JPS5099580A - - Google Patents

Info

Publication number
JPS5099580A
JPS5099580A JP49002834A JP283474A JPS5099580A JP S5099580 A JPS5099580 A JP S5099580A JP 49002834 A JP49002834 A JP 49002834A JP 283474 A JP283474 A JP 283474A JP S5099580 A JPS5099580 A JP S5099580A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP49002834A
Other languages
Japanese (ja)
Other versions
JPS5345152B2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP742834A priority Critical patent/JPS5345152B2/ja
Publication of JPS5099580A publication Critical patent/JPS5099580A/ja
Publication of JPS5345152B2 publication Critical patent/JPS5345152B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Measuring Magnetic Variables (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Bipolar Transistors (AREA)
JP742834A 1973-12-28 1973-12-28 Expired JPS5345152B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP742834A JPS5345152B2 (en) 1973-12-28 1973-12-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP742834A JPS5345152B2 (en) 1973-12-28 1973-12-28

Publications (2)

Publication Number Publication Date
JPS5099580A true JPS5099580A (en) 1975-08-07
JPS5345152B2 JPS5345152B2 (en) 1978-12-04

Family

ID=11540435

Family Applications (1)

Application Number Title Priority Date Filing Date
JP742834A Expired JPS5345152B2 (en) 1973-12-28 1973-12-28

Country Status (1)

Country Link
JP (1) JPS5345152B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57204470A (en) * 1981-06-12 1982-12-15 Toshiba Corp Testing device for measurement of semiconductor device

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3203176A1 (en) * 1982-01-30 1983-08-11 Gesepa Anstalt für Patentverwertung, Vaduz Pierceable closing cap and process for producing this
JPS5989856U (en) * 1982-12-08 1984-06-18 西川　久子 Lid for medicine bottle
JPS5989855U (en) * 1982-12-08 1984-06-18 西川　久子 Lid for medicine bottle

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57204470A (en) * 1981-06-12 1982-12-15 Toshiba Corp Testing device for measurement of semiconductor device

Also Published As

Publication number Publication date
JPS5345152B2 (en) 1978-12-04

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