JPS5744838A - Method for discriminating defect on surface of high temperature material - Google Patents

Method for discriminating defect on surface of high temperature material

Info

Publication number
JPS5744838A
JPS5744838A JP12163280A JP12163280A JPS5744838A JP S5744838 A JPS5744838 A JP S5744838A JP 12163280 A JP12163280 A JP 12163280A JP 12163280 A JP12163280 A JP 12163280A JP S5744838 A JPS5744838 A JP S5744838A
Authority
JP
Japan
Prior art keywords
circuit
signal
area
defective
reference pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12163280A
Other languages
Japanese (ja)
Inventor
Nobuo Kimura
Yasuhide Nakai
Yoshiro Nishimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP12163280A priority Critical patent/JPS5744838A/en
Publication of JPS5744838A publication Critical patent/JPS5744838A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/28—Measuring arrangements characterised by the use of optical techniques for measuring areas
    • G01B11/285—Measuring arrangements characterised by the use of optical techniques for measuring areas using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To make it possible to perform accurate and quick discrimination based on the size of the defective part, by performing the peak hold processing in a small area, with small areas corresponding to a required number of images in the longitudinal and lateral directions as a unit, and comparing thef result with a reference pattern. CONSTITUTION:A video signal from an image pickup device 7 for the material to be checked 3 is sent to a video recorder 8, displayed by a display 9, and inputted to a memory circuit 12 and a reference pattern sensing circuit 3 through an automatic sensitivity adjuster 10 and an AD converter 11. The delayed video signal is inputted to a binary circuit 14. The difference between the signal, which is obtained by peak-holding the signal from the circuit 14 in the small area, and the reference pattern signal from the circuit 3 is obtained, and said difference signal is compared with a specified value. When the difference signal is lower than the specified value, it is sent to an area discriminating circuit 15. The defective area computed in the circuit 15. If the result is larger than the present area, it is displayed by a printer 19 through a defective position discriminating circuit 16 and a defective position display circuit 18. In this constitution, the accurate and quick discrimination is performed based on the size of the defective part.
JP12163280A 1980-08-30 1980-08-30 Method for discriminating defect on surface of high temperature material Pending JPS5744838A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12163280A JPS5744838A (en) 1980-08-30 1980-08-30 Method for discriminating defect on surface of high temperature material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12163280A JPS5744838A (en) 1980-08-30 1980-08-30 Method for discriminating defect on surface of high temperature material

Publications (1)

Publication Number Publication Date
JPS5744838A true JPS5744838A (en) 1982-03-13

Family

ID=14816063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12163280A Pending JPS5744838A (en) 1980-08-30 1980-08-30 Method for discriminating defect on surface of high temperature material

Country Status (1)

Country Link
JP (1) JPS5744838A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59196446A (en) * 1983-04-22 1984-11-07 Toshiba Corp Defect recognizing device
JPS6165146A (en) * 1984-09-06 1986-04-03 Toshiba Corp Surface inspection device
US7869966B2 (en) * 2001-09-13 2011-01-11 Hitachi, Ltd. Inspection method and its apparatus, inspection system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59196446A (en) * 1983-04-22 1984-11-07 Toshiba Corp Defect recognizing device
JPS6165146A (en) * 1984-09-06 1986-04-03 Toshiba Corp Surface inspection device
US7869966B2 (en) * 2001-09-13 2011-01-11 Hitachi, Ltd. Inspection method and its apparatus, inspection system

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