JPS57132045A - Pin hole tester - Google Patents

Pin hole tester

Info

Publication number
JPS57132045A
JPS57132045A JP1779281A JP1779281A JPS57132045A JP S57132045 A JPS57132045 A JP S57132045A JP 1779281 A JP1779281 A JP 1779281A JP 1779281 A JP1779281 A JP 1779281A JP S57132045 A JPS57132045 A JP S57132045A
Authority
JP
Japan
Prior art keywords
voltage
contg
pinholes
color
viologen dye
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1779281A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0152690B2 (enrdf_load_stackoverflow
Inventor
Toshiko Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Epson Corp
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK, Epson Corp filed Critical Seiko Epson Corp
Priority to JP1779281A priority Critical patent/JPS57132045A/ja
Publication of JPS57132045A publication Critical patent/JPS57132045A/ja
Publication of JPH0152690B2 publication Critical patent/JPH0152690B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP1779281A 1981-02-09 1981-02-09 Pin hole tester Granted JPS57132045A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1779281A JPS57132045A (en) 1981-02-09 1981-02-09 Pin hole tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1779281A JPS57132045A (en) 1981-02-09 1981-02-09 Pin hole tester

Publications (2)

Publication Number Publication Date
JPS57132045A true JPS57132045A (en) 1982-08-16
JPH0152690B2 JPH0152690B2 (enrdf_load_stackoverflow) 1989-11-09

Family

ID=11953556

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1779281A Granted JPS57132045A (en) 1981-02-09 1981-02-09 Pin hole tester

Country Status (1)

Country Link
JP (1) JPS57132045A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004063742A1 (en) * 2003-01-10 2004-07-29 University Of Southampton Method for the testing of multiple materials for electrochemical uses
US8020435B2 (en) 2005-05-20 2011-09-20 Danfoss A/S Method of investigating a coated surface of an object
WO2017033708A1 (ja) * 2015-08-27 2017-03-02 オリンパス株式会社 検査装置及び検査システム

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AUPQ667800A0 (en) * 2000-04-04 2000-05-04 Chubpak Australia Pty Ltd Detection method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5467776A (en) * 1977-11-09 1979-05-31 Mitsubishi Electric Corp Film quality evaluating method of insulation film
JPS5467775A (en) * 1977-11-09 1979-05-31 Mitsubishi Electric Corp Film quality evaluation method of insulation film

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5467776A (en) * 1977-11-09 1979-05-31 Mitsubishi Electric Corp Film quality evaluating method of insulation film
JPS5467775A (en) * 1977-11-09 1979-05-31 Mitsubishi Electric Corp Film quality evaluation method of insulation film

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004063742A1 (en) * 2003-01-10 2004-07-29 University Of Southampton Method for the testing of multiple materials for electrochemical uses
US8020435B2 (en) 2005-05-20 2011-09-20 Danfoss A/S Method of investigating a coated surface of an object
WO2017033708A1 (ja) * 2015-08-27 2017-03-02 オリンパス株式会社 検査装置及び検査システム
JPWO2017033708A1 (ja) * 2015-08-27 2017-08-24 オリンパス株式会社 検査装置及び検査システム

Also Published As

Publication number Publication date
JPH0152690B2 (enrdf_load_stackoverflow) 1989-11-09

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