JPS5724869A - High voltage pulse applicator - Google Patents

High voltage pulse applicator

Info

Publication number
JPS5724869A
JPS5724869A JP10019380A JP10019380A JPS5724869A JP S5724869 A JPS5724869 A JP S5724869A JP 10019380 A JP10019380 A JP 10019380A JP 10019380 A JP10019380 A JP 10019380A JP S5724869 A JPS5724869 A JP S5724869A
Authority
JP
Japan
Prior art keywords
terminals
sockets
charging
high voltage
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10019380A
Other languages
Japanese (ja)
Inventor
Hideyuki Tsujimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP10019380A priority Critical patent/JPS5724869A/en
Publication of JPS5724869A publication Critical patent/JPS5724869A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To improve the mounting condition about sockets by commonly connecting high voltage terminals of charging relays in N sets of specified charging/discharging circuits while free terminals of discharging relays are separately connected direct to sample socket terminals. CONSTITUTION:N sets of charging/discharging circuits comprising R c, R b and CcD are so arranged that R c is connected in common on the high voltage side while contact terminals on the side of sample IC sockets of R D are connected to terminals of IC sockets respectively. Thus, the charging/discharging circuits are packaged in a radial manner centered on IC sockets. Connection points of R c, R D and CcD are mounted lifted from a package substrate while the terminals of R D and IC sockets are connected lifted from the package substrate. This reduces the distance between the R D and the sample IC socket terminals thereby lessening the capacitance while eliminating crossing between wires. Accordingly, induction can be prevented improving the mounting condition about the sockets.
JP10019380A 1980-07-22 1980-07-22 High voltage pulse applicator Pending JPS5724869A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10019380A JPS5724869A (en) 1980-07-22 1980-07-22 High voltage pulse applicator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10019380A JPS5724869A (en) 1980-07-22 1980-07-22 High voltage pulse applicator

Publications (1)

Publication Number Publication Date
JPS5724869A true JPS5724869A (en) 1982-02-09

Family

ID=14267460

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10019380A Pending JPS5724869A (en) 1980-07-22 1980-07-22 High voltage pulse applicator

Country Status (1)

Country Link
JP (1) JPS5724869A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6011083U (en) * 1983-06-30 1985-01-25 日本電気ホームエレクトロニクス株式会社 Characteristic testing equipment for electronic components
US4812755A (en) * 1986-06-05 1989-03-14 Hanwa Electronic Co., Ltd. Base board for testing integrated circuits

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6011083U (en) * 1983-06-30 1985-01-25 日本電気ホームエレクトロニクス株式会社 Characteristic testing equipment for electronic components
US4812755A (en) * 1986-06-05 1989-03-14 Hanwa Electronic Co., Ltd. Base board for testing integrated circuits

Similar Documents

Publication Publication Date Title
ES8103478A1 (en) Lead frame and housing for integrated circuit.
IE830584L (en) Dense mounting of semiconductor chip packages
GB1197751A (en) Process for Packaging Multilead Semiconductor Devices and Resulting Product.
ES8601629A1 (en) Integrated circuit module and method of making same.
SG60099A1 (en) Semiconductor package and manufacturing method of lead frame
JPS5779652A (en) Resin-sealed semiconductor device
GB2060255B (en) Four terminal pulse suppressor
FR2288394A1 (en) Semiconductor chip circuit connector - has container for semiconductor chip with spaced metallised connecting terminals
EP0213046A3 (en) Electronic card connecting circuit
JPS5724869A (en) High voltage pulse applicator
JPS5279773A (en) Bonding method of ic
EP0276940A3 (en) Semiconductor chip having external terminals connected to corresponding leads by wires
IE811262L (en) Semiconductor integrated circuit devices
JPS57164548A (en) Semiconductor device
JPS57104235A (en) Semiconductor device
JPS57141946A (en) Semiconductor device
JPS5785244A (en) Semiconductor device
JPS577953A (en) Semiconductor device
JPS5623768A (en) Semiconductor device
JPS5774877A (en) Magnetic bubble memory device
JPS56169355A (en) Semiconductor device
JPS6480058A (en) Semiconductor device
JPS5718707B2 (en)
JPS5740945A (en) Integrated circuit device
JPS6458118A (en) Input and output circuit