JPS57192843A - Luminous spectral analyzing method for powder sample - Google Patents

Luminous spectral analyzing method for powder sample

Info

Publication number
JPS57192843A
JPS57192843A JP7761581A JP7761581A JPS57192843A JP S57192843 A JPS57192843 A JP S57192843A JP 7761581 A JP7761581 A JP 7761581A JP 7761581 A JP7761581 A JP 7761581A JP S57192843 A JPS57192843 A JP S57192843A
Authority
JP
Japan
Prior art keywords
gas
sample
powder sample
pipe
luminous
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7761581A
Other languages
Japanese (ja)
Inventor
Nobuo Hirabayashi
Kazuo Ohashi
Yasushi Haraguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP7761581A priority Critical patent/JPS57192843A/en
Publication of JPS57192843A publication Critical patent/JPS57192843A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

PURPOSE:To enable to perform a direct analysis without liquefaction of a sample and to prevent the occurrence of choking and corrosion of a device, by a method wherein a specified atomizer feeds a powder sample, which is brought to a condition to surround it with argon gas, to a plasma emitting part of a luminous spectral analyzer. CONSTITUTION:While a powder sample 28 in a receptacle 27 is being agitated at a high speed by a driving device 28a, Ar gas is fed to a gas supply part 27a through a perforation 22 in a cylinder body part 21 of an atomizing device to suck the sample to a pipe 23, and the sample is jetted to an atomizing part 34 from a jet hole 31. Lamina gas (Ar gas) is fed to a mixture gas feed part 18 from a feed hole 21, and powder sample mixture gas from the atomizing part 34 is fed to a luminous part. The luminous part feeds sample gas 41 through a center pipe 11 in a pipe body 12 into a case 10, lamina gas is supplied from an outlet 10a, and plasma gas is supplied from a guide hole 13 in a guide plate 14 attached to the pipe 12 to radiate light from a plasma torch 42. This prevents adhesion of the powder sample 28 at the end of the pipe 11 to obtain the stable plasma torch 42. As a result, the powder sample is hard to choke in each part of the device and the powder sample can be easily removed even if it chokes the device.
JP7761581A 1981-05-22 1981-05-22 Luminous spectral analyzing method for powder sample Pending JPS57192843A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7761581A JPS57192843A (en) 1981-05-22 1981-05-22 Luminous spectral analyzing method for powder sample

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7761581A JPS57192843A (en) 1981-05-22 1981-05-22 Luminous spectral analyzing method for powder sample

Publications (1)

Publication Number Publication Date
JPS57192843A true JPS57192843A (en) 1982-11-27

Family

ID=13638813

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7761581A Pending JPS57192843A (en) 1981-05-22 1981-05-22 Luminous spectral analyzing method for powder sample

Country Status (1)

Country Link
JP (1) JPS57192843A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03226656A (en) * 1990-01-31 1991-10-07 Shimadzu Corp Resistance heating evaporator of icp emission spectroscopic analyser

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS559127A (en) * 1978-07-04 1980-01-23 Matsushita Electric Ind Co Ltd Inouctive coupling plasma spectroscope

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS559127A (en) * 1978-07-04 1980-01-23 Matsushita Electric Ind Co Ltd Inouctive coupling plasma spectroscope

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03226656A (en) * 1990-01-31 1991-10-07 Shimadzu Corp Resistance heating evaporator of icp emission spectroscopic analyser

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