JPS5746168A - Method for ispecting characteristics of electronic part - Google Patents

Method for ispecting characteristics of electronic part

Info

Publication number
JPS5746168A
JPS5746168A JP12312080A JP12312080A JPS5746168A JP S5746168 A JPS5746168 A JP S5746168A JP 12312080 A JP12312080 A JP 12312080A JP 12312080 A JP12312080 A JP 12312080A JP S5746168 A JPS5746168 A JP S5746168A
Authority
JP
Japan
Prior art keywords
time
comparator
elapsed
inspection
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12312080A
Other languages
Japanese (ja)
Inventor
Minoru Myojin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
NEC Corp
Original Assignee
NEC Home Electronics Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd, Nippon Electric Co Ltd filed Critical NEC Home Electronics Ltd
Priority to JP12312080A priority Critical patent/JPS5746168A/en
Publication of JPS5746168A publication Critical patent/JPS5746168A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To enhance the accuracy of inspection by sensing variation with time a plurality of times during the period up to a specified measuring time in addition to the data measured after the specified time has elapsed, thereby performing the inspection of the characteristics. CONSTITUTION:Measuring parts 1 are arranged at number of positions along a conveyer 4 and the like. When a sample electrolytic capacitor comes to the first position, a measuring part 1-1 is operated and measures data i1 when time period t1 is elapsed. The value is stored in a memory part 2-1, and inputted to a comparator 3-1. When the capacitor comes to the next position after the time period dt has elapsed from the time ti, a measuring part 1-2 is operated and measures data i2. The value is stored in a memory part 2-2 and inputted to a comparator 3-1 In the comparator 3-1, i1 and i2 are compared, and the determined signal of the variation in time domain is outputted. The time domain variations are sensed in this way hereinafter. The variations with time up to the specified time are sensed a plurality of times in addition to the data measured after the specified time period, and the characteristics are inspected, and the accuracy of the inspection can be enhanced.
JP12312080A 1980-09-04 1980-09-04 Method for ispecting characteristics of electronic part Pending JPS5746168A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12312080A JPS5746168A (en) 1980-09-04 1980-09-04 Method for ispecting characteristics of electronic part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12312080A JPS5746168A (en) 1980-09-04 1980-09-04 Method for ispecting characteristics of electronic part

Publications (1)

Publication Number Publication Date
JPS5746168A true JPS5746168A (en) 1982-03-16

Family

ID=14852673

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12312080A Pending JPS5746168A (en) 1980-09-04 1980-09-04 Method for ispecting characteristics of electronic part

Country Status (1)

Country Link
JP (1) JPS5746168A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62238471A (en) * 1986-04-10 1987-10-19 Mitsubishi Electric Corp Apparatus for detecting deterioration of electrolytic condenser
JPS63289827A (en) * 1987-05-21 1988-11-28 Tokyo Electron Ltd Probe equipment
JP2007047013A (en) * 2005-08-10 2007-02-22 Nippon Steel Corp Deterioration diagnosis method of low voltage cable
JP2008256695A (en) * 2007-04-05 2008-10-23 General Electric Co <Ge> Processing of tantalum capacitor on assembled pwa to yield low failure rate

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62238471A (en) * 1986-04-10 1987-10-19 Mitsubishi Electric Corp Apparatus for detecting deterioration of electrolytic condenser
JPH0451789B2 (en) * 1986-04-10 1992-08-20 Mitsubishi Electric Corp
JPS63289827A (en) * 1987-05-21 1988-11-28 Tokyo Electron Ltd Probe equipment
JPH0626230B2 (en) * 1987-05-21 1994-04-06 東京エレクトロン株式会社 Probe device
JP2007047013A (en) * 2005-08-10 2007-02-22 Nippon Steel Corp Deterioration diagnosis method of low voltage cable
JP2008256695A (en) * 2007-04-05 2008-10-23 General Electric Co <Ge> Processing of tantalum capacitor on assembled pwa to yield low failure rate

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