JPS57130155A - Logical operation circuit device capable of autonomous check - Google Patents

Logical operation circuit device capable of autonomous check

Info

Publication number
JPS57130155A
JPS57130155A JP56012874A JP1287481A JPS57130155A JP S57130155 A JPS57130155 A JP S57130155A JP 56012874 A JP56012874 A JP 56012874A JP 1287481 A JP1287481 A JP 1287481A JP S57130155 A JPS57130155 A JP S57130155A
Authority
JP
Japan
Prior art keywords
circuit
product term
parity
output
output value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56012874A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6126697B2 (enrdf_load_stackoverflow
Inventor
Shuzo Yajima
Takashi Aramaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyoto University NUC
Original Assignee
Kyoto University NUC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyoto University NUC filed Critical Kyoto University NUC
Priority to JP56012874A priority Critical patent/JPS57130155A/ja
Publication of JPS57130155A publication Critical patent/JPS57130155A/ja
Publication of JPS6126697B2 publication Critical patent/JPS6126697B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Logic Circuits (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP56012874A 1981-02-02 1981-02-02 Logical operation circuit device capable of autonomous check Granted JPS57130155A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56012874A JPS57130155A (en) 1981-02-02 1981-02-02 Logical operation circuit device capable of autonomous check

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56012874A JPS57130155A (en) 1981-02-02 1981-02-02 Logical operation circuit device capable of autonomous check

Publications (2)

Publication Number Publication Date
JPS57130155A true JPS57130155A (en) 1982-08-12
JPS6126697B2 JPS6126697B2 (enrdf_load_stackoverflow) 1986-06-21

Family

ID=11817563

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56012874A Granted JPS57130155A (en) 1981-02-02 1981-02-02 Logical operation circuit device capable of autonomous check

Country Status (1)

Country Link
JP (1) JPS57130155A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01191227A (ja) * 1988-01-26 1989-08-01 Toyota Central Res & Dev Lab Inc 故障診断機能付ｃｍｏｓ型ｐｌａ回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01191227A (ja) * 1988-01-26 1989-08-01 Toyota Central Res & Dev Lab Inc 故障診断機能付ｃｍｏｓ型ｐｌａ回路

Also Published As

Publication number Publication date
JPS6126697B2 (enrdf_load_stackoverflow) 1986-06-21

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