JPS5748666A - Method and device for measuring coefficient of output reflection - Google Patents

Method and device for measuring coefficient of output reflection

Info

Publication number
JPS5748666A
JPS5748666A JP56106164A JP10616481A JPS5748666A JP S5748666 A JPS5748666 A JP S5748666A JP 56106164 A JP56106164 A JP 56106164A JP 10616481 A JP10616481 A JP 10616481A JP S5748666 A JPS5748666 A JP S5748666A
Authority
JP
Japan
Prior art keywords
signal
amplitude
output
source
alc
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56106164A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0368350B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Dei Uinsurou Fuiritsupu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Japan Inc
Original Assignee
Yokogawa Hewlett Packard Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hewlett Packard Ltd filed Critical Yokogawa Hewlett Packard Ltd
Publication of JPS5748666A publication Critical patent/JPS5748666A/ja
Publication of JPH0368350B2 publication Critical patent/JPH0368350B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP56106164A 1980-07-14 1981-07-07 Method and device for measuring coefficient of output reflection Granted JPS5748666A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/168,973 US4359682A (en) 1980-07-14 1980-07-14 Method and apparatus for testing the output reflection coefficient of an automatic level controlled source

Publications (2)

Publication Number Publication Date
JPS5748666A true JPS5748666A (en) 1982-03-20
JPH0368350B2 JPH0368350B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-10-28

Family

ID=22613755

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56106164A Granted JPS5748666A (en) 1980-07-14 1981-07-07 Method and device for measuring coefficient of output reflection

Country Status (2)

Country Link
US (1) US4359682A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5748666A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4497030A (en) * 1981-04-20 1985-01-29 The United States Of America As Represented By The Secretary Of The Navy N-way summing network characterization system
US4547728A (en) * 1982-08-31 1985-10-15 Bird Electronic Corporation RF Wattmeter
US4621226A (en) * 1984-05-23 1986-11-04 Weinschel Engineering Co., Inc. Apparatus and method for determining an input electrical characteristic of a device under test
US4977366A (en) * 1988-10-07 1990-12-11 Lucas Weinschel Inc. High frequency power sensing device
US6381730B1 (en) * 1999-07-09 2002-04-30 Sequence Design, Inc. Method and system for extraction of parasitic interconnect impedance including inductance
CN106771849B (zh) * 2016-11-15 2019-07-26 中国电子科技集团公司第四十一研究所 一种传输线上两个阻抗不连续点反射响应的测试方法
US20240393429A1 (en) * 2023-05-25 2024-11-28 Infineon Technologies Ag On-chip reflection coefficient measurement system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2876416A (en) * 1956-06-11 1959-03-03 Monogram Prec Ind Inc Microwave impedance plotter
US3355663A (en) * 1964-07-20 1967-11-28 Western Union Telegraph Co Waveguide echo measurement system
US3789301A (en) * 1971-12-30 1974-01-29 Ibm Method and apparatus for measuring the parameters of a transistor or other two-port device at microwave frequencies

Also Published As

Publication number Publication date
US4359682A (en) 1982-11-16
JPH0368350B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-10-28

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