JPS5718078A - Test system of magnetic bubble memory element - Google Patents

Test system of magnetic bubble memory element

Info

Publication number
JPS5718078A
JPS5718078A JP9276980A JP9276980A JPS5718078A JP S5718078 A JPS5718078 A JP S5718078A JP 9276980 A JP9276980 A JP 9276980A JP 9276980 A JP9276980 A JP 9276980A JP S5718078 A JPS5718078 A JP S5718078A
Authority
JP
Japan
Prior art keywords
magnetic bubble
bubble memory
memory element
test system
interference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9276980A
Other languages
Japanese (ja)
Other versions
JPH02799B2 (en
Inventor
Hideji Ito
Ryuji Yano
Koji Oba
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9276980A priority Critical patent/JPS5718078A/en
Publication of JPS5718078A publication Critical patent/JPS5718078A/en
Publication of JPH02799B2 publication Critical patent/JPH02799B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Abstract

PURPOSE:To increase the reliability of a magnetic bubble memory, by testing the effect of interference between loops at diferent data location. CONSTITUTION:At start/stop operation, the operation is repeated in which a magnetic bubble B is stopped every 1-bit transfer and started after a given time. This operation is executed at the same location of each minor loop 2 in the same timing. By this test method, since the data location is sequentially changed on the minor loop 2 at start/stop, the effect of interference between minor loops 2 can be inspected and the reliability of the magnetic bubble memory can be increased.
JP9276980A 1980-07-09 1980-07-09 Test system of magnetic bubble memory element Granted JPS5718078A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9276980A JPS5718078A (en) 1980-07-09 1980-07-09 Test system of magnetic bubble memory element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9276980A JPS5718078A (en) 1980-07-09 1980-07-09 Test system of magnetic bubble memory element

Publications (2)

Publication Number Publication Date
JPS5718078A true JPS5718078A (en) 1982-01-29
JPH02799B2 JPH02799B2 (en) 1990-01-09

Family

ID=14063623

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9276980A Granted JPS5718078A (en) 1980-07-09 1980-07-09 Test system of magnetic bubble memory element

Country Status (1)

Country Link
JP (1) JPS5718078A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05206679A (en) * 1991-09-30 1993-08-13 Sanyo Electric Co Ltd Hybrid integrated circuit device

Also Published As

Publication number Publication date
JPH02799B2 (en) 1990-01-09

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