JPS57179760A - Test system of electronic device - Google Patents

Test system of electronic device

Info

Publication number
JPS57179760A
JPS57179760A JP56065535A JP6553581A JPS57179760A JP S57179760 A JPS57179760 A JP S57179760A JP 56065535 A JP56065535 A JP 56065535A JP 6553581 A JP6553581 A JP 6553581A JP S57179760 A JPS57179760 A JP S57179760A
Authority
JP
Japan
Prior art keywords
test
voltage
supplied
electronic device
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56065535A
Other languages
Japanese (ja)
Inventor
Naka Kurimura
Koji Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56065535A priority Critical patent/JPS57179760A/en
Publication of JPS57179760A publication Critical patent/JPS57179760A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To avoid the runaway of a program due to voltage fluctuation and to eliminate the complicacy of a test for an electronic device, by controlling automatically a power supply voltage and carrying out an automatic test at the moment of the automatic control of the power supply voltage. CONSTITUTION:A test device 2 sets output terminals O1 and O2 at an output level 0 and then delivers a start pulse to an output terminal O3. This start pulse is supplied to a circuit 41 to be used as the reset and restart signals of a device 1. As a result, the normal voltage is supplied to a power supply bus 51. The device 2 detects the end of the test and varies the output levels of the terminals O1 and O2 to 1 and 0 respectively to apply the start pulse to an output terminal O3. Thus the maximum voltage within a margin is supplied to the bus 51. Under such conditions, the test is carried out. After this, the levels of the terminals O1 and O2 are varied to repeat the same operation. As a result, a test of an electronic device including the working in the fluctuation mode of voltage is carried out automatically.
JP56065535A 1981-04-30 1981-04-30 Test system of electronic device Pending JPS57179760A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56065535A JPS57179760A (en) 1981-04-30 1981-04-30 Test system of electronic device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56065535A JPS57179760A (en) 1981-04-30 1981-04-30 Test system of electronic device

Publications (1)

Publication Number Publication Date
JPS57179760A true JPS57179760A (en) 1982-11-05

Family

ID=13289800

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56065535A Pending JPS57179760A (en) 1981-04-30 1981-04-30 Test system of electronic device

Country Status (1)

Country Link
JP (1) JPS57179760A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4930543A (en) * 1972-07-15 1974-03-19
JPS5513315A (en) * 1978-07-10 1980-01-30 Matsushita Electric Works Ltd Beam connection apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4930543A (en) * 1972-07-15 1974-03-19
JPS5513315A (en) * 1978-07-10 1980-01-30 Matsushita Electric Works Ltd Beam connection apparatus

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