JPS5742844A - Fault detector of article checker - Google Patents

Fault detector of article checker

Info

Publication number
JPS5742844A
JPS5742844A JP11896080A JP11896080A JPS5742844A JP S5742844 A JPS5742844 A JP S5742844A JP 11896080 A JP11896080 A JP 11896080A JP 11896080 A JP11896080 A JP 11896080A JP S5742844 A JPS5742844 A JP S5742844A
Authority
JP
Japan
Prior art keywords
counter
fault
checker
reset signal
reset
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11896080A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6230374B2 (enrdf_load_stackoverflow
Inventor
Takeshi Koide
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ishizuka Glass Co Ltd
Original Assignee
Ishizuka Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ishizuka Glass Co Ltd filed Critical Ishizuka Glass Co Ltd
Priority to JP11896080A priority Critical patent/JPS5742844A/ja
Publication of JPS5742844A publication Critical patent/JPS5742844A/ja
Publication of JPS6230374B2 publication Critical patent/JPS6230374B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9054Inspection of sealing surface and container finish
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/93Detection standards; Calibrating baseline adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP11896080A 1980-08-28 1980-08-28 Fault detector of article checker Granted JPS5742844A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11896080A JPS5742844A (en) 1980-08-28 1980-08-28 Fault detector of article checker

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11896080A JPS5742844A (en) 1980-08-28 1980-08-28 Fault detector of article checker

Publications (2)

Publication Number Publication Date
JPS5742844A true JPS5742844A (en) 1982-03-10
JPS6230374B2 JPS6230374B2 (enrdf_load_stackoverflow) 1987-07-02

Family

ID=14749529

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11896080A Granted JPS5742844A (en) 1980-08-28 1980-08-28 Fault detector of article checker

Country Status (1)

Country Link
JP (1) JPS5742844A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019219243A (ja) * 2018-06-19 2019-12-26 サッポロビール株式会社 検査システム監視装置及び検査システム監視方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019219243A (ja) * 2018-06-19 2019-12-26 サッポロビール株式会社 検査システム監視装置及び検査システム監視方法

Also Published As

Publication number Publication date
JPS6230374B2 (enrdf_load_stackoverflow) 1987-07-02

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