JPS57136335A - Method and device for treating article with fine focused electron beam - Google Patents

Method and device for treating article with fine focused electron beam

Info

Publication number
JPS57136335A
JPS57136335A JP57003233A JP323382A JPS57136335A JP S57136335 A JPS57136335 A JP S57136335A JP 57003233 A JP57003233 A JP 57003233A JP 323382 A JP323382 A JP 323382A JP S57136335 A JPS57136335 A JP S57136335A
Authority
JP
Japan
Prior art keywords
electron beam
focused electron
treating article
fine focused
fine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57003233A
Other languages
English (en)
Inventor
Suchiyuaato Denamu Ei
Ee Furuuteigaa Uiriamu
Ii Uiriamuzu Kenesu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Energy Sciences Inc
Original Assignee
Energy Sciences Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Energy Sciences Inc filed Critical Energy Sciences Inc
Publication of JPS57136335A publication Critical patent/JPS57136335A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G21K5/02—Irradiation devices having no beam-forming means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/06—Electron sources; Electron guns
    • H01J37/063—Geometrical arrangement of electrodes for beam-forming
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10S117/905—Electron beam

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Recrystallisation Techniques (AREA)
  • Electron Sources, Ion Sources (AREA)
JP57003233A 1981-01-12 1982-01-12 Method and device for treating article with fine focused electron beam Pending JPS57136335A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/224,313 US4382186A (en) 1981-01-12 1981-01-12 Process and apparatus for converged fine line electron beam treatment of objects

Publications (1)

Publication Number Publication Date
JPS57136335A true JPS57136335A (en) 1982-08-23

Family

ID=22840112

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57003233A Pending JPS57136335A (en) 1981-01-12 1982-01-12 Method and device for treating article with fine focused electron beam

Country Status (6)

Country Link
US (1) US4382186A (ja)
EP (1) EP0056179B1 (ja)
JP (1) JPS57136335A (ja)
CA (1) CA1180678A (ja)
DE (1) DE3174307D1 (ja)
FR (1) FR2497999B1 (ja)

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JPH05183189A (ja) * 1991-11-08 1993-07-23 Nichia Chem Ind Ltd ｐ型窒化ガリウム系化合物半導体の製造方法。
WO2021240920A1 (ja) * 2020-05-29 2021-12-02 浜松ホトニクス株式会社 電子線照射装置及び電子線照射装置の製造方法

