JPS5748666A - Method and device for measuring coefficient of output reflection - Google Patents
Method and device for measuring coefficient of output reflectionInfo
- Publication number
- JPS5748666A JPS5748666A JP56106164A JP10616481A JPS5748666A JP S5748666 A JPS5748666 A JP S5748666A JP 56106164 A JP56106164 A JP 56106164A JP 10616481 A JP10616481 A JP 10616481A JP S5748666 A JPS5748666 A JP S5748666A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- amplitude
- output
- source
- alc
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
- G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/168,973 US4359682A (en) | 1980-07-14 | 1980-07-14 | Method and apparatus for testing the output reflection coefficient of an automatic level controlled source |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5748666A true JPS5748666A (en) | 1982-03-20 |
JPH0368350B2 JPH0368350B2 (ja) | 1991-10-28 |
Family
ID=22613755
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56106164A Granted JPS5748666A (en) | 1980-07-14 | 1981-07-07 | Method and device for measuring coefficient of output reflection |
Country Status (2)
Country | Link |
---|---|
US (1) | US4359682A (ja) |
JP (1) | JPS5748666A (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4497030A (en) * | 1981-04-20 | 1985-01-29 | The United States Of America As Represented By The Secretary Of The Navy | N-way summing network characterization system |
US4547728A (en) * | 1982-08-31 | 1985-10-15 | Bird Electronic Corporation | RF Wattmeter |
US4621226A (en) * | 1984-05-23 | 1986-11-04 | Weinschel Engineering Co., Inc. | Apparatus and method for determining an input electrical characteristic of a device under test |
US4977366A (en) * | 1988-10-07 | 1990-12-11 | Lucas Weinschel Inc. | High frequency power sensing device |
US6381730B1 (en) * | 1999-07-09 | 2002-04-30 | Sequence Design, Inc. | Method and system for extraction of parasitic interconnect impedance including inductance |
CN106771849B (zh) * | 2016-11-15 | 2019-07-26 | 中国电子科技集团公司第四十一研究所 | 一种传输线上两个阻抗不连续点反射响应的测试方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2876416A (en) * | 1956-06-11 | 1959-03-03 | Monogram Prec Ind Inc | Microwave impedance plotter |
US3355663A (en) * | 1964-07-20 | 1967-11-28 | Western Union Telegraph Co | Waveguide echo measurement system |
US3789301A (en) * | 1971-12-30 | 1974-01-29 | Ibm | Method and apparatus for measuring the parameters of a transistor or other two-port device at microwave frequencies |
-
1980
- 1980-07-14 US US06/168,973 patent/US4359682A/en not_active Expired - Lifetime
-
1981
- 1981-07-07 JP JP56106164A patent/JPS5748666A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0368350B2 (ja) | 1991-10-28 |
US4359682A (en) | 1982-11-16 |
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