JPS57184910A - Inspecting device for perforating position - Google Patents

Inspecting device for perforating position

Info

Publication number
JPS57184910A
JPS57184910A JP6936581A JP6936581A JPS57184910A JP S57184910 A JPS57184910 A JP S57184910A JP 6936581 A JP6936581 A JP 6936581A JP 6936581 A JP6936581 A JP 6936581A JP S57184910 A JPS57184910 A JP S57184910A
Authority
JP
Japan
Prior art keywords
perforations
light
inspected
automatic
relative position
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6936581A
Other languages
Japanese (ja)
Inventor
Katsuyoshi Tamaki
Katsuyoshi Onuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP6936581A priority Critical patent/JPS57184910A/en
Publication of JPS57184910A publication Critical patent/JPS57184910A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To perform an automatic and high-precise inspection of a relative position relation between perforations, by a method wherein parallel light is projected to each of a plural number of perforations in an object to be inspected to detect radiating light by a two-dimensional coordinate detector located facing and opposite to their respective perforations. CONSTITUTION:After an object 3 to be inspected is placed on a base stand 6, a casing 7 is lowered, light radiated from light sources 13a, 13b is produced into parallel light by lenses 11a, 11b, and enters 4-split semiconductors 16a, 16b after passing through axial holes 5a, 5b. The output signals SA-SD, SA'-SD' are inputted to an operational controller 25 through a preamplifier 22, a multiplexer 23, and an AD converter 24. From a ratio of a difference between two corresponding outputs to the sum of them, center coordinates (x1, y1), (x2, y2), for dividing a distance between output electrodes 21c, 21d and 21a, 21b into two equal parts, are found, a distance r, found from a square root of a square sum of an x- and a y-coordinate, is displayed in a display 26, and if it exceeds a reference value, it is unpassed. This allows to perform an automatic and high- precise inspection of relative position relation between perforations.
JP6936581A 1981-05-11 1981-05-11 Inspecting device for perforating position Pending JPS57184910A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6936581A JPS57184910A (en) 1981-05-11 1981-05-11 Inspecting device for perforating position

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6936581A JPS57184910A (en) 1981-05-11 1981-05-11 Inspecting device for perforating position

Publications (1)

Publication Number Publication Date
JPS57184910A true JPS57184910A (en) 1982-11-13

Family

ID=13400452

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6936581A Pending JPS57184910A (en) 1981-05-11 1981-05-11 Inspecting device for perforating position

Country Status (1)

Country Link
JP (1) JPS57184910A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5642177A (en) * 1994-12-09 1997-06-24 Sunreeve Company Limited Detachable sunglasses with magnets
US6012811A (en) * 1996-12-13 2000-01-11 Contour Optik, Inc. Eyeglass frames with magnets at bridges for attachment
US6109747A (en) * 1997-04-28 2000-08-29 Contour Optik, Inc. Eyeglass frames with magnets in flanges
US6170948B1 (en) 1997-04-28 2001-01-09 Contour Optik Inc. Eyeglass device having auxiliary frame
USRE37545E1 (en) 1995-11-07 2002-02-12 Contour Optik, Inc. Auxiliary lenses for eyeglasses
US6811254B2 (en) 2002-11-08 2004-11-02 Chic Optic Inc. Eyeglass with auxiliary lenses
US7048370B2 (en) * 2000-07-27 2006-05-23 Charmed Technology, Inc. Magnetic mount eyeglasses display system
US7241007B2 (en) * 2004-06-01 2007-07-10 Cody Thomas P Convertible eyewear
US7370961B2 (en) 2003-10-02 2008-05-13 Ira Lerner Interchangeable eyewear assembly

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5642177A (en) * 1994-12-09 1997-06-24 Sunreeve Company Limited Detachable sunglasses with magnets
USRE37545E1 (en) 1995-11-07 2002-02-12 Contour Optik, Inc. Auxiliary lenses for eyeglasses
US6012811A (en) * 1996-12-13 2000-01-11 Contour Optik, Inc. Eyeglass frames with magnets at bridges for attachment
US6092896A (en) * 1996-12-13 2000-07-25 Contour Optik, Inc. Eye-wear with magnets
US6367926B1 (en) 1996-12-13 2002-04-09 Contour Optik, Inc. Eye-wear with magnets
US6109747A (en) * 1997-04-28 2000-08-29 Contour Optik, Inc. Eyeglass frames with magnets in flanges
US6170948B1 (en) 1997-04-28 2001-01-09 Contour Optik Inc. Eyeglass device having auxiliary frame
US7048370B2 (en) * 2000-07-27 2006-05-23 Charmed Technology, Inc. Magnetic mount eyeglasses display system
US6811254B2 (en) 2002-11-08 2004-11-02 Chic Optic Inc. Eyeglass with auxiliary lenses
US7370961B2 (en) 2003-10-02 2008-05-13 Ira Lerner Interchangeable eyewear assembly
US7241007B2 (en) * 2004-06-01 2007-07-10 Cody Thomas P Convertible eyewear

Similar Documents

Publication Publication Date Title
JP3056269B2 (en) Printed circuit board inspection equipment
JPS57184910A (en) Inspecting device for perforating position
DE69714401T2 (en) Optical method and device for detecting defects
CA2376425A1 (en) Method and apparatus for radiographic inspection of aircraft fuselages
ATE43176T1 (en) DEVICE AND METHOD FOR AUTOMATIC ANALYSIS OF THE RESULTS OF A DART GAME.
EP1503403A4 (en) Reticle and optical characteristic measuring method
ATE119692T1 (en) APPARATUS AND METHOD FOR INSPECTING A MASK.
CN107131829A (en) A kind of dimensional tolerance detection means and dimensional tolerance detection method
JPS63261103A (en) Shape inspecting and measuring instrument for log or the like
JPS5737253A (en) Defect detection device for transparent body
JPS61162737A (en) Checking method of performance for foreign matter inspection device
JPS64404A (en) Apparatus for inspecting rail joint clearance
JPS58211245A (en) Two-dimensional coordinate input device
JPS56126752A (en) Inspecting device for defect of mask
JPH06283127A (en) Back face analyzing/observing device
Miettinen et al. Experiences with the use of computer-aided design of image acquisition for surface inspection
SU1163219A1 (en) Device for checking optical distortions in transparent objects
ES8305122A1 (en) Measuring the area of flat workpieces
GB1392466A (en) Atmospheric or water pollution analysis systems
JPS63251110A (en) Inspecting method for printed board
JPS6415638A (en) Method for measuring concentration of particles floating in atmosphere
JPH0915161A (en) Method and equipment for defect inspection
JPS57173705A (en) Method for checking mask for printed substrate
JPS543588A (en) Coating defect detecting apparatus of sheet-form objects
JPH01162107A (en) Mounting inspector for chip part