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US4592799A (en) * 1983-05-09 1986-06-03 Sony Corporation Method of recrystallizing a polycrystalline, amorphous or small grain material
US4564403A (en) * 1984-01-27 1986-01-14 Sony Corporation Research Center Single-crystal semiconductor devices and method for making them
US4585512A (en) * 1984-01-27 1986-04-29 Sony Corporation Method for making seed crystals for single-crystal semiconductor devices
US4562332A (en) * 1984-03-26 1985-12-31 Rockwell International Corporation Surface crack healing with high-energy beam
US4550257A (en) * 1984-06-29 1985-10-29 International Business Machines Corporation Narrow line width pattern fabrication
US4634921A (en) * 1984-07-03 1987-01-06 Sony Corporation Thermionic cathode heater
US4731537A (en) * 1985-06-13 1988-03-15 Sony Corporation Electron beam gun
CN86105432A (zh) * 1985-09-27 1987-05-27 美国电话电报公司 带电粒子束曝光
US5322589A (en) * 1989-02-09 1994-06-21 Fujitsu Limited Process and apparatus for recrystallization of semiconductor layer
US5171992A (en) * 1990-10-31 1992-12-15 International Business Machines Corporation Nanometer scale probe for an atomic force microscope, and method for making same
US5389195A (en) * 1991-03-07 1995-02-14 Minnesota Mining And Manufacturing Company Surface modification by accelerated plasma or ions
US5474640A (en) * 1993-07-19 1995-12-12 Applied Materials, Inc. Apparatus for marking a substrate using ionized gas
CA2126251A1 (en) 1994-02-18 1995-08-19 Ronald Sinclair Nohr Process of enhanced chemical bonding by electron beam radiation
US5449920A (en) * 1994-04-20 1995-09-12 Northeastern University Large area ion implantation process and apparatus
BE1010913A3 (fr) * 1997-02-11 1999-03-02 Cockerill Rech & Dev Procede de recuit d'un substrat metallique au defile.
USRE41892E1 (en) 1997-09-02 2010-10-26 Fallbrook Technologies Inc. Continuously variable transmission
US6551210B2 (en) * 2000-10-24 2003-04-22 Motion Technologies, Llc. Continuously variable transmission
US7170842B2 (en) * 2001-02-15 2007-01-30 Hewlett-Packard Development Company, L.P. Methods for conducting current between a scanned-probe and storage medium
AU2002303524B2 (en) 2001-04-26 2008-03-06 Fallbrook Intellectual Property Company Llc Continuously variable transmission
US7011600B2 (en) 2003-02-28 2006-03-14 Fallbrook Technologies Inc. Continuously variable transmission
US7166052B2 (en) * 2003-08-11 2007-01-23 Fallbrook Technologies Inc. Continuously variable planetary gear set
CA2511699A1 (en) * 2004-07-09 2006-01-09 Ingersoll Machine Tools, Inc. Method and apparatus for repairing or building up surfaces on a workpiece while the workpiece is mounted on a machine tool
DK1774199T3 (da) * 2004-07-21 2013-09-16 Fallbrook Ip Co Llc Rullende trækkraft-planetdrev
DK1815165T3 (da) * 2004-10-05 2012-06-18 Fallbrook Technologies Inc Trinløst variabel transmission
US20060102597A1 (en) * 2004-11-16 2006-05-18 Exponent, Inc. Electron beam welding method and apparatus using controlled volumetric heating
US7632203B2 (en) 2005-10-28 2009-12-15 Fallbrook Technologies Inc. Electromotive drives
KR101317329B1 (ko) 2005-12-09 2013-10-15 폴브룩 테크놀로지즈 인크 연속 가변 변속기
EP2018314A4 (en) * 2006-05-11 2010-04-14 Fallbrook Technologies Inc STAGELESS ADJUSTABLE DRIVE TRAIN
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WO2008100792A1 (en) 2007-02-12 2008-08-21 Fallbrook Technologies Inc. Continuously variable transmissions and methods therefor
CN103438207B (zh) * 2007-02-16 2016-08-31 福博科技术公司 无限变速式无级变速器、无级变速器及其方法、组件、子组件和部件
WO2008154437A1 (en) 2007-06-11 2008-12-18 Fallbrook Technologies Inc. Continuously variable transmission
CN103697120B (zh) 2007-07-05 2017-04-12 福博科技术公司 无级变速器
WO2009065055A2 (en) 2007-11-16 2009-05-22 Fallbrook Technologies Inc. Controller for variable transmission
CA2708634C (en) 2007-12-21 2017-08-01 Fallbrook Technologies Inc. Automatic transmissions and methods therefor
US8535199B2 (en) 2008-06-06 2013-09-17 Fallbrook Intellectual Property Company Llc Infinitely variable transmissions, continuously variable transmissions, methods, assemblies, subassemblies, and components therefor
US8167759B2 (en) 2008-10-14 2012-05-01 Fallbrook Technologies Inc. Continuously variable transmission
KR101610260B1 (ko) * 2008-12-15 2016-04-08 삼성전자주식회사 전자빔 어닐링 장치 및 이를 이용한 어닐링 방법
US8512195B2 (en) 2010-03-03 2013-08-20 Fallbrook Intellectual Property Company Llc Infinitely variable transmissions, continuously variable transmissions, methods, assemblies, subassemblies, and components therefor
US8888643B2 (en) 2010-11-10 2014-11-18 Fallbrook Intellectual Property Company Llc Continuously variable transmission
US8900402B2 (en) 2011-05-10 2014-12-02 Lam Research Corporation Semiconductor processing system having multiple decoupled plasma sources
US9177756B2 (en) 2011-04-11 2015-11-03 Lam Research Corporation E-beam enhanced decoupled source for semiconductor processing
US8900403B2 (en) 2011-05-10 2014-12-02 Lam Research Corporation Semiconductor processing system having multiple decoupled plasma sources
US9111728B2 (en) 2011-04-11 2015-08-18 Lam Research Corporation E-beam enhanced decoupled source for semiconductor processing
WO2012142038A1 (en) * 2011-04-11 2012-10-18 Lam Research Corporation E-beam enhanced decoupled source for semiconductor processing
US8980046B2 (en) 2011-04-11 2015-03-17 Lam Research Corporation Semiconductor processing system with source for decoupled ion and radical control
US9315886B1 (en) * 2014-06-27 2016-04-19 The United States Of America, As Represented By The Secretary Of The Navy Desensitization of aluminum alloys using pulsed electron beams
US10047861B2 (en) 2016-01-15 2018-08-14 Fallbrook Intellectual Property Company Llc Systems and methods for controlling rollback in continuously variable transmissions
US10023266B2 (en) 2016-05-11 2018-07-17 Fallbrook Intellectual Property Company Llc Systems and methods for automatic configuration and automatic calibration of continuously variable transmissions and bicycles having continuously variable transmissions
US11215268B2 (en) 2018-11-06 2022-01-04 Fallbrook Intellectual Property Company Llc Continuously variable transmissions, synchronous shifting, twin countershafts and methods for control of same
US11174922B2 (en) 2019-02-26 2021-11-16 Fallbrook Intellectual Property Company Llc Reversible variable drives and systems and methods for control in forward and reverse directions

