JPS57163850A - Evaluating device for defect and array of array wire bundle - Google Patents

Evaluating device for defect and array of array wire bundle

Info

Publication number
JPS57163850A
JPS57163850A JP4722381A JP4722381A JPS57163850A JP S57163850 A JPS57163850 A JP S57163850A JP 4722381 A JP4722381 A JP 4722381A JP 4722381 A JP4722381 A JP 4722381A JP S57163850 A JPS57163850 A JP S57163850A
Authority
JP
Japan
Prior art keywords
image
array
end surface
defect
grating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4722381A
Other languages
Japanese (ja)
Other versions
JPH0310895B2 (en
Inventor
Kozo Ono
Yoshikazu Nishiwaki
Koichi Tsuno
Mitsuru Nishikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP4722381A priority Critical patent/JPS57163850A/en
Publication of JPS57163850A publication Critical patent/JPS57163850A/en
Publication of JPH0310895B2 publication Critical patent/JPH0310895B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PURPOSE:To easily evaluate a wire defect and a wire array by sectioning the end surface of an array wire bundle by a mask having a grating which corresponds to the size of one image plane of a television camera, and then calculating image plane data obtained by picking up images of respective sections successively by a television camera. CONSTITUTION:After light from a lighting device 1 is made uniform, it is caused to illuminate an image fiber 4 as an array wire bundle, and an image of its base end surface is expanded through an optical system 5 and formed on the photoelectric surface 6a of a television camera 6. Since a lattice-shaped photomask 3 is placed opposite the tip surface of the image fiber 4, an image of the grating of the photomask is formed on the photoelectric surface 6a. When one unit of the grating image has the same size with the photoelectric surface 6a, an image of the image fiber end surface is picked up by unit gratins to investigate the whole of the end surface while avoiding duplication. Defect in picture element is evaluated by comparing a distance between picture elements, obtained from image data, with a mean distance, and a picture element array is evaluated by calculating the dispersed value of a slanting angle by finding the slanting angle of a straight line between adjacent picture element from the image data.
JP4722381A 1981-04-01 1981-04-01 Evaluating device for defect and array of array wire bundle Granted JPS57163850A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4722381A JPS57163850A (en) 1981-04-01 1981-04-01 Evaluating device for defect and array of array wire bundle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4722381A JPS57163850A (en) 1981-04-01 1981-04-01 Evaluating device for defect and array of array wire bundle

Publications (2)

Publication Number Publication Date
JPS57163850A true JPS57163850A (en) 1982-10-08
JPH0310895B2 JPH0310895B2 (en) 1991-02-14

Family

ID=12769183

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4722381A Granted JPS57163850A (en) 1981-04-01 1981-04-01 Evaluating device for defect and array of array wire bundle

Country Status (1)

Country Link
JP (1) JPS57163850A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007071684A (en) * 2005-09-07 2007-03-22 Hitachi Medical Corp Device for inspecting optical fiber bundle
CN106840008A (en) * 2017-04-07 2017-06-13 上海汇珏网络通信设备有限公司 A kind of optical fiber distance measurement system and measuring method
JP2018138910A (en) * 2017-02-24 2018-09-06 株式会社フジクラ Device and method for measuring characteristics of multi-core fiber

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007071684A (en) * 2005-09-07 2007-03-22 Hitachi Medical Corp Device for inspecting optical fiber bundle
JP2018138910A (en) * 2017-02-24 2018-09-06 株式会社フジクラ Device and method for measuring characteristics of multi-core fiber
CN106840008A (en) * 2017-04-07 2017-06-13 上海汇珏网络通信设备有限公司 A kind of optical fiber distance measurement system and measuring method

Also Published As

Publication number Publication date
JPH0310895B2 (en) 1991-02-14

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