JPS57171211A - Removing circuit for in-phase voltage of hall element - Google Patents

Removing circuit for in-phase voltage of hall element

Info

Publication number
JPS57171211A
JPS57171211A JP56056714A JP5671481A JPS57171211A JP S57171211 A JPS57171211 A JP S57171211A JP 56056714 A JP56056714 A JP 56056714A JP 5671481 A JP5671481 A JP 5671481A JP S57171211 A JPS57171211 A JP S57171211A
Authority
JP
Japan
Prior art keywords
hall element
output terminal
hall
terminal
inversion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56056714A
Other languages
Japanese (ja)
Inventor
Kunihiko Matsui
Sukeyoshi Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56056714A priority Critical patent/JPS57171211A/en
Priority to KR1019810003006A priority patent/KR850000358B1/en
Priority to US06/318,852 priority patent/US4435653A/en
Priority to EP81305346A priority patent/EP0052981B1/en
Priority to DE8181305346T priority patent/DE3172782D1/en
Priority to CA000390760A priority patent/CA1195735A/en
Publication of JPS57171211A publication Critical patent/JPS57171211A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
    • G01R17/06—Automatic balancing arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G01R21/08—Arrangements for measuring electric power or power factor by using galvanomagnetic-effect devices, e.g. Hall-effect devices

Abstract

PURPOSE:To enable to simplify a device which employs a Hall element, by a method wherein, by utilizing the fact that, when one input end of a computing amplifier is earthed, the other input forms a virtual grounding, the in-phase voltage of the Hall element is removed. CONSTITUTION:A control current terminal 11b of a Hall element is connected to an output terminal of an operational amplifier OP11, the non-inversion input terminal of the OP11 is coupled to a reference potential, and an output terminal 11c of the Hall element 11 is joined to an inversion input terminal. A Hall output voltage obtaind from an output terminal 11d of the Hall element 11 is fed to a meter 14 via a non-inversion amplifying circuit 13 consisting of an operational amplifier OP12. This causes obtaining of only a Hall output voltage, wherein an in-phase component is automatically removed, from the output terminal 11d of the Hall element, which results in the automatical removal of the in-phase component without the use of a differential amplifying circuit. This permits the simplification of a circuit constitution.
JP56056714A 1980-11-26 1981-04-15 Removing circuit for in-phase voltage of hall element Pending JPS57171211A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP56056714A JPS57171211A (en) 1981-04-15 1981-04-15 Removing circuit for in-phase voltage of hall element
KR1019810003006A KR850000358B1 (en) 1981-04-15 1981-08-18 In-phase voltage elimination circuit for hall element
US06/318,852 US4435653A (en) 1980-11-26 1981-11-06 In-phase voltage elimination circuit for Hall element
EP81305346A EP0052981B1 (en) 1980-11-26 1981-11-11 Hall element circuit arranged to eliminate in-phase voltage
DE8181305346T DE3172782D1 (en) 1980-11-26 1981-11-11 Hall element circuit arranged to eliminate in-phase voltage
CA000390760A CA1195735A (en) 1980-11-26 1981-11-24 In-phase voltage elimination circuit for hall element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56056714A JPS57171211A (en) 1981-04-15 1981-04-15 Removing circuit for in-phase voltage of hall element

Publications (1)

Publication Number Publication Date
JPS57171211A true JPS57171211A (en) 1982-10-21

Family

ID=13035143

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56056714A Pending JPS57171211A (en) 1980-11-26 1981-04-15 Removing circuit for in-phase voltage of hall element

Country Status (2)

Country Link
JP (1) JPS57171211A (en)
KR (1) KR850000358B1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02306183A (en) * 1989-05-22 1990-12-19 Mitsubishi Electric Corp Hall element device
JP2007298415A (en) * 2006-04-28 2007-11-15 Toshiba Corp Current detection device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02306183A (en) * 1989-05-22 1990-12-19 Mitsubishi Electric Corp Hall element device
JP2007298415A (en) * 2006-04-28 2007-11-15 Toshiba Corp Current detection device

Also Published As

Publication number Publication date
KR850000358B1 (en) 1985-03-22
KR830006697A (en) 1983-10-06

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