JPS55119066A - Measuring device for contact resistance - Google Patents
Measuring device for contact resistanceInfo
- Publication number
- JPS55119066A JPS55119066A JP2739779A JP2739779A JPS55119066A JP S55119066 A JPS55119066 A JP S55119066A JP 2739779 A JP2739779 A JP 2739779A JP 2739779 A JP2739779 A JP 2739779A JP S55119066 A JPS55119066 A JP S55119066A
- Authority
- JP
- Japan
- Prior art keywords
- contacts
- potential difference
- contact
- resistor
- contact resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Abstract
PURPOSE:To enable to accurately determine a deteriorated state of contacts to be measured, by controlling the potential difference between the contacts so as not to exceed a predetermined level even when the contacts are deteriorated to cause an increase in the contact resistance. CONSTITUTION:A reference resistor Rs and a contact resistor Rx for contacts to be measured are series-connected to a variable power source which consists of a variable voltage source Es or a variable current source Is. A control circuit CN is adapted to receive a potential difference Vx occurring between both ends of the contact resistor Rx, and an output value of the variable power source is varied such that the potential difference Vx has a certain value determined by the contact structure. The value of the contact resistor Rx is calculated such as to satisfy an equation Rx= (Vx/Vs)Rs wherein Vs represents a potential difference occurring between both ends of the reference resistor Rs. This permits preventing a film, which is formed due to the oxidation of conacts, from being broken. Accordingly, the state of deterioration of the contacts can be accurately determined.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2739779A JPS55119066A (en) | 1979-03-09 | 1979-03-09 | Measuring device for contact resistance |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2739779A JPS55119066A (en) | 1979-03-09 | 1979-03-09 | Measuring device for contact resistance |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55119066A true JPS55119066A (en) | 1980-09-12 |
Family
ID=12219922
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2739779A Pending JPS55119066A (en) | 1979-03-09 | 1979-03-09 | Measuring device for contact resistance |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55119066A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6423168A (en) * | 1987-07-20 | 1989-01-25 | Fujitsu Ltd | Method for measuring resistance value |
WO2011151856A1 (en) * | 2010-05-31 | 2011-12-08 | 株式会社アドバンテスト | Measurement device and measurement method |
CN102707153A (en) * | 2012-06-28 | 2012-10-03 | 哈尔滨工业大学 | Contact resistance measuring system and method based on voltage-frequency conversion method |
-
1979
- 1979-03-09 JP JP2739779A patent/JPS55119066A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6423168A (en) * | 1987-07-20 | 1989-01-25 | Fujitsu Ltd | Method for measuring resistance value |
WO2011151856A1 (en) * | 2010-05-31 | 2011-12-08 | 株式会社アドバンテスト | Measurement device and measurement method |
JPWO2011151856A1 (en) * | 2010-05-31 | 2013-07-25 | 株式会社アドバンテスト | Measuring apparatus and measuring method |
US9140734B2 (en) | 2010-05-31 | 2015-09-22 | Advantest Corporation | Measuring apparatus and measuring method |
CN102707153A (en) * | 2012-06-28 | 2012-10-03 | 哈尔滨工业大学 | Contact resistance measuring system and method based on voltage-frequency conversion method |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Effective date: 20040428 Free format text: JAPANESE INTERMEDIATE CODE: A621 |
|
A761 | Written withdrawal of application |
Effective date: 20060601 Free format text: JAPANESE INTERMEDIATE CODE: A761 |