JPS57208694A - Switching system of storage cell array - Google Patents

Switching system of storage cell array

Info

Publication number
JPS57208694A
JPS57208694A JP56092787A JP9278781A JPS57208694A JP S57208694 A JPS57208694 A JP S57208694A JP 56092787 A JP56092787 A JP 56092787A JP 9278781 A JP9278781 A JP 9278781A JP S57208694 A JPS57208694 A JP S57208694A
Authority
JP
Japan
Prior art keywords
circuit
cell array
defect
storage cell
column
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56092787A
Other languages
Japanese (ja)
Inventor
Yasushige Ueoka
Chozaburo Minagawa
Hiroo Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP56092787A priority Critical patent/JPS57208694A/en
Publication of JPS57208694A publication Critical patent/JPS57208694A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE:To improve the production yield, by inspecting and switching automatically the defect of a storage cell array. CONSTITUTION:A switching circuit 7 selects successively the read/write functions of the right side starting at a group containing a defect. The connection between an input/output circuit 8 and a data bus 9 is cut off for the group containing a defect, and such group loses the working function of a storage cell array. Instead a spare cell array of the right end works. Then a row selecting circuit 3 and a column selecting circuit 5 work according to the logic address signals A0-Am and Am+1-Am+n. In case a column line is selected from each group of both row and column lines of a cell array 4, the input signal of writing goes into a read/write circuit from a bus 9 through the circuit 8 and avoiding the group of the column line including defect through the circuit 7 to reach a storage cell which is decided by the selected column and row lines via the circuit 5.
JP56092787A 1981-06-16 1981-06-16 Switching system of storage cell array Pending JPS57208694A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56092787A JPS57208694A (en) 1981-06-16 1981-06-16 Switching system of storage cell array

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56092787A JPS57208694A (en) 1981-06-16 1981-06-16 Switching system of storage cell array

Publications (1)

Publication Number Publication Date
JPS57208694A true JPS57208694A (en) 1982-12-21

Family

ID=14064125

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56092787A Pending JPS57208694A (en) 1981-06-16 1981-06-16 Switching system of storage cell array

Country Status (1)

Country Link
JP (1) JPS57208694A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60178552A (en) * 1984-02-08 1985-09-12 インモス、リミテツド Sequence substitution of memory array and sequence substitutable memory circuit
JPS60220445A (en) * 1984-04-09 1985-11-05 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション Redundant memory array
JPS6161300A (en) * 1984-09-03 1986-03-29 Hitachi Ltd Defect relief circuit
WO1993005512A1 (en) * 1991-08-28 1993-03-18 Oki Electric Industry Co., Ltd. Semiconductor storage device
JP2002237198A (en) * 2001-02-09 2002-08-23 Mitsubishi Electric Corp Semiconductor memory, its test method, and defective cell relieving method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5384634A (en) * 1976-12-30 1978-07-26 Fujitsu Ltd Ic memory unit device
JPS5517857B2 (en) * 1973-04-30 1980-05-14
JPS5625300A (en) * 1979-08-08 1981-03-11 Sharp Corp Switching controller for memory block
JPS5622299B2 (en) * 1975-09-10 1981-05-25
JPS5636755B2 (en) * 1975-11-15 1981-08-26

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5517857B2 (en) * 1973-04-30 1980-05-14
JPS5622299B2 (en) * 1975-09-10 1981-05-25
JPS5636755B2 (en) * 1975-11-15 1981-08-26
JPS5384634A (en) * 1976-12-30 1978-07-26 Fujitsu Ltd Ic memory unit device
JPS5625300A (en) * 1979-08-08 1981-03-11 Sharp Corp Switching controller for memory block

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60178552A (en) * 1984-02-08 1985-09-12 インモス、リミテツド Sequence substitution of memory array and sequence substitutable memory circuit
JPH048879B2 (en) * 1984-02-08 1992-02-18
JPS60220445A (en) * 1984-04-09 1985-11-05 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション Redundant memory array
JPS6161300A (en) * 1984-09-03 1986-03-29 Hitachi Ltd Defect relief circuit
WO1993005512A1 (en) * 1991-08-28 1993-03-18 Oki Electric Industry Co., Ltd. Semiconductor storage device
US5394368A (en) * 1991-08-28 1995-02-28 Oki Electric Industry Co., Ltd. Semiconductor memory device
JP2002237198A (en) * 2001-02-09 2002-08-23 Mitsubishi Electric Corp Semiconductor memory, its test method, and defective cell relieving method

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