JPS5712310A - Method and device for shifting probe of coordinate measuring instrument - Google Patents

Method and device for shifting probe of coordinate measuring instrument

Info

Publication number
JPS5712310A
JPS5712310A JP8615780A JP8615780A JPS5712310A JP S5712310 A JPS5712310 A JP S5712310A JP 8615780 A JP8615780 A JP 8615780A JP 8615780 A JP8615780 A JP 8615780A JP S5712310 A JPS5712310 A JP S5712310A
Authority
JP
Japan
Prior art keywords
probe
contact
signal
speed signal
moment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8615780A
Other languages
Japanese (ja)
Other versions
JPS6133444B2 (en
Inventor
Yutaka Tomita
Akirou Shibagaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsutoyo Manufacturing Co Ltd
Original Assignee
Mitsutoyo Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsutoyo Manufacturing Co Ltd filed Critical Mitsutoyo Manufacturing Co Ltd
Priority to JP8615780A priority Critical patent/JPS5712310A/en
Priority to US06/269,888 priority patent/US4406068A/en
Priority to DE3123801A priority patent/DE3123801C2/en
Priority to GB8119352A priority patent/GB2078399B/en
Publication of JPS5712310A publication Critical patent/JPS5712310A/en
Publication of JPS6133444B2 publication Critical patent/JPS6133444B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/37—Measurements
    • G05B2219/37193—Multicoordinate measuring system, machine, cmm
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/37—Measurements
    • G05B2219/37207—Verify, probe, workpiece
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/50—Machine tool, machine tool null till machine tool work handling
    • G05B2219/50103—Restart, reverse, return along machined path, stop
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/50—Machine tool, machine tool null till machine tool work handling
    • G05B2219/50111—Retract tool along path, reengage along same path

Landscapes

  • Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Control Of Position Or Direction (AREA)

Abstract

PURPOSE:To ensure a safe backward shift of a probe from an object to be measured and thus avoid a collision between them, by defining the speed signal substantially same as the speed signal when the probe touches the object to be measured as a backward shift speed signal and then delivering a prescribed amount of backward shift. CONSTITUTION:The shift control signal of at least 2 dimensional or more containing the speed signal 102 and the direction signal 104 is applied to a probe shifting device, and a shift control is given to a probe 14 until the probe touches an object 12 to be measured. Thus a coordinate measuring instrument measures the coordinates at the moment of contact. When the probe 14 has a contact with the object 12, the shift control signal which is a speed signal substantially equal to the signal 102 at the moment of contact and contains the signal 104 in the opposite direction to that of the moment of contact is applied to the probe shifting device. Then the probe 14 shifts backward from the object 12 along the route nearly equal to the contact route immediately after a contact between the probe 14 and the object 12.
JP8615780A 1980-06-25 1980-06-25 Method and device for shifting probe of coordinate measuring instrument Granted JPS5712310A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP8615780A JPS5712310A (en) 1980-06-25 1980-06-25 Method and device for shifting probe of coordinate measuring instrument
US06/269,888 US4406068A (en) 1980-06-25 1981-06-03 Probe tracing method and means for coordinate measuring machine
DE3123801A DE3123801C2 (en) 1980-06-25 1981-06-16 Device for coordinate measurement of workpieces
GB8119352A GB2078399B (en) 1980-06-25 1981-06-23 Coordinate measuring machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8615780A JPS5712310A (en) 1980-06-25 1980-06-25 Method and device for shifting probe of coordinate measuring instrument

Publications (2)

Publication Number Publication Date
JPS5712310A true JPS5712310A (en) 1982-01-22
JPS6133444B2 JPS6133444B2 (en) 1986-08-02

Family

ID=13878897

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8615780A Granted JPS5712310A (en) 1980-06-25 1980-06-25 Method and device for shifting probe of coordinate measuring instrument

Country Status (1)

Country Link
JP (1) JPS5712310A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63249358A (en) * 1987-04-06 1988-10-17 Hitachi Ltd Resin encapsulated semiconductor device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5311291A (en) * 1976-07-16 1978-02-01 Shin Meiwa Ind Co Ltd Method and device of positional control
JPS5355059A (en) * 1976-10-27 1978-05-19 Mitsutoyo Seisakusho Multiidirectional measuring method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5311291A (en) * 1976-07-16 1978-02-01 Shin Meiwa Ind Co Ltd Method and device of positional control
JPS5355059A (en) * 1976-10-27 1978-05-19 Mitsutoyo Seisakusho Multiidirectional measuring method

Also Published As

Publication number Publication date
JPS6133444B2 (en) 1986-08-02

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