JPS574664A - Beam diameter measuring device of cathode-ray tube - Google Patents
Beam diameter measuring device of cathode-ray tubeInfo
- Publication number
- JPS574664A JPS574664A JP7954780A JP7954780A JPS574664A JP S574664 A JPS574664 A JP S574664A JP 7954780 A JP7954780 A JP 7954780A JP 7954780 A JP7954780 A JP 7954780A JP S574664 A JPS574664 A JP S574664A
- Authority
- JP
- Japan
- Prior art keywords
- diameter
- measured
- cathode
- beam spot
- ray tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers
Landscapes
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Biomedical Technology (AREA)
- General Health & Medical Sciences (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Measurement Of Radiation (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Details Of Television Scanning (AREA)
Abstract
PURPOSE:To realize an accurate measurement with a high workability for the beam diameter of a cathode-ray tube, by measuring the diameter of the beam spot by varying successively the beam current value with a switch. CONSTITUTION:The switches 6 and 8 are set at an optional position such as (a), and a bias power source 9 is controlled so that a voltage drop of 1V is caused across (a) of a resistance 7 to secure a light emission only for a display element 10M of a detection display circuit 10. In this case, the amplitude of the beam current is 200muA, and thus the diameter of the beam spot of that moment is measured through a microscope 3. Then the switches 6 and 8 are changed to another position, and the source 9 is controlled in the same way to set the amplitude of the dropped voltage at 1V across the resistance 7. Thus the beam current of that time can be set at a selected and prescribed level, and the diameter of the beam spot at that time is measured. Then the relation between the measured beam current and the diameter of the beam spot is plotted to decide whether or not the beam diameter is within an allowable range.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7954780A JPS574664A (en) | 1980-06-11 | 1980-06-11 | Beam diameter measuring device of cathode-ray tube |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7954780A JPS574664A (en) | 1980-06-11 | 1980-06-11 | Beam diameter measuring device of cathode-ray tube |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS574664A true JPS574664A (en) | 1982-01-11 |
JPS6151837B2 JPS6151837B2 (en) | 1986-11-11 |
Family
ID=13693018
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7954780A Granted JPS574664A (en) | 1980-06-11 | 1980-06-11 | Beam diameter measuring device of cathode-ray tube |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS574664A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110398768A (en) * | 2019-07-15 | 2019-11-01 | 华中科技大学 | A kind of beam spot dynamic monitoring method and system based on pixel ionisation chamber |
-
1980
- 1980-06-11 JP JP7954780A patent/JPS574664A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110398768A (en) * | 2019-07-15 | 2019-11-01 | 华中科技大学 | A kind of beam spot dynamic monitoring method and system based on pixel ionisation chamber |
Also Published As
Publication number | Publication date |
---|---|
JPS6151837B2 (en) | 1986-11-11 |
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