JPS5722239U - - Google Patents
Info
- Publication number
- JPS5722239U JPS5722239U JP9692080U JP9692080U JPS5722239U JP S5722239 U JPS5722239 U JP S5722239U JP 9692080 U JP9692080 U JP 9692080U JP 9692080 U JP9692080 U JP 9692080U JP S5722239 U JPS5722239 U JP S5722239U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9692080U JPS5722239U (ja) | 1980-07-11 | 1980-07-11 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9692080U JPS5722239U (ja) | 1980-07-11 | 1980-07-11 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5722239U true JPS5722239U (ja) | 1982-02-04 |
Family
ID=29458731
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9692080U Pending JPS5722239U (ja) | 1980-07-11 | 1980-07-11 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5722239U (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62188943A (ja) * | 1986-02-14 | 1987-08-18 | Canon Inc | 表面状態測定装置 |
JPS62188945A (ja) * | 1986-02-14 | 1987-08-18 | Canon Inc | 表面状態測定装置 |
JPH01123346U (ja) * | 1988-02-15 | 1989-08-22 | ||
JP2008014848A (ja) * | 2006-07-07 | 2008-01-24 | Hitachi High-Technologies Corp | 表面検査方法及び表面検査装置 |
-
1980
- 1980-07-11 JP JP9692080U patent/JPS5722239U/ja active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62188943A (ja) * | 1986-02-14 | 1987-08-18 | Canon Inc | 表面状態測定装置 |
JPS62188945A (ja) * | 1986-02-14 | 1987-08-18 | Canon Inc | 表面状態測定装置 |
JPH01123346U (ja) * | 1988-02-15 | 1989-08-22 | ||
JP2008014848A (ja) * | 2006-07-07 | 2008-01-24 | Hitachi High-Technologies Corp | 表面検査方法及び表面検査装置 |