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5539164A (en) * 1978-09-12 1980-03-18 Nec Corp Electron flow device

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US3144552A (en) * 1960-08-24 1964-08-11 Varian Associates Apparatus for the iradiation of materials with a pulsed strip beam of electrons
GB1032071A (en) * 1964-01-03 1966-06-08 Philips Electronic Associated Improvements in or relating to methods and apparatus for manufacturing bodies of semiconductor material
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FR2140840A5 (ja) * 1971-06-09 1973-01-19 Thomson Csf
US3702412A (en) * 1971-06-16 1972-11-07 Energy Sciences Inc Apparatus for and method of producing an energetic electron curtain
US3769600A (en) * 1972-03-24 1973-10-30 Energy Sciences Inc Method of and apparatus for producing energetic charged particle extended dimension beam curtains and pulse producing structures therefor
US3745396A (en) * 1972-05-25 1973-07-10 Energy Sciences Inc Elongated electron-emission cathode assembly and method
FR2294489A1 (fr) * 1974-12-13 1976-07-09 Thomson Csf Dispositif pour le trace programme de dessins par bombardement de particules
US4061944A (en) * 1975-06-25 1977-12-06 Avco Everett Research Laboratory, Inc. Electron beam window structure for broad area electron beam generators
JPS5412675A (en) * 1977-06-30 1979-01-30 Jeol Ltd Electon beam exposure method
JPS608574B2 (ja) * 1978-08-12 1985-03-04 大阪大学長 イオン源用半導体エミツタ−
US4305000A (en) * 1978-11-03 1981-12-08 Tetra Pak Developpement Ltd. Process of and apparatus for cold-cathode electron-beam generation for sterilization of surfaces and similar applications
US4258266A (en) * 1979-07-30 1981-03-24 Hughes Aircraft Company Ion implantation system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5539164A (en) * 1978-09-12 1980-03-18 Nec Corp Electron flow device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05183189A (ja) * 1991-11-08 1993-07-23 Nichia Chem Ind Ltd ｐ型窒化ガリウム系化合物半導体の製造方法。
WO2021240920A1 (ja) * 2020-05-29 2021-12-02 浜松ホトニクス株式会社 電子線照射装置及び電子線照射装置の製造方法

Also Published As

Publication number Publication date
EP0056179A1 (en) 1982-07-21
FR2497999A1 (fr) 1982-07-16
FR2497999B1 (fr) 1989-12-08
DE3174307D1 (en) 1986-05-15
US4382186A (en) 1983-05-03
EP0056179B1 (en) 1986-04-09
CA1180678A (en) 1985-01-08

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