JPS57211531A - Blow hole detector - Google Patents

Blow hole detector

Info

Publication number
JPS57211531A
JPS57211531A JP9671181A JP9671181A JPS57211531A JP S57211531 A JPS57211531 A JP S57211531A JP 9671181 A JP9671181 A JP 9671181A JP 9671181 A JP9671181 A JP 9671181A JP S57211531 A JPS57211531 A JP S57211531A
Authority
JP
Japan
Prior art keywords
blow hole
lens
light
land section
land
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9671181A
Other languages
Japanese (ja)
Inventor
Isamu Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9671181A priority Critical patent/JPS57211531A/en
Publication of JPS57211531A publication Critical patent/JPS57211531A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE:To make it easy to determine the location of a defect due to blow hole by photographing with a photo-lens the land section of an electronic circuit package that is soldered and displaying the photo images on an ITV. CONSTITUTION:A halogen lamp is placed in a lamp room 3, and its light is diffused. A light guide 5 that consists of many optical fibers as a bundle exposes its ends on one side in the lamp room 3 and its other ends in a dome 11 with equal distance among them. In a land sectin 9 its upper side is shined by the light guide 5 in all the directions except in the direction of a lens house 2. Accordingly, because reflected lights go into the lens house 2 from all the directions even if there are in the land section 9 end of an electric part, pin or convex or concave portion, they are, therefore, shown white on an ITV, and their images are not formed. A blow hole 10 is, however, a deep hole and it reflects no light, producing its image as a black point on the white land section 9. Only the defect of the blow hole 10 is, therefore, displayed.
JP9671181A 1981-06-24 1981-06-24 Blow hole detector Pending JPS57211531A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9671181A JPS57211531A (en) 1981-06-24 1981-06-24 Blow hole detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9671181A JPS57211531A (en) 1981-06-24 1981-06-24 Blow hole detector

Publications (1)

Publication Number Publication Date
JPS57211531A true JPS57211531A (en) 1982-12-25

Family

ID=14172328

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9671181A Pending JPS57211531A (en) 1981-06-24 1981-06-24 Blow hole detector

Country Status (1)

Country Link
JP (1) JPS57211531A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59231405A (en) * 1983-06-15 1984-12-26 Toshiba Corp Detector of surface defect
JPS6141906A (en) * 1984-08-03 1986-02-28 Hitachi Denshi Ltd Recognition system for state of solder surface
JPS61293657A (en) * 1985-06-21 1986-12-24 Matsushita Electric Works Ltd Method for inspecting soldering appearance
JPS6232600U (en) * 1985-08-13 1987-02-26
JPS62297750A (en) * 1986-06-17 1987-12-24 Matsushita Electric Ind Co Ltd Inspecting device for soldering
JPH01263540A (en) * 1988-04-15 1989-10-20 Hitachi Ltd Pattern detecting apparatus
KR100482952B1 (en) * 1998-07-29 2005-07-28 삼성전자주식회사 Optical Characteristic Measuring Device for Reflective Liquid Crystal Display Device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5671173A (en) * 1979-11-14 1981-06-13 Hitachi Ltd Pattern detection method of printed circuit substrate

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5671173A (en) * 1979-11-14 1981-06-13 Hitachi Ltd Pattern detection method of printed circuit substrate

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59231405A (en) * 1983-06-15 1984-12-26 Toshiba Corp Detector of surface defect
JPS6141906A (en) * 1984-08-03 1986-02-28 Hitachi Denshi Ltd Recognition system for state of solder surface
JPH0521403B2 (en) * 1984-08-03 1993-03-24 Hitachi Electronics
JPS61293657A (en) * 1985-06-21 1986-12-24 Matsushita Electric Works Ltd Method for inspecting soldering appearance
JPH055281B2 (en) * 1985-06-21 1993-01-22 Matsushita Electric Works Ltd
JPS6232600U (en) * 1985-08-13 1987-02-26
JPS62297750A (en) * 1986-06-17 1987-12-24 Matsushita Electric Ind Co Ltd Inspecting device for soldering
JPH01263540A (en) * 1988-04-15 1989-10-20 Hitachi Ltd Pattern detecting apparatus
KR100482952B1 (en) * 1998-07-29 2005-07-28 삼성전자주식회사 Optical Characteristic Measuring Device for Reflective Liquid Crystal Display Device

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