JPS57204470A - Testing device for measurement of semiconductor device - Google Patents
Testing device for measurement of semiconductor deviceInfo
- Publication number
- JPS57204470A JPS57204470A JP9040181A JP9040181A JPS57204470A JP S57204470 A JPS57204470 A JP S57204470A JP 9040181 A JP9040181 A JP 9040181A JP 9040181 A JP9040181 A JP 9040181A JP S57204470 A JPS57204470 A JP S57204470A
- Authority
- JP
- Japan
- Prior art keywords
- offset
- measuring
- measuring system
- accuracy check
- amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
PURPOSE:To easily control accuracy with reliability, and to omit a loss of maintenance remarkably, by measuring an offset output of a measuring system circuit before measuring a regular semiconductor device, and adjusting the offset output within a measuring accuracy check. CONSTITUTION:When a relay 13 is turned on at first, an offset control system is operated, and an offset output from a measuring system device 11 is held by a sample holding circuit 16 through an amplifier 14. In this state, at first offset of the amplifier 14 is adjusted, for instance, about + or -10mV. As for a charateristic curve of the measuring system device 11, 4 characteristics of (a)-(d) are considered, and when the curve (a) is taken into consideration, the offset voltage of the device is adjusted by a coefficient of the characteristic (a)-K=PO/VOS1 so that it is held in an accuracy check of desired offset voltage + or -VOS by a coefficient adjusting circuit 17. In this way, offset voltage (v) of the device 11 is always controlled within the accuracy check, therefore, there is no loss of a maintenance time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9040181A JPS57204470A (en) | 1981-06-12 | 1981-06-12 | Testing device for measurement of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9040181A JPS57204470A (en) | 1981-06-12 | 1981-06-12 | Testing device for measurement of semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57204470A true JPS57204470A (en) | 1982-12-15 |
Family
ID=13997556
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9040181A Pending JPS57204470A (en) | 1981-06-12 | 1981-06-12 | Testing device for measurement of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57204470A (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5099580A (en) * | 1973-12-28 | 1975-08-07 |
-
1981
- 1981-06-12 JP JP9040181A patent/JPS57204470A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5099580A (en) * | 1973-12-28 | 1975-08-07 |
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