JPS5739346A - Identifying device for reflection body by frequency spectra - Google Patents

Identifying device for reflection body by frequency spectra

Info

Publication number
JPS5739346A
JPS5739346A JP55115120A JP11512080A JPS5739346A JP S5739346 A JPS5739346 A JP S5739346A JP 55115120 A JP55115120 A JP 55115120A JP 11512080 A JP11512080 A JP 11512080A JP S5739346 A JPS5739346 A JP S5739346A
Authority
JP
Japan
Prior art keywords
circuit
frequency
deltaf
cracking
output circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55115120A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6332142B2 (enrdf_load_stackoverflow
Inventor
Sakae Sugiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55115120A priority Critical patent/JPS5739346A/ja
Priority to US06/274,428 priority patent/US4428235A/en
Priority to CA000380071A priority patent/CA1169955A/en
Priority to EP81104728A priority patent/EP0042601B1/en
Priority to DE8181104728T priority patent/DE3169659D1/de
Publication of JPS5739346A publication Critical patent/JPS5739346A/ja
Publication of JPS6332142B2 publication Critical patent/JPS6332142B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4445—Classification of defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/267—Welds

Landscapes

  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
JP55115120A 1980-06-20 1980-08-20 Identifying device for reflection body by frequency spectra Granted JPS5739346A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP55115120A JPS5739346A (en) 1980-08-20 1980-08-20 Identifying device for reflection body by frequency spectra
US06/274,428 US4428235A (en) 1980-06-20 1981-06-17 Non-destructive inspection by frequency spectrum resolution
CA000380071A CA1169955A (en) 1980-06-20 1981-06-18 Non-destructive inspection by frequency spectrum resolution
EP81104728A EP0042601B1 (en) 1980-06-20 1981-06-19 Non-destructive inspection by frequency spectrum resolution
DE8181104728T DE3169659D1 (en) 1980-06-20 1981-06-19 Non-destructive inspection by frequency spectrum resolution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55115120A JPS5739346A (en) 1980-08-20 1980-08-20 Identifying device for reflection body by frequency spectra

Publications (2)

Publication Number Publication Date
JPS5739346A true JPS5739346A (en) 1982-03-04
JPS6332142B2 JPS6332142B2 (enrdf_load_stackoverflow) 1988-06-28

Family

ID=14654741

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55115120A Granted JPS5739346A (en) 1980-06-20 1980-08-20 Identifying device for reflection body by frequency spectra

Country Status (1)

Country Link
JP (1) JPS5739346A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5932808A (ja) * 1982-08-18 1984-02-22 Nippon Denshi Kiki Kk 超音波式検出装置における個体識別方法
JPS61181957A (ja) * 1985-02-08 1986-08-14 Hitachi Ltd 金属材料検査装置
JP2002514749A (ja) * 1998-05-13 2002-05-21 アックスチール リミテッド 冶金炉の温度測定方法
JP2019211480A (ja) * 2018-06-05 2019-12-12 エルモス セミコンダクタ アーゲー 反射超音波による障害物検出方法
JP2020201057A (ja) * 2019-06-06 2020-12-17 一般財団法人電力中央研究所 金属溶接部の損傷評価装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05644U (ja) * 1991-06-12 1993-01-08 本州製紙株式会社 切出し突起を有するボトル

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5590947U (enrdf_load_stackoverflow) * 1978-12-20 1980-06-23

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5590947U (enrdf_load_stackoverflow) * 1978-12-20 1980-06-23

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5932808A (ja) * 1982-08-18 1984-02-22 Nippon Denshi Kiki Kk 超音波式検出装置における個体識別方法
JPS61181957A (ja) * 1985-02-08 1986-08-14 Hitachi Ltd 金属材料検査装置
JP2002514749A (ja) * 1998-05-13 2002-05-21 アックスチール リミテッド 冶金炉の温度測定方法
JP2019211480A (ja) * 2018-06-05 2019-12-12 エルモス セミコンダクタ アーゲー 反射超音波による障害物検出方法
US11117518B2 (en) * 2018-06-05 2021-09-14 Elmos Semiconductor Se Method for detecting an obstacle by means of reflected ultrasonic waves
JP2020201057A (ja) * 2019-06-06 2020-12-17 一般財団法人電力中央研究所 金属溶接部の損傷評価装置

Also Published As

Publication number Publication date
JPS6332142B2 (enrdf_load_stackoverflow) 1988-06-28

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