JPS5745285A - High withstand voltage diode - Google Patents

High withstand voltage diode

Info

Publication number
JPS5745285A
JPS5745285A JP12049380A JP12049380A JPS5745285A JP S5745285 A JPS5745285 A JP S5745285A JP 12049380 A JP12049380 A JP 12049380A JP 12049380 A JP12049380 A JP 12049380A JP S5745285 A JPS5745285 A JP S5745285A
Authority
JP
Japan
Prior art keywords
layer
low resistance
withstand voltage
widening
depletion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12049380A
Other languages
English (en)
Other versions
JPS6328346B2 (ja
Inventor
Tsutomu Nakagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP12049380A priority Critical patent/JPS5745285A/ja
Publication of JPS5745285A publication Critical patent/JPS5745285A/ja
Publication of JPS6328346B2 publication Critical patent/JPS6328346B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861Diodes
    • H01L29/868PIN diodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0657Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
    • H01L29/0661Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body specially adapted for altering the breakdown voltage by removing semiconductor material at, or in the neighbourhood of, a reverse biased junction, e.g. by bevelling, moat etching, depletion etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861Diodes
    • H01L29/8613Mesa PN junction diodes

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Bipolar Transistors (AREA)
JP12049380A 1980-08-29 1980-08-29 High withstand voltage diode Granted JPS5745285A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12049380A JPS5745285A (en) 1980-08-29 1980-08-29 High withstand voltage diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12049380A JPS5745285A (en) 1980-08-29 1980-08-29 High withstand voltage diode

Publications (2)

Publication Number Publication Date
JPS5745285A true JPS5745285A (en) 1982-03-15
JPS6328346B2 JPS6328346B2 (ja) 1988-06-08

Family

ID=14787551

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12049380A Granted JPS5745285A (en) 1980-08-29 1980-08-29 High withstand voltage diode

Country Status (1)

Country Link
JP (1) JPS5745285A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997012403A1 (fr) * 1995-09-27 1997-04-03 Hitachi, Ltd. Diode
CN115881827B (zh) * 2022-11-28 2023-07-07 重庆理工大学 基于整片晶圆的氧化镍/氧化镓异质结二极管及制备方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02116946U (ja) * 1989-03-04 1990-09-19
US9704768B2 (en) 2013-12-17 2017-07-11 Mitsubishi Electric Corporation Power semiconductor module

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997012403A1 (fr) * 1995-09-27 1997-04-03 Hitachi, Ltd. Diode
CN115881827B (zh) * 2022-11-28 2023-07-07 重庆理工大学 基于整片晶圆的氧化镍/氧化镓异质结二极管及制备方法

Also Published As

Publication number Publication date
JPS6328346B2 (ja) 1988-06-08

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