JPS5730227B2 - - Google Patents

Info

Publication number
JPS5730227B2
JPS5730227B2 JP1200776A JP1200776A JPS5730227B2 JP S5730227 B2 JPS5730227 B2 JP S5730227B2 JP 1200776 A JP1200776 A JP 1200776A JP 1200776 A JP1200776 A JP 1200776A JP S5730227 B2 JPS5730227 B2 JP S5730227B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1200776A
Other languages
Japanese (ja)
Other versions
JPS5296358A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1200776A priority Critical patent/JPS5296358A/ja
Publication of JPS5296358A publication Critical patent/JPS5296358A/ja
Publication of JPS5730227B2 publication Critical patent/JPS5730227B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP1200776A 1976-02-06 1976-02-06 Device for inspecting pattern Granted JPS5296358A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1200776A JPS5296358A (en) 1976-02-06 1976-02-06 Device for inspecting pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1200776A JPS5296358A (en) 1976-02-06 1976-02-06 Device for inspecting pattern

Publications (2)

Publication Number Publication Date
JPS5296358A JPS5296358A (en) 1977-08-12
JPS5730227B2 true JPS5730227B2 (mo) 1982-06-28

Family

ID=11793519

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1200776A Granted JPS5296358A (en) 1976-02-06 1976-02-06 Device for inspecting pattern

Country Status (1)

Country Link
JP (1) JPS5296358A (mo)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5310863A (en) * 1976-07-19 1978-01-31 Fujitsu Ltd Method of testing multilayer substrate
DE102005028191B4 (de) * 2005-06-17 2009-04-09 Atg Luther & Maelzer Gmbh Verfahren und Vorrichtung zum Testen von unbestückten, großflächigen Leiterplatten mit einem Fingertester
JP2013185978A (ja) * 2012-03-08 2013-09-19 Mitsubishi Electric Corp 長さ測定装置および長さ測定方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4938968U (mo) * 1972-07-07 1974-04-05

Also Published As

Publication number Publication date
JPS5296358A (en) 1977-08-12

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