JPS5748670A - Inspection device for electronic circuit device - Google Patents

Inspection device for electronic circuit device

Info

Publication number
JPS5748670A
JPS5748670A JP55124808A JP12480880A JPS5748670A JP S5748670 A JPS5748670 A JP S5748670A JP 55124808 A JP55124808 A JP 55124808A JP 12480880 A JP12480880 A JP 12480880A JP S5748670 A JPS5748670 A JP S5748670A
Authority
JP
Japan
Prior art keywords
printed board
signal
inspection
input
reference data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55124808A
Other languages
Japanese (ja)
Inventor
Kenichi Nakajima
Masanori Takashita
Satoshi Harasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kawasaki Heavy Industries Ltd
Kawasaki Motors Ltd
Original Assignee
Kawasaki Heavy Industries Ltd
Kawasaki Jukogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Heavy Industries Ltd, Kawasaki Jukogyo KK filed Critical Kawasaki Heavy Industries Ltd
Priority to JP55124808A priority Critical patent/JPS5748670A/en
Publication of JPS5748670A publication Critical patent/JPS5748670A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To obtain an inspection program in a short time by incorporating a reference printed board into a device, operating the same, and fetching the reference data signal of input and output signals by a data collecting means in an actually operating state. CONSTITUTION:A printed board 13 to be inspected is connected to an inspection means 14, and the means 14 receives the stored reference data signal (d) from a data collecting means 12. The input signal (a) out of the reference signal (d) is inputted to the printed board 13, and the output signal (bb) from this printed board 13 and the reference data signal (d) corresponding to this are compared, whereby the inspection is carried out. The means 12 is so arranged that the data collection can be carried out according to the operations of the device both when the input and output signals (a), (b) of the reference printed board 11 are digital signals and when analog signals, so that the preparation of reference data is easily accomplished in a short time.
JP55124808A 1980-09-08 1980-09-08 Inspection device for electronic circuit device Pending JPS5748670A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55124808A JPS5748670A (en) 1980-09-08 1980-09-08 Inspection device for electronic circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55124808A JPS5748670A (en) 1980-09-08 1980-09-08 Inspection device for electronic circuit device

Publications (1)

Publication Number Publication Date
JPS5748670A true JPS5748670A (en) 1982-03-20

Family

ID=14894626

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55124808A Pending JPS5748670A (en) 1980-09-08 1980-09-08 Inspection device for electronic circuit device

Country Status (1)

Country Link
JP (1) JPS5748670A (en)

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