbH Verfahren zur erzeugung eines röntgenbilddatensatzes
CN113899763B (zh) * 2020-06-19 2024-03-01 上海梅山钢铁股份有限公司 一种用扫描电镜检测分析钢中小尺寸非金属夹杂物的方法
AT524288B1 (de) * 2020-09-16 2024-05-15 Gatan Inc Computergestütztes Verfahren zur Bestimmung eines Elementanteiles eines Bestimmungselementes kleiner Ordnungszahl, insbesondere eines Li-Anteiles, und Vorrichtung zur Datenverarbeitung hierzu
JP7496767B2 (ja) * 2020-12-15 2024-06-07 株式会社日立ハイテク 荷電粒子線装置

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US3102952A (en) * 1954-05-27 1963-09-03 Philips Corp X-ray fluorescence analysis of multi-component systems
US2882418A (en) * 1954-08-02 1959-04-14 Philips Corp Analysis of unknown substances
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US3351755A (en) * 1964-09-25 1967-11-07 Applied Res Lab Inc Method of and apparatus for spectroscopic analysis having compensating means for uncontrollable variables
US3562525A (en) * 1967-06-29 1971-02-09 Minnesota Mining & Mfg X-ray fludrescence gauging employing a single x-ray source and a reference sample for comparative measurements
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SU565234A1 (ru) * 1974-11-22 1977-07-15 Sall Anatolij O Способ градуировки инфракрасного газоанализатора
JPS51119289A (en) * 1974-11-29 1976-10-19 Agency Of Ind Science & Technol Method of determining the heterogenous sample of micro-particles
JPS52146688A (en) * 1976-05-31 1977-12-06 Mitsubishi Electric Corp Fluorescent x ray analyzer
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
AU521558B2 (en) * 1978-01-31 1982-04-08 De Beers Industrial Diamond Division (Proprietary) Limited Diamond detection
JPS5593048A (en) * 1979-01-08 1980-07-15 Hitachi Ltd Wavelength search unit of xxray analyzer
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US4288692A (en) * 1979-08-06 1981-09-08 Tracor Northern, Inc. Beam current normalization in an X-ray microanalysis instrument

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010530533A (ja) * 2007-06-21 2010-09-09 オックスフォード インストルメンツ アナリティカル リミテッド 材料の定量分析の方法
JP2015536457A (ja) * 2012-10-26 2015-12-21 エフ・イ−・アイ・カンパニー 自動化された鉱物分類
US9778215B2 (en) 2012-10-26 2017-10-03 Fei Company Automated mineral classification

Also Published As

Publication number Publication date
US4476386A (en) 1984-10-09
CA1170375A (en) 1984-07-03
EP0053620A4 (en) 1982-10-07
WO1981003707A1 (en) 1981-12-24
EP0053620A1 (en) 1982-06-16
EP0053620B1 (en) 1986-10-01

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