JPS57162343A - Characteristics measuring instrument for film carrier semiconductor device - Google Patents
Characteristics measuring instrument for film carrier semiconductor deviceInfo
- Publication number
- JPS57162343A JPS57162343A JP4737581A JP4737581A JPS57162343A JP S57162343 A JPS57162343 A JP S57162343A JP 4737581 A JP4737581 A JP 4737581A JP 4737581 A JP4737581 A JP 4737581A JP S57162343 A JPS57162343 A JP S57162343A
- Authority
- JP
- Japan
- Prior art keywords
- film carrier
- semiconductor device
- measuring instrument
- probe needle
- characteristics measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4737581A JPS57162343A (en) | 1981-03-31 | 1981-03-31 | Characteristics measuring instrument for film carrier semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4737581A JPS57162343A (en) | 1981-03-31 | 1981-03-31 | Characteristics measuring instrument for film carrier semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57162343A true JPS57162343A (en) | 1982-10-06 |
JPS6157699B2 JPS6157699B2 (ja) | 1986-12-08 |
Family
ID=12773346
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4737581A Granted JPS57162343A (en) | 1981-03-31 | 1981-03-31 | Characteristics measuring instrument for film carrier semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57162343A (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5330919A (en) * | 1993-02-08 | 1994-07-19 | Motorola, Inc. | Method for electrically testing a semiconductor die using a test apparatus having an independent conductive plane |
US7217990B2 (en) * | 2003-01-14 | 2007-05-15 | Samsung Electronics Co., Ltd. | Tape package having test pad on reverse surface and method for testing the same |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6266498U (ja) * | 1985-10-15 | 1987-04-24 |
-
1981
- 1981-03-31 JP JP4737581A patent/JPS57162343A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5330919A (en) * | 1993-02-08 | 1994-07-19 | Motorola, Inc. | Method for electrically testing a semiconductor die using a test apparatus having an independent conductive plane |
US7217990B2 (en) * | 2003-01-14 | 2007-05-15 | Samsung Electronics Co., Ltd. | Tape package having test pad on reverse surface and method for testing the same |
Also Published As
Publication number | Publication date |
---|---|
JPS6157699B2 (ja) | 1986-12-08 |
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